Over-current testing of HTS tapes
High-temperature superconducting (HTS) transmission cables are subjected to short-circuit fault currents 10 to 30 times the normal operating current and lasting up to 15 cycles. These over-currents will drive the HTS conductor normal and generate heat during the fault. A concern is whether the fault...
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| Veröffentlicht in: | IEEE transactions on applied superconductivity 2005-06, Vol.15 (2), p.1835-1838 |
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| container_title | IEEE transactions on applied superconductivity |
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| creator | Lue, J.W. Gouge, M.J. Duckworth, R.C. |
| description | High-temperature superconducting (HTS) transmission cables are subjected to short-circuit fault currents 10 to 30 times the normal operating current and lasting up to 15 cycles. These over-currents will drive the HTS conductor normal and generate heat during the fault. A concern is whether the fault current will either electromechanically or thermally damage the HTS conductor and degrade it or burn-out the tape altogether. Electromechanical and thermal limitations of over-current pulses were measured on BSCCO and YBCO tapes in a liquid nitrogen bath. With pulse lengths as short as 35 ms, it is found that single BSCCO and YBCO tapes can be pulsed to at least 1 to 1.2 kA without being damaged electromechanically. Longer pulses at moderate (450-750 A) over-currents indicated that HTS tapes can be heated transiently to over 400 K without suffering degradation. Thus, it is likely that other considerations of the cable rather than the HTS tape itself would set the limit for short-circuit fault protection. |
| doi_str_mv | 10.1109/TASC.2005.849306 |
| format | Article |
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These over-currents will drive the HTS conductor normal and generate heat during the fault. A concern is whether the fault current will either electromechanically or thermally damage the HTS conductor and degrade it or burn-out the tape altogether. Electromechanical and thermal limitations of over-current pulses were measured on BSCCO and YBCO tapes in a liquid nitrogen bath. With pulse lengths as short as 35 ms, it is found that single BSCCO and YBCO tapes can be pulsed to at least 1 to 1.2 kA without being damaged electromechanically. Longer pulses at moderate (450-750 A) over-currents indicated that HTS tapes can be heated transiently to over 400 K without suffering degradation. Thus, it is likely that other considerations of the cable rather than the HTS tape itself would set the limit for short-circuit fault protection.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/TASC.2005.849306</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Bismuth compounds ; Cables ; Conductors ; Conductors (devices) ; Connection and protection apparatus ; COPPER OXIDE ; Damage ; Degradation ; Electric connection. Cables. Wiring ; Electrical engineering. Electrical power engineering ; Electronics ; Exact sciences and technology ; Fault currents ; Faults ; High temperature superconductors ; High-temperature superconductor ; Materials ; power transmission cable ; Pulse measurements ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; short circuit ; Superconducting cables ; Superconducting devices ; Superconducting films ; Superconducting tapes ; SUPERCONDUCTIVITY ; SUPERCONDUCTORS ; TAPE ; Testing ; Thermal conductivity ; Various equipment and components ; YBCO superconductors ; Yttrium barium copper oxide ; YTTRIUM OXIDE</subject><ispartof>IEEE transactions on applied superconductivity, 2005-06, Vol.15 (2), p.1835-1838</ispartof><rights>2005 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c414t-e0ca6050ddacfbe12efa8831dedfaa1e17305c3904d9f66ebefcdbeec27045c53</citedby><cites>FETCH-LOGICAL-c414t-e0ca6050ddacfbe12efa8831dedfaa1e17305c3904d9f66ebefcdbeec27045c53</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1440010$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,780,784,789,790,796,23930,23931,25140,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1440010$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16938723$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Lue, J.W.</creatorcontrib><creatorcontrib>Gouge, M.J.</creatorcontrib><creatorcontrib>Duckworth, R.C.</creatorcontrib><title>Over-current testing of HTS tapes</title><title>IEEE transactions on applied superconductivity</title><addtitle>TASC</addtitle><description>High-temperature superconducting (HTS) transmission cables are subjected to short-circuit fault currents 10 to 30 times the normal operating current and lasting up to 15 cycles. These over-currents will drive the HTS conductor normal and generate heat during the fault. A concern is whether the fault current will either electromechanically or thermally damage the HTS conductor and degrade it or burn-out the tape altogether. Electromechanical and thermal limitations of over-current pulses were measured on BSCCO and YBCO tapes in a liquid nitrogen bath. With pulse lengths as short as 35 ms, it is found that single BSCCO and YBCO tapes can be pulsed to at least 1 to 1.2 kA without being damaged electromechanically. Longer pulses at moderate (450-750 A) over-currents indicated that HTS tapes can be heated transiently to over 400 K without suffering degradation. Thus, it is likely that other considerations of the cable rather than the HTS tape itself would set the limit for short-circuit fault protection.</description><subject>Applied sciences</subject><subject>Bismuth compounds</subject><subject>Cables</subject><subject>Conductors</subject><subject>Conductors (devices)</subject><subject>Connection and protection apparatus</subject><subject>COPPER OXIDE</subject><subject>Damage</subject><subject>Degradation</subject><subject>Electric connection. Cables. Wiring</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fault currents</subject><subject>Faults</subject><subject>High temperature superconductors</subject><subject>High-temperature superconductor</subject><subject>Materials</subject><subject>power transmission cable</subject><subject>Pulse measurements</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>short circuit</subject><subject>Superconducting cables</subject><subject>Superconducting devices</subject><subject>Superconducting films</subject><subject>Superconducting tapes</subject><subject>SUPERCONDUCTIVITY</subject><subject>SUPERCONDUCTORS</subject><subject>TAPE</subject><subject>Testing</subject><subject>Thermal conductivity</subject><subject>Various equipment and components</subject><subject>YBCO superconductors</subject><subject>Yttrium barium copper oxide</subject><subject>YTTRIUM OXIDE</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqNkU1Lw0AQhoMoWKt3wUsU1FPq7FeyeyxFrVDoofW8bDezkpImdTcV_PduSaHgQTzNwDzvMMOTJNcERoSAelqOF5MRBRAjyRWD_CQZECFkRgURp7EHQTJJKTtPLkJYAxAuuRgkt_Mv9JndeY9Nl3YYuqr5SFuXTpeLtDNbDJfJmTN1wKtDHSbvL8_LyTSbzV_fJuNZZjnhXYZgTQ4CytJYt0JC0RkpGSmxdMYQJAUDYZkCXiqX57hCZ8sVoqUFcGEFGyaP_d6tbz938RC9qYLFujYNtrugpcopCKaKSD78SVJJFOVc_AOEgilOI3j3C1y3O9_Ed7UiFAqlBI8Q9JD1bQgend76amP8tyag9w703oHeO9C9gxi5P-w1wZraedPYKhxzuWKyoCxyNz1XIeJxzHn0BOwH9qWNjQ</recordid><startdate>20050601</startdate><enddate>20050601</enddate><creator>Lue, J.W.</creator><creator>Gouge, M.J.</creator><creator>Duckworth, R.C.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>H8D</scope><scope>7QQ</scope><scope>F28</scope><scope>FR3</scope><scope>H8G</scope><scope>JG9</scope></search><sort><creationdate>20050601</creationdate><title>Over-current testing of HTS tapes</title><author>Lue, J.W. ; Gouge, M.J. ; Duckworth, R.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c414t-e0ca6050ddacfbe12efa8831dedfaa1e17305c3904d9f66ebefcdbeec27045c53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Applied sciences</topic><topic>Bismuth compounds</topic><topic>Cables</topic><topic>Conductors</topic><topic>Conductors (devices)</topic><topic>Connection and protection apparatus</topic><topic>COPPER OXIDE</topic><topic>Damage</topic><topic>Degradation</topic><topic>Electric connection. Cables. Wiring</topic><topic>Electrical engineering. Electrical power engineering</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fault currents</topic><topic>Faults</topic><topic>High temperature superconductors</topic><topic>High-temperature superconductor</topic><topic>Materials</topic><topic>power transmission cable</topic><topic>Pulse measurements</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>short circuit</topic><topic>Superconducting cables</topic><topic>Superconducting devices</topic><topic>Superconducting films</topic><topic>Superconducting tapes</topic><topic>SUPERCONDUCTIVITY</topic><topic>SUPERCONDUCTORS</topic><topic>TAPE</topic><topic>Testing</topic><topic>Thermal conductivity</topic><topic>Various equipment and components</topic><topic>YBCO superconductors</topic><topic>Yttrium barium copper oxide</topic><topic>YTTRIUM OXIDE</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lue, J.W.</creatorcontrib><creatorcontrib>Gouge, M.J.</creatorcontrib><creatorcontrib>Duckworth, R.C.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Aerospace Database</collection><collection>Ceramic Abstracts</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Copper Technical Reference Library</collection><collection>Materials Research Database</collection><jtitle>IEEE transactions on applied superconductivity</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lue, J.W.</au><au>Gouge, M.J.</au><au>Duckworth, R.C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Over-current testing of HTS tapes</atitle><jtitle>IEEE transactions on applied superconductivity</jtitle><stitle>TASC</stitle><date>2005-06-01</date><risdate>2005</risdate><volume>15</volume><issue>2</issue><spage>1835</spage><epage>1838</epage><pages>1835-1838</pages><issn>1051-8223</issn><eissn>1558-2515</eissn><coden>ITASE9</coden><abstract>High-temperature superconducting (HTS) transmission cables are subjected to short-circuit fault currents 10 to 30 times the normal operating current and lasting up to 15 cycles. These over-currents will drive the HTS conductor normal and generate heat during the fault. A concern is whether the fault current will either electromechanically or thermally damage the HTS conductor and degrade it or burn-out the tape altogether. Electromechanical and thermal limitations of over-current pulses were measured on BSCCO and YBCO tapes in a liquid nitrogen bath. With pulse lengths as short as 35 ms, it is found that single BSCCO and YBCO tapes can be pulsed to at least 1 to 1.2 kA without being damaged electromechanically. Longer pulses at moderate (450-750 A) over-currents indicated that HTS tapes can be heated transiently to over 400 K without suffering degradation. Thus, it is likely that other considerations of the cable rather than the HTS tape itself would set the limit for short-circuit fault protection.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TASC.2005.849306</doi><tpages>4</tpages></addata></record> |
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| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Bismuth compounds Cables Conductors Conductors (devices) Connection and protection apparatus COPPER OXIDE Damage Degradation Electric connection. Cables. Wiring Electrical engineering. Electrical power engineering Electronics Exact sciences and technology Fault currents Faults High temperature superconductors High-temperature superconductor Materials power transmission cable Pulse measurements Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices short circuit Superconducting cables Superconducting devices Superconducting films Superconducting tapes SUPERCONDUCTIVITY SUPERCONDUCTORS TAPE Testing Thermal conductivity Various equipment and components YBCO superconductors Yttrium barium copper oxide YTTRIUM OXIDE |
| title | Over-current testing of HTS tapes |
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