The soft error problem: an architectural perspective

Radiation-induced soft errors have emerged as a key challenge in computer system design. If the industry is to continue to provide customers with the level of reliability they expect, microprocessor architects must address this challenge directly. This effort has two parts. First, architects must un...

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Bibliographische Detailangaben

Hauptverfasser:	Mukherjee, S.S., Emer, J., Reinhardt, S.K.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Additives Alpha particles Computer architecture Computer errors Error analysis Error correction Particle measurements Pollution measurement Semiconductor device measurement Testing
Online-Zugang:	Volltext bestellen
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