Fault and error models for VLSI

This paper describes a variety of fault and error models which are used as the basis for designing fault-tolerant Very Large Scale Integrated (VLSI) systems. The fault models describe physical defects and failures and the input patterns which will expose them, and are suitable for testing, while err...

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Veröffentlicht in:	Proc. IEEE; (United States) 1986-05, Vol.74 (5), p.639-654
Hauptverfasser:	Abraham, J.A., Fuchs, W.K.
Format:	Artikel
Sprache:	eng
Schlagworte:	420800 - Engineering- Electronic Circuits & Devices- (-1989) 990200 - Mathematics & Computers Applied sciences Circuit faults CIRCUIT THEORY COMPUTER-AIDED DESIGN COMPUTERS Costs DIGITAL COMPUTERS Electromigration ELECTRONIC CIRCUITS Electronics ENGINEERING Error correction ERRORS Exact sciences and technology FAILURES Fault detection FAULT TOLERANT COMPUTERS Fault tolerant systems GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE INTEGRATED CIRCUITS Manufacturing MICROELECTRONIC CIRCUITS ON-LINE SYSTEMS OPERATION Semiconductor device manufacture Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices System testing TESTING Very large scale integration
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