Preconditioning, write width, and recording properties of Co-Cr-Pt-O perpendicular media with various underlayer designs
The effect of magnetic "preconditioning" on the recording performance of perpendicular media is investigated. Furthermore, the dependence of the magnetic write width (MWW) of shielded-pole heads (SPH) on soft-underlayer (SUL) type and thickness (t/sub SUL/) and the recording performance of...
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| Veröffentlicht in: | IEEE transactions on magnetics 2005-02, Vol.41 (2), p.581-586 |
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| creator | Abarra, E.N. Gill, P. Min Zheng Zhou, J.N. Acharya, B.R. Choe, G. |
| description | The effect of magnetic "preconditioning" on the recording performance of perpendicular media is investigated. Furthermore, the dependence of the magnetic write width (MWW) of shielded-pole heads (SPH) on soft-underlayer (SUL) type and thickness (t/sub SUL/) and the recording performance of perpendicular media with thin SULs are examined. The MWW dependence on SUL structure is influenced by the pole-to-trailing shield spacing. For a wide-gap (/spl sim/80 nm) SPH, thick single-layer, SULs are preferred. For a narrow-gap (/spl sim/50 nm) SPH, MWW is less sensitive to the SUL type. For both narrow and wide-gap SPH and for media with an antiferromagnetically-coupled SUL, MWW is reduced for t/sub SUL/ |
| doi_str_mv | 10.1109/TMAG.2004.838069 |
| format | Article |
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Furthermore, the dependence of the magnetic write width (MWW) of shielded-pole heads (SPH) on soft-underlayer (SUL) type and thickness (t/sub SUL/) and the recording performance of perpendicular media with thin SULs are examined. The MWW dependence on SUL structure is influenced by the pole-to-trailing shield spacing. For a wide-gap (/spl sim/80 nm) SPH, thick single-layer, SULs are preferred. For a narrow-gap (/spl sim/50 nm) SPH, MWW is less sensitive to the SUL type. For both narrow and wide-gap SPH and for media with an antiferromagnetically-coupled SUL, MWW is reduced for t/sub SUL/<100 nm. Comparable performance is achieved relative to media with t/sub SUL//spl sim/150 nm.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/TMAG.2004.838069</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>AC erase ; Amorphous magnetic materials ; Antiferromagnetic materials ; Antiferromagnetism ; Cobalt ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Land mobile radio ; Magnetic heads ; Magnetic properties ; Magnetic recording ; Magnetic shielding ; magnetic write width (MWW) ; Magnetism ; Materials science ; Media ; Other topics in materials science ; Perpendicular magnetic recording ; perpendicular media ; Physics ; Preconditioning ; Recording ; recording properties ; Shields ; Soft magnetic materials ; soft underlayer (SUL) ; Testing</subject><ispartof>IEEE transactions on magnetics, 2005-02, Vol.41 (2), p.581-586</ispartof><rights>2005 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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Furthermore, the dependence of the magnetic write width (MWW) of shielded-pole heads (SPH) on soft-underlayer (SUL) type and thickness (t/sub SUL/) and the recording performance of perpendicular media with thin SULs are examined. The MWW dependence on SUL structure is influenced by the pole-to-trailing shield spacing. For a wide-gap (/spl sim/80 nm) SPH, thick single-layer, SULs are preferred. For a narrow-gap (/spl sim/50 nm) SPH, MWW is less sensitive to the SUL type. For both narrow and wide-gap SPH and for media with an antiferromagnetically-coupled SUL, MWW is reduced for t/sub SUL/<100 nm. Comparable performance is achieved relative to media with t/sub SUL//spl sim/150 nm.</description><subject>AC erase</subject><subject>Amorphous magnetic materials</subject><subject>Antiferromagnetic materials</subject><subject>Antiferromagnetism</subject><subject>Cobalt</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Land mobile radio</subject><subject>Magnetic heads</subject><subject>Magnetic properties</subject><subject>Magnetic recording</subject><subject>Magnetic shielding</subject><subject>magnetic write width (MWW)</subject><subject>Magnetism</subject><subject>Materials science</subject><subject>Media</subject><subject>Other topics in materials science</subject><subject>Perpendicular magnetic recording</subject><subject>perpendicular media</subject><subject>Physics</subject><subject>Preconditioning</subject><subject>Recording</subject><subject>recording properties</subject><subject>Shields</subject><subject>Soft magnetic materials</subject><subject>soft underlayer (SUL)</subject><subject>Testing</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kU1rGzEQhkVpoW7ae6EXUUh7yboj62OlozFNGkhJDulZaKXZRGGtdaXdpvn3kXEgkENO8_XMywwvIZ8ZLBkD8-P69_psuQIQS801KPOGLJgRrIGavyULAKYbI5R4Tz6UcldLIRksyP-rjH5MIU5xTDHdnND7HCek9zFMtyfUpUD3QA51Rnd53GGeIhY69nQzNpvcXE3NJa3dHVYRPw8u0y2G6KrCdEv_uRzHudA5BcyDe8BMA5Z4k8pH8q53Q8FPT_GI_Dn9eb351Vxcnp1v1heN55pPTdc6zVBCx9rWtx6Eka3rjAud6GVQrXFMe6Wl8l56obsuoDeKC2RixZlu-RH5ftCtx_-dsUx2G4vHYXAJ62XWMKHkyjCo5LdXyZUGqUCrCn59Ad6Nc071C6tVK5QCySoEB8jnsZSMvd3luHX5wTKwe8fs3jG7d8weHKsrx0-6rng39NklH8vznpJCcy4q9-XARUR8HnOjmBb8EVIYn48</recordid><startdate>20050201</startdate><enddate>20050201</enddate><creator>Abarra, E.N.</creator><creator>Gill, P.</creator><creator>Min Zheng</creator><creator>Zhou, J.N.</creator><creator>Acharya, B.R.</creator><creator>Choe, G.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Furthermore, the dependence of the magnetic write width (MWW) of shielded-pole heads (SPH) on soft-underlayer (SUL) type and thickness (t/sub SUL/) and the recording performance of perpendicular media with thin SULs are examined. The MWW dependence on SUL structure is influenced by the pole-to-trailing shield spacing. For a wide-gap (/spl sim/80 nm) SPH, thick single-layer, SULs are preferred. For a narrow-gap (/spl sim/50 nm) SPH, MWW is less sensitive to the SUL type. For both narrow and wide-gap SPH and for media with an antiferromagnetically-coupled SUL, MWW is reduced for t/sub SUL/<100 nm. Comparable performance is achieved relative to media with t/sub SUL//spl sim/150 nm.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TMAG.2004.838069</doi><tpages>6</tpages></addata></record> |
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| subjects | AC erase Amorphous magnetic materials Antiferromagnetic materials Antiferromagnetism Cobalt Cross-disciplinary physics: materials science rheology Exact sciences and technology Land mobile radio Magnetic heads Magnetic properties Magnetic recording Magnetic shielding magnetic write width (MWW) Magnetism Materials science Media Other topics in materials science Perpendicular magnetic recording perpendicular media Physics Preconditioning Recording recording properties Shields Soft magnetic materials soft underlayer (SUL) Testing |
| title | Preconditioning, write width, and recording properties of Co-Cr-Pt-O perpendicular media with various underlayer designs |
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