Power losses and efficiency of class-E power amplifier at any duty ratio
This paper presents an analysis of the effect of duty ratio on power loss and efficiency of the Class-E amplifier. Conduction loss for each Class-E circuit component is derived and total amplifier losses and efficiency are expressed as functions of duty ratio. Two identical 300-W Class-E amplifiers...
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| Veröffentlicht in: | IEEE transactions on circuits and systems. 1, Fundamental theory and applications Fundamental theory and applications, 2004-09, Vol.51 (9), p.1675-1689 |
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| container_end_page | 1689 |
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| container_issue | 9 |
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| container_title | IEEE transactions on circuits and systems. 1, Fundamental theory and applications |
| container_volume | 51 |
| creator | Kessler, D.J. Kazimierczuk, M.K. |
| description | This paper presents an analysis of the effect of duty ratio on power loss and efficiency of the Class-E amplifier. Conduction loss for each Class-E circuit component is derived and total amplifier losses and efficiency are expressed as functions of duty ratio. Two identical 300-W Class-E amplifiers operating at 7.29 MHz are designed, constructed, and tested in the laboratory. Dependence of total efficiency upon duty ratio when using real components is derived and verified experimentally. Derived loss and efficiency equations demonstrate rapid drop in efficiency for low duty ratio (below approximately 30%). Experimental results very closely matched calculated power loss and efficiency. |
| doi_str_mv | 10.1109/TCSI.2004.834505 |
| format | Article |
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Conduction loss for each Class-E circuit component is derived and total amplifier losses and efficiency are expressed as functions of duty ratio. Two identical 300-W Class-E amplifiers operating at 7.29 MHz are designed, constructed, and tested in the laboratory. Dependence of total efficiency upon duty ratio when using real components is derived and verified experimentally. Derived loss and efficiency equations demonstrate rapid drop in efficiency for low duty ratio (below approximately 30%). Experimental results very closely matched calculated power loss and efficiency.</description><identifier>ISSN: 1549-8328</identifier><identifier>ISSN: 1057-7122</identifier><identifier>EISSN: 1558-0806</identifier><identifier>DOI: 10.1109/TCSI.2004.834505</identifier><identifier>CODEN: ITCSCH</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Amplifiers ; Circuit testing ; Circuits ; Computational efficiency ; Computing time ; Conduction losses ; Construction ; Inductors ; Laboratories ; Mathematical analysis ; MOSFET circuits ; Paramagnetic resonance ; Parasitic capacitance ; Power amplifiers ; Power loss ; Radio frequency ; Switches ; Switching circuits</subject><ispartof>IEEE transactions on circuits and systems. 1, Fundamental theory and applications, 2004-09, Vol.51 (9), p.1675-1689</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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Experimental results very closely matched calculated power loss and efficiency.</description><subject>Amplifiers</subject><subject>Circuit testing</subject><subject>Circuits</subject><subject>Computational efficiency</subject><subject>Computing time</subject><subject>Conduction losses</subject><subject>Construction</subject><subject>Inductors</subject><subject>Laboratories</subject><subject>Mathematical analysis</subject><subject>MOSFET circuits</subject><subject>Paramagnetic resonance</subject><subject>Parasitic capacitance</subject><subject>Power amplifiers</subject><subject>Power loss</subject><subject>Radio frequency</subject><subject>Switches</subject><subject>Switching circuits</subject><issn>1549-8328</issn><issn>1057-7122</issn><issn>1558-0806</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp90c9LwzAUB_AgCs7pXfASPOip8-VXmxxlTDcYKDjPIaQJZHTtbFqk_72pFQQPnt47fN6D974IXRNYEALqYbd82ywoAF9IxgWIEzQjQsgMJOSnY89VJhmV5-gixj0AVcDIDK1fm0_X4qqJ0UVs6hI774MNrrYDbjy2lYkxW-HjNzOHYxV8GLsu4QGXfTfg1nShuURn3lTRXf3UOXp_Wu2W62z78rxZPm4zy0nRZYITK6AUFHKmqCmpK6VynDBrROmp8IwbSxKF3LPCgmJAlDTeWMlsaR2bo_tp77FtPnoXO30I0bqqMrVr-qgVkDxnBcgk7_6VVIqCc04TvP0D903f1ukKLSUThPNcJAQTsm36Veu8PrbhYNpBE9BjAnpMQI8J6CmBNHIzjQTn3C9njFFSsC8BboBD</recordid><startdate>20040901</startdate><enddate>20040901</enddate><creator>Kessler, D.J.</creator><creator>Kazimierczuk, M.K.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| ispartof | IEEE transactions on circuits and systems. 1, Fundamental theory and applications, 2004-09, Vol.51 (9), p.1675-1689 |
| issn | 1549-8328 1057-7122 1558-0806 |
| language | eng |
| recordid | cdi_ieee_primary_1333217 |
| source | IEEE Xplore |
| subjects | Amplifiers Circuit testing Circuits Computational efficiency Computing time Conduction losses Construction Inductors Laboratories Mathematical analysis MOSFET circuits Paramagnetic resonance Parasitic capacitance Power amplifiers Power loss Radio frequency Switches Switching circuits |
| title | Power losses and efficiency of class-E power amplifier at any duty ratio |
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