Modeling microwave contact discontinuities

The microwave contact discontinuities are some of the most frequent, though less studied, discontinuities one can enconnter in microwave circuits and components. Some examples are the fmed contacts in connectors and cables, mobile contacts in electromechanical switches and RF MEMS switches and conta...

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Hauptverfasser: Kwiatkowski, R., Viadimirescu, M.
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description The microwave contact discontinuities are some of the most frequent, though less studied, discontinuities one can enconnter in microwave circuits and components. Some examples are the fmed contacts in connectors and cables, mobile contacts in electromechanical switches and RF MEMS switches and contacts in test setup probes and boards, etc. The paper deals with the physical model of the mobile microwave contacts in electromechanical switches and RF MEMS switches; however, many of the findings presented can be applied to other types of microwave contacts. The main parameters characterizing the microwave contacts are analyzed and estimated. A novel experimental method is presented that derives a correlation between the DC contact resistance and the measured RF scattering parameters that can be used for evaluating the RF performaoce over temperature by monitoring the DC contact resistance. In the non-tinear case, the Passive lntermodnlation (PIM) phenomenon is analyzed and the intermadnlation levels are estimated using a 5th order model based on measured current-voltage contact characteristic.
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fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_1412576</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1412576</ieee_id><sourcerecordid>1412576</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-4298068eebda0902613dc6b0efde319e879a0a1f84b23c8a66f1636f93bab3163</originalsourceid><addsrcrecordid>eNotjMFKAzEUAAMiVGu_wMueCwtJ3iabHGWpWmjxoufykryUJ91d2ayKf2-lzmXmNFfiVhknDXiv5UKsSnmXZ8Abo5sbsd6PiU48HKue4zR-4xdVcRxmjHOVuPwlD588M5U7cZ3xVGj176V4e9y8ds_17uVp2z3salatmetGeyetIwoJpZfaKkjRBkk5EShPrvUoUWXXBA3RobVZWbDZQ8AA51yK-8uXiejwMXGP089BNUqb1sIvq_k6uw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Modeling microwave contact discontinuities</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Kwiatkowski, R. ; Viadimirescu, M.</creator><creatorcontrib>Kwiatkowski, R. ; Viadimirescu, M.</creatorcontrib><description>The microwave contact discontinuities are some of the most frequent, though less studied, discontinuities one can enconnter in microwave circuits and components. Some examples are the fmed contacts in connectors and cables, mobile contacts in electromechanical switches and RF MEMS switches and contacts in test setup probes and boards, etc. The paper deals with the physical model of the mobile microwave contacts in electromechanical switches and RF MEMS switches; however, many of the findings presented can be applied to other types of microwave contacts. The main parameters characterizing the microwave contacts are analyzed and estimated. A novel experimental method is presented that derives a correlation between the DC contact resistance and the measured RF scattering parameters that can be used for evaluating the RF performaoce over temperature by monitoring the DC contact resistance. In the non-tinear case, the Passive lntermodnlation (PIM) phenomenon is analyzed and the intermadnlation levels are estimated using a 5th order model based on measured current-voltage contact characteristic.</description><identifier>ISBN: 1580539920</identifier><identifier>ISBN: 9781580539920</identifier><language>eng</language><publisher>IEEE</publisher><subject>Conductivity ; Contact resistance ; Electric resistance ; Electrical resistance measurement ; Electrons ; Microwave circuits ; Radio frequency ; Radiofrequency microelectromechanical systems ; Surface resistance ; Switches</subject><ispartof>34th European Microwave Conference, 2004, 2004, Vol.1, p.289-292</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1412576$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1412576$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kwiatkowski, R.</creatorcontrib><creatorcontrib>Viadimirescu, M.</creatorcontrib><title>Modeling microwave contact discontinuities</title><title>34th European Microwave Conference, 2004</title><addtitle>EUMC</addtitle><description>The microwave contact discontinuities are some of the most frequent, though less studied, discontinuities one can enconnter in microwave circuits and components. Some examples are the fmed contacts in connectors and cables, mobile contacts in electromechanical switches and RF MEMS switches and contacts in test setup probes and boards, etc. The paper deals with the physical model of the mobile microwave contacts in electromechanical switches and RF MEMS switches; however, many of the findings presented can be applied to other types of microwave contacts. The main parameters characterizing the microwave contacts are analyzed and estimated. A novel experimental method is presented that derives a correlation between the DC contact resistance and the measured RF scattering parameters that can be used for evaluating the RF performaoce over temperature by monitoring the DC contact resistance. In the non-tinear case, the Passive lntermodnlation (PIM) phenomenon is analyzed and the intermadnlation levels are estimated using a 5th order model based on measured current-voltage contact characteristic.</description><subject>Conductivity</subject><subject>Contact resistance</subject><subject>Electric resistance</subject><subject>Electrical resistance measurement</subject><subject>Electrons</subject><subject>Microwave circuits</subject><subject>Radio frequency</subject><subject>Radiofrequency microelectromechanical systems</subject><subject>Surface resistance</subject><subject>Switches</subject><isbn>1580539920</isbn><isbn>9781580539920</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2004</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotjMFKAzEUAAMiVGu_wMueCwtJ3iabHGWpWmjxoufykryUJ91d2ayKf2-lzmXmNFfiVhknDXiv5UKsSnmXZ8Abo5sbsd6PiU48HKue4zR-4xdVcRxmjHOVuPwlD588M5U7cZ3xVGj176V4e9y8ds_17uVp2z3salatmetGeyetIwoJpZfaKkjRBkk5EShPrvUoUWXXBA3RobVZWbDZQ8AA51yK-8uXiejwMXGP089BNUqb1sIvq_k6uw</recordid><startdate>2004</startdate><enddate>2004</enddate><creator>Kwiatkowski, R.</creator><creator>Viadimirescu, M.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2004</creationdate><title>Modeling microwave contact discontinuities</title><author>Kwiatkowski, R. ; Viadimirescu, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-4298068eebda0902613dc6b0efde319e879a0a1f84b23c8a66f1636f93bab3163</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Conductivity</topic><topic>Contact resistance</topic><topic>Electric resistance</topic><topic>Electrical resistance measurement</topic><topic>Electrons</topic><topic>Microwave circuits</topic><topic>Radio frequency</topic><topic>Radiofrequency microelectromechanical systems</topic><topic>Surface resistance</topic><topic>Switches</topic><toplevel>online_resources</toplevel><creatorcontrib>Kwiatkowski, R.</creatorcontrib><creatorcontrib>Viadimirescu, M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kwiatkowski, R.</au><au>Viadimirescu, M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Modeling microwave contact discontinuities</atitle><btitle>34th European Microwave Conference, 2004</btitle><stitle>EUMC</stitle><date>2004</date><risdate>2004</risdate><volume>1</volume><spage>289</spage><epage>292</epage><pages>289-292</pages><isbn>1580539920</isbn><isbn>9781580539920</isbn><abstract>The microwave contact discontinuities are some of the most frequent, though less studied, discontinuities one can enconnter in microwave circuits and components. Some examples are the fmed contacts in connectors and cables, mobile contacts in electromechanical switches and RF MEMS switches and contacts in test setup probes and boards, etc. The paper deals with the physical model of the mobile microwave contacts in electromechanical switches and RF MEMS switches; however, many of the findings presented can be applied to other types of microwave contacts. The main parameters characterizing the microwave contacts are analyzed and estimated. A novel experimental method is presented that derives a correlation between the DC contact resistance and the measured RF scattering parameters that can be used for evaluating the RF performaoce over temperature by monitoring the DC contact resistance. In the non-tinear case, the Passive lntermodnlation (PIM) phenomenon is analyzed and the intermadnlation levels are estimated using a 5th order model based on measured current-voltage contact characteristic.</abstract><pub>IEEE</pub><tpages>4</tpages></addata></record>
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subjects Conductivity
Contact resistance
Electric resistance
Electrical resistance measurement
Electrons
Microwave circuits
Radio frequency
Radiofrequency microelectromechanical systems
Surface resistance
Switches
title Modeling microwave contact discontinuities
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-24T14%3A15%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Modeling%20microwave%20contact%20discontinuities&rft.btitle=34th%20European%20Microwave%20Conference,%202004&rft.au=Kwiatkowski,%20R.&rft.date=2004&rft.volume=1&rft.spage=289&rft.epage=292&rft.pages=289-292&rft.isbn=1580539920&rft.isbn_list=9781580539920&rft_id=info:doi/&rft_dat=%3Cieee_6IE%3E1412576%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1412576&rfr_iscdi=true