A method to diagnose faults in analog integrated circuits using artificial neural networks with pseudorandom noise as stimulus

This paper describes a new, fast and economical strategy for fault diagnosis of analog integrated circuits. The methodology is based on a technique of using a pseudo random noise generator as the test pattern generator and a model-based observer, which is implemented through a feed forward artificia...

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Bibliographische Detailangaben

Hauptverfasser:	Barua, L., Kabisatpathy, P., Sinha, S.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Analog integrated circuits Artificial neural networks Circuit faults Fault diagnosis Feeds Integrated circuit noise Microcomputers Noise generators Operational amplifiers Test pattern generators
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