The impact of low-holding-voltage issue in high-voltage CMOS technology and the design of latchup-free power-rail ESD clamp circuit for LCD driver ICs
The holding voltage of the high-voltage devices in snapback breakdown condition has been found to be much smaller than the power supply voltage. Such characteristics will cause the LCD driver ICs to be susceptible to the latchup-like danger in the practical system applications, especially while thes...
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Veröffentlicht in: | IEEE journal of solid-state circuits 2005-08, Vol.40 (8), p.1751-1759 |
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Format: | Artikel |
Sprache: | eng |
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