Quantitative evaluation of mercuric iodide and selenium for X-ray imaging device

Analog film/screen systems have been replaced with digital X-ray imaging devices using direct conversion materials. In this paper, mercuric iodide (HgI/sub 2/) and amorphous selenium (a-Se) films were deposited through the particle-in-binder (PIB) and physical vapor deposition (PVD) methods, respect...

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Hauptverfasser: Byung-Youl Cha, Ji-Koon Park, Sang-Sik Kang, Jung-Wook Shin, Jin-Young Kim, Hyung-Won Lee, Sang-Hee Nam
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Ji-Koon Park
Sang-Sik Kang
Jung-Wook Shin
Jin-Young Kim
Hyung-Won Lee
Sang-Hee Nam
description Analog film/screen systems have been replaced with digital X-ray imaging devices using direct conversion materials. In this paper, mercuric iodide (HgI/sub 2/) and amorphous selenium (a-Se) films were deposited through the particle-in-binder (PIB) and physical vapor deposition (PVD) methods, respectively. Using the MCNP 4C code, the interaction of X-ray photons in HgI/sub 2/ and a-Se bulk, their transport, and transmitted energy spectrum of continuous X-ray, with total absorbed energy were simulated. Using I-V measurements, their electrical properties, such as leakage current, X-ray sensitivity, and signal-to-noise ratio (SNR), were investigated. The results of our study can be useful in the future design and optimization of direct active-matrix flat-panel detectors (AMFPD) for various digital X-ray imaging modalities.
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subjects Active matrix technology
Amorphous materials
Atherosclerosis
Chemical vapor deposition
Current measurement
Design optimization
Electric variables measurement
Leakage current
Signal to noise ratio
X-ray imaging
title Quantitative evaluation of mercuric iodide and selenium for X-ray imaging device
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