Dynamic operation of the in-line cryotron in bistable circuits

The dynamic operation of the in-line cryotron is tested by performing pulse measurements on individual devices and also by using the device in free-running closed-loop oscillators (similar to shift register). The gain of the device is currently insufficient to permit bit transfer from one stage of t...

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Bibliographische Detailangaben

Veröffentlicht in:	Proceedings of the IEEE 1964-01, Vol.52 (3), p.228-238
Hauptverfasser:	Brennemann, A.E., Seki, H., Seraphim, D.P.
Format:	Artikel
Sprache:	eng
Schlagworte:	Bistable circuits Circuit testing Frequency Magnetic analysis Magnetic field measurement Magnetic switching Oscillators Performance evaluation Pulse measurements Shift registers
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