Study of temperature dependence of bump bonding for the BTeV pixel detector
The pixel detector proposed for the BTeV experiment at the Fermilab Tevatron will use bump-bonding technology based on either Indium or Pb/Sn solder to connect the front-end readout chips to the silicon pixel sensors. We have studied the behavior of the bumps by visual inspection of the bumps bondin...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2004-10, Vol.51 (5), p.2161-2167 |
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| container_title | IEEE transactions on nuclear science |
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| creator | Turqueti, M. Cihangir, S. Kwan, S. Appel, J.A. Cardoso, G. Christian, D.C. Hall, B.K. Zimmermann, S. |
| description | The pixel detector proposed for the BTeV experiment at the Fermilab Tevatron will use bump-bonding technology based on either Indium or Pb/Sn solder to connect the front-end readout chips to the silicon pixel sensors. We have studied the behavior of the bumps by visual inspection of the bumps bonding silicon sensor modules to dummy chips made out of glass. The studies were done before and after thermal cycles, exposure to intense irradiation, and with the assemblies glued to a graphite substrate. We have also carried out studies on effects of temperature changes on both types of bump bonds by observing the responses of single-chip pixel detectors to a /sup 90/Sr source. We report the results from these studies as well as the noise and threshold behavior of the pixel readout at various temperatures. |
| doi_str_mv | 10.1109/TNS.2004.834709 |
| format | Article |
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We have studied the behavior of the bumps by visual inspection of the bumps bonding silicon sensor modules to dummy chips made out of glass. The studies were done before and after thermal cycles, exposure to intense irradiation, and with the assemblies glued to a graphite substrate. We have also carried out studies on effects of temperature changes on both types of bump bonds by observing the responses of single-chip pixel detectors to a /sup 90/Sr source. 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(IEEE) 2004</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c379t-b25ac300a1d46f48ef42ce9a179b034656bc343bb29cab92cb75fe6a444095233</citedby><cites>FETCH-LOGICAL-c379t-b25ac300a1d46f48ef42ce9a179b034656bc343bb29cab92cb75fe6a444095233</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1344302$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1344302$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Turqueti, M.</creatorcontrib><creatorcontrib>Cihangir, S.</creatorcontrib><creatorcontrib>Kwan, S.</creatorcontrib><creatorcontrib>Appel, J.A.</creatorcontrib><creatorcontrib>Cardoso, G.</creatorcontrib><creatorcontrib>Christian, D.C.</creatorcontrib><creatorcontrib>Hall, B.K.</creatorcontrib><creatorcontrib>Zimmermann, S.</creatorcontrib><title>Study of temperature dependence of bump bonding for the BTeV pixel detector</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><description>The pixel detector proposed for the BTeV experiment at the Fermilab Tevatron will use bump-bonding technology based on either Indium or Pb/Sn solder to connect the front-end readout chips to the silicon pixel sensors. We have studied the behavior of the bumps by visual inspection of the bumps bonding silicon sensor modules to dummy chips made out of glass. The studies were done before and after thermal cycles, exposure to intense irradiation, and with the assemblies glued to a graphite substrate. We have also carried out studies on effects of temperature changes on both types of bump bonds by observing the responses of single-chip pixel detectors to a /sup 90/Sr source. We report the results from these studies as well as the noise and threshold behavior of the pixel readout at various temperatures.</description><subject>Assembly</subject><subject>Bonding</subject><subject>Detectors</subject><subject>Glass</subject><subject>Indium</subject><subject>Inspection</subject><subject>Silicon</subject><subject>Temperature dependence</subject><subject>Temperature sensors</subject><subject>Tin</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqNkctLw0AQhxdRsFbPHrwED97Szr6S3aOKLyx6aPW67G4mmtI83CRg_3tTIgieCgPDMN9vYPgIOacwoxT0fPWynDEAMVNcpKAPyIRKqWIqU3VIJgBUxVpofUxO2nY9jEKCnJDnZddn26jOow7LBoPt-oBRhg1WGVYedxvXl03k6iorqo8or0PUfWJ0s8L3qCm-cTPQHfquDqfkKLebFs9--5S83d-tbh_jxevD0-31IvY81V3smLSeA1iaiSQXCnPBPGpLU-2Ai0QmznPBnWPaW6eZd6nMMbFCCNCScT4lV-PdJtRfPbadKYvW42ZjK6z71jCd8DTle4BKCUap3ANMhuIwgJf_wHXdh2r41mgGKtWg1ADNR8iHum0D5qYJRWnD1lAwO1dmcGV2rszoakhcjIkCEf9oLgQHxn8AChCONA</recordid><startdate>200410</startdate><enddate>200410</enddate><creator>Turqueti, M.</creator><creator>Cihangir, S.</creator><creator>Kwan, S.</creator><creator>Appel, J.A.</creator><creator>Cardoso, G.</creator><creator>Christian, D.C.</creator><creator>Hall, B.K.</creator><creator>Zimmermann, S.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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We have studied the behavior of the bumps by visual inspection of the bumps bonding silicon sensor modules to dummy chips made out of glass. The studies were done before and after thermal cycles, exposure to intense irradiation, and with the assemblies glued to a graphite substrate. We have also carried out studies on effects of temperature changes on both types of bump bonds by observing the responses of single-chip pixel detectors to a /sup 90/Sr source. We report the results from these studies as well as the noise and threshold behavior of the pixel readout at various temperatures.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TNS.2004.834709</doi><tpages>7</tpages></addata></record> |
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| subjects | Assembly Bonding Detectors Glass Indium Inspection Silicon Temperature dependence Temperature sensors Tin |
| title | Study of temperature dependence of bump bonding for the BTeV pixel detector |
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