Face authentication test on the BANCA database

This work details the results of a face authentication test (FAT2004) (http://www.ee.surrey.ac.uk/banca/icpr2004) held in conjunction with the 17th International Conference on Pattern Recognition. The contest was held on the publicly available BANCA database (http://www.ee.surrey.ac.uk/banca) accord...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Messer, K., Kittler, J., Sadeghi, M., Hamouz, M., Kostin, A., Cardinaux, F., Marcel, S., Bengio, S., Sanderson, C., Poh, N., Rodriguez, Y., Czyz, J., Vandendorpe, L., McCool, C., Lowther, S., Sridharan, S., Chandran, V., Palacios, R.P., Vidal, E., Li Bai, LinLin Shen, Yan Wang, Chiang Yueh-Hsuan, Liu Hsien-Chang, Hung Yi-Ping, Heinrichs, A., Muller, M., Tewes, A., von der Malsburg, C., Wurtz, R., Zhenger Wang, Feng Xue, Yong Ma, Qiong Yang, Chi Fang, Xiaoqing Ding, Lucey, S., Goss, R., Schneiderman, H.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 532 Vol.4
container_issue
container_start_page 523
container_title
container_volume 4
creator Messer, K.
Kittler, J.
Sadeghi, M.
Hamouz, M.
Kostin, A.
Cardinaux, F.
Marcel, S.
Bengio, S.
Sanderson, C.
Poh, N.
Rodriguez, Y.
Czyz, J.
Vandendorpe, L.
McCool, C.
Lowther, S.
Sridharan, S.
Chandran, V.
Palacios, R.P.
Vidal, E.
Li Bai
LinLin Shen
Yan Wang
Chiang Yueh-Hsuan
Liu Hsien-Chang
Hung Yi-Ping
Heinrichs, A.
Muller, M.
Tewes, A.
von der Malsburg, C.
Wurtz, R.
Zhenger Wang
Feng Xue
Yong Ma
Qiong Yang
Chi Fang
Xiaoqing Ding
Lucey, S.
Goss, R.
Schneiderman, H.
description This work details the results of a face authentication test (FAT2004) (http://www.ee.surrey.ac.uk/banca/icpr2004) held in conjunction with the 17th International Conference on Pattern Recognition. The contest was held on the publicly available BANCA database (http://www.ee.surrey.ac.uk/banca) according to a defined protocol (E. Bailly-Bailliere et al., June 2003). The competition also had a sequestered part in which institutions had to submit their algorithms for independent testing. 13 different verification algorithms from 10 institutions submitted results. Also, a standard set of face recognition software packages from the Internet (http://www.cs.colostate.edu/evalfacerec) were used to provide a baseline performance measure.
doi_str_mv 10.1109/ICPR.2004.1333826
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_1333826</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1333826</ieee_id><sourcerecordid>1333826</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-a620322a141077c4890de1e611040523d0de88fac5c0d17fd7f9c7bee70bd42c3</originalsourceid><addsrcrecordid>eNotj8tOwzAQRS0eEmnhAxCb_EDCzNiOnWWIKFSqaIVgXU3siRoEBTVmwd8TRFdHd3N0rlLXCCUi1LfLdvNcEoApUWvtqTpRGXmNhTPOnqoZuKq2hOTpTGUIFgtTWbxQs3F8AyDQ1meqXHCQnL_TTvZpCJyGz32eZEz5H3eS3zVPbZNHTtzxKJfqvOf3Ua6OnKvXxf1L-1is1g_LtlkVAzqbCq4mPRGjQXAuGF9DFJRq6jZgScdpet9zsAEiuj66vg6uE3HQRUNBz9XNv3cQke3XYfjgw8_2-FP_AoXHQuM</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Face authentication test on the BANCA database</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Messer, K. ; Kittler, J. ; Sadeghi, M. ; Hamouz, M. ; Kostin, A. ; Cardinaux, F. ; Marcel, S. ; Bengio, S. ; Sanderson, C. ; Poh, N. ; Rodriguez, Y. ; Czyz, J. ; Vandendorpe, L. ; McCool, C. ; Lowther, S. ; Sridharan, S. ; Chandran, V. ; Palacios, R.P. ; Vidal, E. ; Li Bai ; LinLin Shen ; Yan Wang ; Chiang Yueh-Hsuan ; Liu Hsien-Chang ; Hung Yi-Ping ; Heinrichs, A. ; Muller, M. ; Tewes, A. ; von der Malsburg, C. ; Wurtz, R. ; Zhenger Wang ; Feng Xue ; Yong Ma ; Qiong Yang ; Chi Fang ; Xiaoqing Ding ; Lucey, S. ; Goss, R. ; Schneiderman, H.</creator><creatorcontrib>Messer, K. ; Kittler, J. ; Sadeghi, M. ; Hamouz, M. ; Kostin, A. ; Cardinaux, F. ; Marcel, S. ; Bengio, S. ; Sanderson, C. ; Poh, N. ; Rodriguez, Y. ; Czyz, J. ; Vandendorpe, L. ; McCool, C. ; Lowther, S. ; Sridharan, S. ; Chandran, V. ; Palacios, R.P. ; Vidal, E. ; Li Bai ; LinLin Shen ; Yan Wang ; Chiang Yueh-Hsuan ; Liu Hsien-Chang ; Hung Yi-Ping ; Heinrichs, A. ; Muller, M. ; Tewes, A. ; von der Malsburg, C. ; Wurtz, R. ; Zhenger Wang ; Feng Xue ; Yong Ma ; Qiong Yang ; Chi Fang ; Xiaoqing Ding ; Lucey, S. ; Goss, R. ; Schneiderman, H.</creatorcontrib><description>This work details the results of a face authentication test (FAT2004) (http://www.ee.surrey.ac.uk/banca/icpr2004) held in conjunction with the 17th International Conference on Pattern Recognition. The contest was held on the publicly available BANCA database (http://www.ee.surrey.ac.uk/banca) according to a defined protocol (E. Bailly-Bailliere et al., June 2003). The competition also had a sequestered part in which institutions had to submit their algorithms for independent testing. 13 different verification algorithms from 10 institutions submitted results. Also, a standard set of face recognition software packages from the Internet (http://www.cs.colostate.edu/evalfacerec) were used to provide a baseline performance measure.</description><identifier>ISSN: 1051-4651</identifier><identifier>ISBN: 0769521282</identifier><identifier>ISBN: 9780769521282</identifier><identifier>EISSN: 2831-7475</identifier><identifier>DOI: 10.1109/ICPR.2004.1333826</identifier><language>eng</language><publisher>IEEE</publisher><subject>Authentication ; Face recognition ; Internet ; Measurement standards ; Pattern recognition ; Protocols ; Software packages ; Software standards ; Testing</subject><ispartof>Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004, 2004, Vol.4, p.523-532 Vol.4</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1333826$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2051,4035,4036,27904,54898</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1333826$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Messer, K.</creatorcontrib><creatorcontrib>Kittler, J.</creatorcontrib><creatorcontrib>Sadeghi, M.</creatorcontrib><creatorcontrib>Hamouz, M.</creatorcontrib><creatorcontrib>Kostin, A.</creatorcontrib><creatorcontrib>Cardinaux, F.</creatorcontrib><creatorcontrib>Marcel, S.</creatorcontrib><creatorcontrib>Bengio, S.</creatorcontrib><creatorcontrib>Sanderson, C.</creatorcontrib><creatorcontrib>Poh, N.</creatorcontrib><creatorcontrib>Rodriguez, Y.</creatorcontrib><creatorcontrib>Czyz, J.</creatorcontrib><creatorcontrib>Vandendorpe, L.</creatorcontrib><creatorcontrib>McCool, C.</creatorcontrib><creatorcontrib>Lowther, S.</creatorcontrib><creatorcontrib>Sridharan, S.</creatorcontrib><creatorcontrib>Chandran, V.</creatorcontrib><creatorcontrib>Palacios, R.P.</creatorcontrib><creatorcontrib>Vidal, E.</creatorcontrib><creatorcontrib>Li Bai</creatorcontrib><creatorcontrib>LinLin Shen</creatorcontrib><creatorcontrib>Yan Wang</creatorcontrib><creatorcontrib>Chiang Yueh-Hsuan</creatorcontrib><creatorcontrib>Liu Hsien-Chang</creatorcontrib><creatorcontrib>Hung Yi-Ping</creatorcontrib><creatorcontrib>Heinrichs, A.</creatorcontrib><creatorcontrib>Muller, M.</creatorcontrib><creatorcontrib>Tewes, A.</creatorcontrib><creatorcontrib>von der Malsburg, C.</creatorcontrib><creatorcontrib>Wurtz, R.</creatorcontrib><creatorcontrib>Zhenger Wang</creatorcontrib><creatorcontrib>Feng Xue</creatorcontrib><creatorcontrib>Yong Ma</creatorcontrib><creatorcontrib>Qiong Yang</creatorcontrib><creatorcontrib>Chi Fang</creatorcontrib><creatorcontrib>Xiaoqing Ding</creatorcontrib><creatorcontrib>Lucey, S.</creatorcontrib><creatorcontrib>Goss, R.</creatorcontrib><creatorcontrib>Schneiderman, H.</creatorcontrib><title>Face authentication test on the BANCA database</title><title>Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004</title><addtitle>ICPR</addtitle><description>This work details the results of a face authentication test (FAT2004) (http://www.ee.surrey.ac.uk/banca/icpr2004) held in conjunction with the 17th International Conference on Pattern Recognition. The contest was held on the publicly available BANCA database (http://www.ee.surrey.ac.uk/banca) according to a defined protocol (E. Bailly-Bailliere et al., June 2003). The competition also had a sequestered part in which institutions had to submit their algorithms for independent testing. 13 different verification algorithms from 10 institutions submitted results. Also, a standard set of face recognition software packages from the Internet (http://www.cs.colostate.edu/evalfacerec) were used to provide a baseline performance measure.</description><subject>Authentication</subject><subject>Face recognition</subject><subject>Internet</subject><subject>Measurement standards</subject><subject>Pattern recognition</subject><subject>Protocols</subject><subject>Software packages</subject><subject>Software standards</subject><subject>Testing</subject><issn>1051-4651</issn><issn>2831-7475</issn><isbn>0769521282</isbn><isbn>9780769521282</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2004</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tOwzAQRS0eEmnhAxCb_EDCzNiOnWWIKFSqaIVgXU3siRoEBTVmwd8TRFdHd3N0rlLXCCUi1LfLdvNcEoApUWvtqTpRGXmNhTPOnqoZuKq2hOTpTGUIFgtTWbxQs3F8AyDQ1meqXHCQnL_TTvZpCJyGz32eZEz5H3eS3zVPbZNHTtzxKJfqvOf3Ua6OnKvXxf1L-1is1g_LtlkVAzqbCq4mPRGjQXAuGF9DFJRq6jZgScdpet9zsAEiuj66vg6uE3HQRUNBz9XNv3cQke3XYfjgw8_2-FP_AoXHQuM</recordid><startdate>2004</startdate><enddate>2004</enddate><creator>Messer, K.</creator><creator>Kittler, J.</creator><creator>Sadeghi, M.</creator><creator>Hamouz, M.</creator><creator>Kostin, A.</creator><creator>Cardinaux, F.</creator><creator>Marcel, S.</creator><creator>Bengio, S.</creator><creator>Sanderson, C.</creator><creator>Poh, N.</creator><creator>Rodriguez, Y.</creator><creator>Czyz, J.</creator><creator>Vandendorpe, L.</creator><creator>McCool, C.</creator><creator>Lowther, S.</creator><creator>Sridharan, S.</creator><creator>Chandran, V.</creator><creator>Palacios, R.P.</creator><creator>Vidal, E.</creator><creator>Li Bai</creator><creator>LinLin Shen</creator><creator>Yan Wang</creator><creator>Chiang Yueh-Hsuan</creator><creator>Liu Hsien-Chang</creator><creator>Hung Yi-Ping</creator><creator>Heinrichs, A.</creator><creator>Muller, M.</creator><creator>Tewes, A.</creator><creator>von der Malsburg, C.</creator><creator>Wurtz, R.</creator><creator>Zhenger Wang</creator><creator>Feng Xue</creator><creator>Yong Ma</creator><creator>Qiong Yang</creator><creator>Chi Fang</creator><creator>Xiaoqing Ding</creator><creator>Lucey, S.</creator><creator>Goss, R.</creator><creator>Schneiderman, H.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2004</creationdate><title>Face authentication test on the BANCA database</title><author>Messer, K. ; Kittler, J. ; Sadeghi, M. ; Hamouz, M. ; Kostin, A. ; Cardinaux, F. ; Marcel, S. ; Bengio, S. ; Sanderson, C. ; Poh, N. ; Rodriguez, Y. ; Czyz, J. ; Vandendorpe, L. ; McCool, C. ; Lowther, S. ; Sridharan, S. ; Chandran, V. ; Palacios, R.P. ; Vidal, E. ; Li Bai ; LinLin Shen ; Yan Wang ; Chiang Yueh-Hsuan ; Liu Hsien-Chang ; Hung Yi-Ping ; Heinrichs, A. ; Muller, M. ; Tewes, A. ; von der Malsburg, C. ; Wurtz, R. ; Zhenger Wang ; Feng Xue ; Yong Ma ; Qiong Yang ; Chi Fang ; Xiaoqing Ding ; Lucey, S. ; Goss, R. ; Schneiderman, H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-a620322a141077c4890de1e611040523d0de88fac5c0d17fd7f9c7bee70bd42c3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Authentication</topic><topic>Face recognition</topic><topic>Internet</topic><topic>Measurement standards</topic><topic>Pattern recognition</topic><topic>Protocols</topic><topic>Software packages</topic><topic>Software standards</topic><topic>Testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Messer, K.</creatorcontrib><creatorcontrib>Kittler, J.</creatorcontrib><creatorcontrib>Sadeghi, M.</creatorcontrib><creatorcontrib>Hamouz, M.</creatorcontrib><creatorcontrib>Kostin, A.</creatorcontrib><creatorcontrib>Cardinaux, F.</creatorcontrib><creatorcontrib>Marcel, S.</creatorcontrib><creatorcontrib>Bengio, S.</creatorcontrib><creatorcontrib>Sanderson, C.</creatorcontrib><creatorcontrib>Poh, N.</creatorcontrib><creatorcontrib>Rodriguez, Y.</creatorcontrib><creatorcontrib>Czyz, J.</creatorcontrib><creatorcontrib>Vandendorpe, L.</creatorcontrib><creatorcontrib>McCool, C.</creatorcontrib><creatorcontrib>Lowther, S.</creatorcontrib><creatorcontrib>Sridharan, S.</creatorcontrib><creatorcontrib>Chandran, V.</creatorcontrib><creatorcontrib>Palacios, R.P.</creatorcontrib><creatorcontrib>Vidal, E.</creatorcontrib><creatorcontrib>Li Bai</creatorcontrib><creatorcontrib>LinLin Shen</creatorcontrib><creatorcontrib>Yan Wang</creatorcontrib><creatorcontrib>Chiang Yueh-Hsuan</creatorcontrib><creatorcontrib>Liu Hsien-Chang</creatorcontrib><creatorcontrib>Hung Yi-Ping</creatorcontrib><creatorcontrib>Heinrichs, A.</creatorcontrib><creatorcontrib>Muller, M.</creatorcontrib><creatorcontrib>Tewes, A.</creatorcontrib><creatorcontrib>von der Malsburg, C.</creatorcontrib><creatorcontrib>Wurtz, R.</creatorcontrib><creatorcontrib>Zhenger Wang</creatorcontrib><creatorcontrib>Feng Xue</creatorcontrib><creatorcontrib>Yong Ma</creatorcontrib><creatorcontrib>Qiong Yang</creatorcontrib><creatorcontrib>Chi Fang</creatorcontrib><creatorcontrib>Xiaoqing Ding</creatorcontrib><creatorcontrib>Lucey, S.</creatorcontrib><creatorcontrib>Goss, R.</creatorcontrib><creatorcontrib>Schneiderman, H.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Messer, K.</au><au>Kittler, J.</au><au>Sadeghi, M.</au><au>Hamouz, M.</au><au>Kostin, A.</au><au>Cardinaux, F.</au><au>Marcel, S.</au><au>Bengio, S.</au><au>Sanderson, C.</au><au>Poh, N.</au><au>Rodriguez, Y.</au><au>Czyz, J.</au><au>Vandendorpe, L.</au><au>McCool, C.</au><au>Lowther, S.</au><au>Sridharan, S.</au><au>Chandran, V.</au><au>Palacios, R.P.</au><au>Vidal, E.</au><au>Li Bai</au><au>LinLin Shen</au><au>Yan Wang</au><au>Chiang Yueh-Hsuan</au><au>Liu Hsien-Chang</au><au>Hung Yi-Ping</au><au>Heinrichs, A.</au><au>Muller, M.</au><au>Tewes, A.</au><au>von der Malsburg, C.</au><au>Wurtz, R.</au><au>Zhenger Wang</au><au>Feng Xue</au><au>Yong Ma</au><au>Qiong Yang</au><au>Chi Fang</au><au>Xiaoqing Ding</au><au>Lucey, S.</au><au>Goss, R.</au><au>Schneiderman, H.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Face authentication test on the BANCA database</atitle><btitle>Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004</btitle><stitle>ICPR</stitle><date>2004</date><risdate>2004</risdate><volume>4</volume><spage>523</spage><epage>532 Vol.4</epage><pages>523-532 Vol.4</pages><issn>1051-4651</issn><eissn>2831-7475</eissn><isbn>0769521282</isbn><isbn>9780769521282</isbn><abstract>This work details the results of a face authentication test (FAT2004) (http://www.ee.surrey.ac.uk/banca/icpr2004) held in conjunction with the 17th International Conference on Pattern Recognition. The contest was held on the publicly available BANCA database (http://www.ee.surrey.ac.uk/banca) according to a defined protocol (E. Bailly-Bailliere et al., June 2003). The competition also had a sequestered part in which institutions had to submit their algorithms for independent testing. 13 different verification algorithms from 10 institutions submitted results. Also, a standard set of face recognition software packages from the Internet (http://www.cs.colostate.edu/evalfacerec) were used to provide a baseline performance measure.</abstract><pub>IEEE</pub><doi>10.1109/ICPR.2004.1333826</doi></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1051-4651
ispartof Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004, 2004, Vol.4, p.523-532 Vol.4
issn 1051-4651
2831-7475
language eng
recordid cdi_ieee_primary_1333826
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Authentication
Face recognition
Internet
Measurement standards
Pattern recognition
Protocols
Software packages
Software standards
Testing
title Face authentication test on the BANCA database
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T20%3A05%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Face%20authentication%20test%20on%20the%20BANCA%20database&rft.btitle=Proceedings%20of%20the%2017th%20International%20Conference%20on%20Pattern%20Recognition,%202004.%20ICPR%202004&rft.au=Messer,%20K.&rft.date=2004&rft.volume=4&rft.spage=523&rft.epage=532%20Vol.4&rft.pages=523-532%20Vol.4&rft.issn=1051-4651&rft.eissn=2831-7475&rft.isbn=0769521282&rft.isbn_list=9780769521282&rft_id=info:doi/10.1109/ICPR.2004.1333826&rft_dat=%3Cieee_6IE%3E1333826%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1333826&rfr_iscdi=true