Scanning the issue
Provides an overview of the technical articles and features presented in this issue.
Gespeichert in:
| Veröffentlicht in: | Proceedings of the IEEE 1973-07, Vol.61 (7), p.804-806 |
|---|---|
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 806 |
|---|---|
| container_issue | 7 |
| container_start_page | 804 |
| container_title | Proceedings of the IEEE |
| container_volume | 61 |
| creator | Meitzler, A.H. Kurtz, S.K. |
| description | Provides an overview of the technical articles and features presented in this issue. |
| doi_str_mv | 10.1109/PROC.1973.9168 |
| format | Article |
| fullrecord | <record><control><sourceid>ieee_RIE</sourceid><recordid>TN_cdi_ieee_primary_1451098</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1451098</ieee_id><sourcerecordid>1451098</sourcerecordid><originalsourceid>FETCH-ieee_primary_14510983</originalsourceid><addsrcrecordid>eNpjYBAzNNAzNDSw1A8I8nfWM7Q0N9azNDSzYGLgNDQ1tdA1MjI1Y2HgNDAwtNC1NDK05GDgKi7OMjAwMDY1M-ZkEApOTszLy8xLVyjJSFXILC4uTeVhYE1LzClO5YXS3AzSbq4hzh66mampqfEFRZm5iUWV8YYmpkBLLYzxywIAGyYn7A</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Scanning the issue</title><source>IEEE Electronic Library (IEL)</source><creator>Meitzler, A.H. ; Kurtz, S.K.</creator><creatorcontrib>Meitzler, A.H. ; Kurtz, S.K.</creatorcontrib><description>Provides an overview of the technical articles and features presented in this issue.</description><identifier>ISSN: 0018-9219</identifier><identifier>EISSN: 1558-2256</identifier><identifier>DOI: 10.1109/PROC.1973.9168</identifier><identifier>CODEN: IEEPAD</identifier><language>eng</language><publisher>IEEE</publisher><ispartof>Proceedings of the IEEE, 1973-07, Vol.61 (7), p.804-806</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1451098$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1451098$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Meitzler, A.H.</creatorcontrib><creatorcontrib>Kurtz, S.K.</creatorcontrib><title>Scanning the issue</title><title>Proceedings of the IEEE</title><addtitle>JPROC</addtitle><description>Provides an overview of the technical articles and features presented in this issue.</description><issn>0018-9219</issn><issn>1558-2256</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1973</creationdate><recordtype>article</recordtype><sourceid/><recordid>eNpjYBAzNNAzNDSw1A8I8nfWM7Q0N9azNDSzYGLgNDQ1tdA1MjI1Y2HgNDAwtNC1NDK05GDgKi7OMjAwMDY1M-ZkEApOTszLy8xLVyjJSFXILC4uTeVhYE1LzClO5YXS3AzSbq4hzh66mampqfEFRZm5iUWV8YYmpkBLLYzxywIAGyYn7A</recordid><startdate>197307</startdate><enddate>197307</enddate><creator>Meitzler, A.H.</creator><creator>Kurtz, S.K.</creator><general>IEEE</general><scope/></search><sort><creationdate>197307</creationdate><title>Scanning the issue</title><author>Meitzler, A.H. ; Kurtz, S.K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_14510983</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1973</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Meitzler, A.H.</creatorcontrib><creatorcontrib>Kurtz, S.K.</creatorcontrib><jtitle>Proceedings of the IEEE</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Meitzler, A.H.</au><au>Kurtz, S.K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Scanning the issue</atitle><jtitle>Proceedings of the IEEE</jtitle><stitle>JPROC</stitle><date>1973-07</date><risdate>1973</risdate><volume>61</volume><issue>7</issue><spage>804</spage><epage>806</epage><pages>804-806</pages><issn>0018-9219</issn><eissn>1558-2256</eissn><coden>IEEPAD</coden><abstract>Provides an overview of the technical articles and features presented in this issue.</abstract><pub>IEEE</pub><doi>10.1109/PROC.1973.9168</doi></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0018-9219 |
| ispartof | Proceedings of the IEEE, 1973-07, Vol.61 (7), p.804-806 |
| issn | 0018-9219 1558-2256 |
| language | eng |
| recordid | cdi_ieee_primary_1451098 |
| source | IEEE Electronic Library (IEL) |
| title | Scanning the issue |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T11%3A09%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Scanning%20the%20issue&rft.jtitle=Proceedings%20of%20the%20IEEE&rft.au=Meitzler,%20A.H.&rft.date=1973-07&rft.volume=61&rft.issue=7&rft.spage=804&rft.epage=806&rft.pages=804-806&rft.issn=0018-9219&rft.eissn=1558-2256&rft.coden=IEEPAD&rft_id=info:doi/10.1109/PROC.1973.9168&rft_dat=%3Cieee_RIE%3E1451098%3C/ieee_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1451098&rfr_iscdi=true |