A quasi-optics perturbation technique for measuring dielectric constants
A method of measuring dielectric constants of materials in sheet form by insertion in a Fabry-Perot resonator is described. By tilting the dielectric sheet at a slight angle with respect to the system axis, the reflected wave can be eliminated. The working formula for determing the dielectric consta...
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| Veröffentlicht in: | Proceedings of the IEEE 1966-01, Vol.54 (4), p.520-522 |
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| container_title | Proceedings of the IEEE |
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| creator | Degenford, J.E. Coleman, P.D. |
| description | A method of measuring dielectric constants of materials in sheet form by insertion in a Fabry-Perot resonator is described. By tilting the dielectric sheet at a slight angle with respect to the system axis, the reflected wave can be eliminated. The working formula for determing the dielectric constant then reduces to a simple linear relation involving the ratio of the mirror motion required to restore resonance to the thickness of the dielectric. The method is applicable at all frequencies where Fabry-Perot resonators can be used and for materials with loss tangents less than one. A table of measured values of common dielectrics is presented for 143 Gc/s and 343 Gc/s. |
| doi_str_mv | 10.1109/PROC.1966.4767 |
| format | Article |
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By tilting the dielectric sheet at a slight angle with respect to the system axis, the reflected wave can be eliminated. The working formula for determing the dielectric constant then reduces to a simple linear relation involving the ratio of the mirror motion required to restore resonance to the thickness of the dielectric. The method is applicable at all frequencies where Fabry-Perot resonators can be used and for materials with loss tangents less than one. A table of measured values of common dielectrics is presented for 143 Gc/s and 343 Gc/s.</description><identifier>ISSN: 0018-9219</identifier><identifier>EISSN: 1558-2256</identifier><identifier>DOI: 10.1109/PROC.1966.4767</identifier><identifier>CODEN: IEEPAD</identifier><language>eng</language><publisher>IEEE</publisher><subject>Dielectric constant ; Dielectric materials ; Dielectric measurements ; Fabry-Perot ; Mirrors ; Perturbation methods ; Reflection ; Resonant frequency ; Sheet materials ; Surface waves</subject><ispartof>Proceedings of the IEEE, 1966-01, Vol.54 (4), p.520-522</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c259t-e5ec04f0b4dd6d4a894713db99e378683bd9fe63721575ed50d69506b1000efa3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1446697$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1446697$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Degenford, J.E.</creatorcontrib><creatorcontrib>Coleman, P.D.</creatorcontrib><title>A quasi-optics perturbation technique for measuring dielectric constants</title><title>Proceedings of the IEEE</title><addtitle>JPROC</addtitle><description>A method of measuring dielectric constants of materials in sheet form by insertion in a Fabry-Perot resonator is described. By tilting the dielectric sheet at a slight angle with respect to the system axis, the reflected wave can be eliminated. The working formula for determing the dielectric constant then reduces to a simple linear relation involving the ratio of the mirror motion required to restore resonance to the thickness of the dielectric. The method is applicable at all frequencies where Fabry-Perot resonators can be used and for materials with loss tangents less than one. A table of measured values of common dielectrics is presented for 143 Gc/s and 343 Gc/s.</description><subject>Dielectric constant</subject><subject>Dielectric materials</subject><subject>Dielectric measurements</subject><subject>Fabry-Perot</subject><subject>Mirrors</subject><subject>Perturbation methods</subject><subject>Reflection</subject><subject>Resonant frequency</subject><subject>Sheet materials</subject><subject>Surface waves</subject><issn>0018-9219</issn><issn>1558-2256</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1966</creationdate><recordtype>article</recordtype><recordid>eNpFkE9LwzAchoMoWKdXL17yBVqT5l9zHEWdMJiInkua_KKRrd2S9OC3d2XCTu_lfV5eHoTuKakoJfrx7X3TVlRLWXEl1QUqqBBNWddCXqKCENqUuqb6Gt2k9EMIYUKyAq2W-DCZFMpxn4NNeA8xT7E3OYwDzmC_h3CYAPsx4h2YNMUwfGEXYAs2x2CxHYeUzZDTLbryZpvg7j8X6PP56aNdlevNy2u7XJe2FjqXIMAS7knPnZOOm0ZzRZnrtQamGtmw3mkPkqmaCiXACeKkFkT29HgZvGELVJ12bRxTiuC7fQw7E387SrrZQzd76GYP3ezhCDycgAAA5zLnUmrF_gDPu1qZ</recordid><startdate>19660101</startdate><enddate>19660101</enddate><creator>Degenford, J.E.</creator><creator>Coleman, P.D.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19660101</creationdate><title>A quasi-optics perturbation technique for measuring dielectric constants</title><author>Degenford, J.E. ; Coleman, P.D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c259t-e5ec04f0b4dd6d4a894713db99e378683bd9fe63721575ed50d69506b1000efa3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1966</creationdate><topic>Dielectric constant</topic><topic>Dielectric materials</topic><topic>Dielectric measurements</topic><topic>Fabry-Perot</topic><topic>Mirrors</topic><topic>Perturbation methods</topic><topic>Reflection</topic><topic>Resonant frequency</topic><topic>Sheet materials</topic><topic>Surface waves</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Degenford, J.E.</creatorcontrib><creatorcontrib>Coleman, P.D.</creatorcontrib><collection>CrossRef</collection><jtitle>Proceedings of the IEEE</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Degenford, J.E.</au><au>Coleman, P.D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A quasi-optics perturbation technique for measuring dielectric constants</atitle><jtitle>Proceedings of the IEEE</jtitle><stitle>JPROC</stitle><date>1966-01-01</date><risdate>1966</risdate><volume>54</volume><issue>4</issue><spage>520</spage><epage>522</epage><pages>520-522</pages><issn>0018-9219</issn><eissn>1558-2256</eissn><coden>IEEPAD</coden><abstract>A method of measuring dielectric constants of materials in sheet form by insertion in a Fabry-Perot resonator is described. By tilting the dielectric sheet at a slight angle with respect to the system axis, the reflected wave can be eliminated. The working formula for determing the dielectric constant then reduces to a simple linear relation involving the ratio of the mirror motion required to restore resonance to the thickness of the dielectric. The method is applicable at all frequencies where Fabry-Perot resonators can be used and for materials with loss tangents less than one. A table of measured values of common dielectrics is presented for 143 Gc/s and 343 Gc/s.</abstract><pub>IEEE</pub><doi>10.1109/PROC.1966.4767</doi><tpages>3</tpages></addata></record> |
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| ispartof | Proceedings of the IEEE, 1966-01, Vol.54 (4), p.520-522 |
| issn | 0018-9219 1558-2256 |
| language | eng |
| recordid | cdi_ieee_primary_1446697 |
| source | IEEE Electronic Library (IEL) |
| subjects | Dielectric constant Dielectric materials Dielectric measurements Fabry-Perot Mirrors Perturbation methods Reflection Resonant frequency Sheet materials Surface waves |
| title | A quasi-optics perturbation technique for measuring dielectric constants |
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