Study of flip chip solder joint cracks under temperature cycling using a laser ultrasound inspection system
The current techniques for nondestructive quality evaluation of bumped solder joint connections in electronics packages are either incapable of detecting solder joint cracks, or unsuitable for in-line inspection due to cost and throughput reasons. As an alternative, a novel solder joint inspection s...
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creator | Lizheng Zhang Ume, I.C. Gamalski, J. Galuschki, K.-P. |
description | The current techniques for nondestructive quality evaluation of bumped solder joint connections in electronics packages are either incapable of detecting solder joint cracks, or unsuitable for in-line inspection due to cost and throughput reasons. As an alternative, a novel solder joint inspection system is being developed. The system projects short laser pulses onto specimen surface through optic fibers to induce structural vibration. The induced surface displacements are then measured by a laser Doppler vibrometer. A number of digital signal processing algorithms, such as error ratio and correlation coefficient, were used to analyze the vibration responses and identify defective specimens. This paper presents a systematic study of parameters such as error ratio, correlation coefficient, resonant frequency, electrical resistance, and the extension of solder joint cracks, to quantitatively characterize the relationships among them. These relationships verified that the laser ultrasound inspection system provides a reliable and efficient way to evaluate flip chip solder joint cracks nondestructively. |
doi_str_mv | 10.1109/ECTC.2005.1441421 |
format | Conference Proceeding |
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As an alternative, a novel solder joint inspection system is being developed. The system projects short laser pulses onto specimen surface through optic fibers to induce structural vibration. The induced surface displacements are then measured by a laser Doppler vibrometer. A number of digital signal processing algorithms, such as error ratio and correlation coefficient, were used to analyze the vibration responses and identify defective specimens. This paper presents a systematic study of parameters such as error ratio, correlation coefficient, resonant frequency, electrical resistance, and the extension of solder joint cracks, to quantitatively characterize the relationships among them. These relationships verified that the laser ultrasound inspection system provides a reliable and efficient way to evaluate flip chip solder joint cracks nondestructively.</description><identifier>ISSN: 0569-5503</identifier><identifier>ISBN: 0780389077</identifier><identifier>ISBN: 9780780389076</identifier><identifier>EISSN: 2377-5726</identifier><identifier>DOI: 10.1109/ECTC.2005.1441421</identifier><language>eng</language><publisher>IEEE</publisher><subject>Costs ; Electronics packaging ; Fiber lasers ; Flip chip solder joints ; Inspection ; Soldering ; Surface cracks ; Surface emitting lasers ; Temperature ; Ultrasonic imaging</subject><ispartof>Proceedings Electronic Components and Technology, 2005. 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ECTC '05</title><addtitle>ECTC</addtitle><description>The current techniques for nondestructive quality evaluation of bumped solder joint connections in electronics packages are either incapable of detecting solder joint cracks, or unsuitable for in-line inspection due to cost and throughput reasons. As an alternative, a novel solder joint inspection system is being developed. The system projects short laser pulses onto specimen surface through optic fibers to induce structural vibration. The induced surface displacements are then measured by a laser Doppler vibrometer. A number of digital signal processing algorithms, such as error ratio and correlation coefficient, were used to analyze the vibration responses and identify defective specimens. This paper presents a systematic study of parameters such as error ratio, correlation coefficient, resonant frequency, electrical resistance, and the extension of solder joint cracks, to quantitatively characterize the relationships among them. These relationships verified that the laser ultrasound inspection system provides a reliable and efficient way to evaluate flip chip solder joint cracks nondestructively.</description><subject>Costs</subject><subject>Electronics packaging</subject><subject>Fiber lasers</subject><subject>Flip chip solder joints</subject><subject>Inspection</subject><subject>Soldering</subject><subject>Surface cracks</subject><subject>Surface emitting lasers</subject><subject>Temperature</subject><subject>Ultrasonic imaging</subject><issn>0569-5503</issn><issn>2377-5726</issn><isbn>0780389077</isbn><isbn>9780780389076</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2005</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotkMtqwzAUREUf0CTtB5Ru9ANOr16WvSwmfUCgi6brIMtXrRLHNpK88N_XodnMwHBmFkPII4M1Y1A-b6pdteYAas2kZJKzK7LgQutMaZ5fkyXoAkRRgtY3ZAEqLzOlQNyRZYwHAAnAigU5fqWxmWjvqGv9QO3vLLFvGwz00PsuURuMPUY6duco4WnAYNIYkNrJtr77oWM8q6GtiTMxtimY2M849V0c0CbfdzROca7ek1tn2ogPF1-R79fNrnrPtp9vH9XLNvNMq5QVkjHkApU2WoFimGsuXGNL4BLQWc2ELaQwjaldKZQTtajr3NZggXPRNGJFnv53PSLuh-BPJkz7y0niD8tKW4w</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>Lizheng Zhang</creator><creator>Ume, I.C.</creator><creator>Gamalski, J.</creator><creator>Galuschki, K.-P.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2005</creationdate><title>Study of flip chip solder joint cracks under temperature cycling using a laser ultrasound inspection system</title><author>Lizheng Zhang ; Ume, I.C. ; Gamalski, J. ; Galuschki, K.-P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-8411e23e57a75051e6723fdc90240efc713c843adabf935f3b3bb6cb0c0223dd3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Costs</topic><topic>Electronics packaging</topic><topic>Fiber lasers</topic><topic>Flip chip solder joints</topic><topic>Inspection</topic><topic>Soldering</topic><topic>Surface cracks</topic><topic>Surface emitting lasers</topic><topic>Temperature</topic><topic>Ultrasonic imaging</topic><toplevel>online_resources</toplevel><creatorcontrib>Lizheng Zhang</creatorcontrib><creatorcontrib>Ume, I.C.</creatorcontrib><creatorcontrib>Gamalski, J.</creatorcontrib><creatorcontrib>Galuschki, K.-P.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lizheng Zhang</au><au>Ume, I.C.</au><au>Gamalski, J.</au><au>Galuschki, K.-P.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Study of flip chip solder joint cracks under temperature cycling using a laser ultrasound inspection system</atitle><btitle>Proceedings Electronic Components and Technology, 2005. ECTC '05</btitle><stitle>ECTC</stitle><date>2005</date><risdate>2005</risdate><spage>1187</spage><epage>1193 Vol. 2</epage><pages>1187-1193 Vol. 2</pages><issn>0569-5503</issn><eissn>2377-5726</eissn><isbn>0780389077</isbn><isbn>9780780389076</isbn><abstract>The current techniques for nondestructive quality evaluation of bumped solder joint connections in electronics packages are either incapable of detecting solder joint cracks, or unsuitable for in-line inspection due to cost and throughput reasons. As an alternative, a novel solder joint inspection system is being developed. The system projects short laser pulses onto specimen surface through optic fibers to induce structural vibration. The induced surface displacements are then measured by a laser Doppler vibrometer. A number of digital signal processing algorithms, such as error ratio and correlation coefficient, were used to analyze the vibration responses and identify defective specimens. This paper presents a systematic study of parameters such as error ratio, correlation coefficient, resonant frequency, electrical resistance, and the extension of solder joint cracks, to quantitatively characterize the relationships among them. These relationships verified that the laser ultrasound inspection system provides a reliable and efficient way to evaluate flip chip solder joint cracks nondestructively.</abstract><pub>IEEE</pub><doi>10.1109/ECTC.2005.1441421</doi></addata></record> |
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ispartof | Proceedings Electronic Components and Technology, 2005. ECTC '05, 2005, p.1187-1193 Vol. 2 |
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language | eng |
recordid | cdi_ieee_primary_1441421 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Costs Electronics packaging Fiber lasers Flip chip solder joints Inspection Soldering Surface cracks Surface emitting lasers Temperature Ultrasonic imaging |
title | Study of flip chip solder joint cracks under temperature cycling using a laser ultrasound inspection system |
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