Efficient pattern mapping for deterministic logic BIST

Deterministic logic BIST (DLBIST) is an attractive test strategy, since it combines advantages of deterministic external testing and pseudo-random LBIST. Unfortunately, previously published DLBIST methods are unsuited for large ICs, since computing time and memory consumption of the DLBIST synthesis...

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Bibliographische Detailangaben

Hauptverfasser:	Gherman, V., Wunderlich, H.-J., Vranken, H., Hapke, F., Wittke, M., Garbers, M.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Applied sciences Automatic testing Boolean functions Built-in self-test Circuit faults Circuit synthesis Circuit testing Data structures Electronics Exact sciences and technology Integrated circuit testing Logic testing Test pattern generators Testing, measurement, noise and reliability
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