Defect screening using independent component analysis on I/sub DDQ

An I/sub DDQ/ Statistical Post-Processing/spl trade/ (SPP) outlier screen is presented based on the computation of statistically independent sources of variation in the I/sub DDQ/ measurements. I/sub DDQ/ measurements from die passing all other tests are modeled using sources of variation extracted...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Turakhia, R., Benware, B., Madge, R., Shannon, T., Daasch, R.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Application specific integrated circuits Current measurement Distributed computing Independent component analysis Integrated circuit modeling Large scale integration Logic Nearest neighbor searches Predictive models Testing
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