Switching-mode dependence of inductive noise in VLSI power bus lines

The switching-mode dependence of inductive noise on the power bus lines has been investigated. As the maximum operation frequency of the very large-scale integration is determined by the slowest response in the critical path, suppression of inductive noise in power lines is crucial. Circuits with 50...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE electron device letters 2004-05, Vol.25 (5), p.302-304
Hauptverfasser: Jung-Suk Goo, Hale, S., Zamudio, L., Pelella, M.M., Klein, R., Butler, S., Judy Xilin An, Lee, M., Icel, A.B.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 304
container_issue 5
container_start_page 302
container_title IEEE electron device letters
container_volume 25
creator Jung-Suk Goo
Hale, S.
Zamudio, L.
Pelella, M.M.
Klein, R.
Butler, S.
Judy Xilin An
Lee, M.
Icel, A.B.
description The switching-mode dependence of inductive noise on the power bus lines has been investigated. As the maximum operation frequency of the very large-scale integration is determined by the slowest response in the critical path, suppression of inductive noise in power lines is crucial. Circuits with 50% duty cycle are almost free of inductive noise. Contrarily, the low duty cycle circuits are highly subject to the inductive noise thus the decoupling capacitor needs to be carefully implemented, considering the line inductance and effective frequency. The conventional "10/spl times/ of switching-capacitor" rule-of-thumb is not applicable to decoupling capacitor implementation and can cause worse inductive noise than a "no capacitor" situation.
doi_str_mv 10.1109/LED.2004.826510
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_ieee_primary_1295114</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1295114</ieee_id><sourcerecordid>28622067</sourcerecordid><originalsourceid>FETCH-LOGICAL-c349t-b594f5bcdd4ef6e50ea952c5574d0462adc8845ca513c8ca158e44b16d8697983</originalsourceid><addsrcrecordid>eNp9kMFLwzAUh4MoOKdnD16KBz11y0uTNDnKNnUw8DD1GtrkVTO2djarw__ejAqCB0-PB9_vx3sfIZdARwBUjxez6YhRykeKSQH0iAxACJVSIbNjMqA5hzQDKk_JWQgrSoHznA_IdLn3O_vu67d00zhMHG6xdlhbTJoq8bXr7M5_YlI3PmDck9fFcp5smz22SdmFZO1rDOfkpCrWAS9-5pC83M-eJ4_p4ulhPrlbpDbjepeWQvNKlNY5jpVEQbHQglkhcu4ol6xwVikubCEgs8oWIBRyXoJ0Supcq2xIbvvebdt8dBh2ZuODxfW6qLHpglFaMoCYjuTNvyRTkjEq8whe_wFXTdfW8QujGcSzQbMIjXvItk0ILVZm2_pN0X4ZoOYg30T55iDf9PJj4qpPeET8pZkWADz7BrcwfhM</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>921349192</pqid></control><display><type>article</type><title>Switching-mode dependence of inductive noise in VLSI power bus lines</title><source>IEEE Electronic Library (IEL)</source><creator>Jung-Suk Goo ; Hale, S. ; Zamudio, L. ; Pelella, M.M. ; Klein, R. ; Butler, S. ; Judy Xilin An ; Lee, M. ; Icel, A.B.</creator><creatorcontrib>Jung-Suk Goo ; Hale, S. ; Zamudio, L. ; Pelella, M.M. ; Klein, R. ; Butler, S. ; Judy Xilin An ; Lee, M. ; Icel, A.B.</creatorcontrib><description>The switching-mode dependence of inductive noise on the power bus lines has been investigated. As the maximum operation frequency of the very large-scale integration is determined by the slowest response in the critical path, suppression of inductive noise in power lines is crucial. Circuits with 50% duty cycle are almost free of inductive noise. Contrarily, the low duty cycle circuits are highly subject to the inductive noise thus the decoupling capacitor needs to be carefully implemented, considering the line inductance and effective frequency. The conventional "10/spl times/ of switching-capacitor" rule-of-thumb is not applicable to decoupling capacitor implementation and can cause worse inductive noise than a "no capacitor" situation.</description><identifier>ISSN: 0741-3106</identifier><identifier>EISSN: 1558-0563</identifier><identifier>DOI: 10.1109/LED.2004.826510</identifier><identifier>CODEN: EDLEDZ</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Buses (vehicles) ; Capacitors ; Circuit noise ; Circuits ; Decoupling ; Devices ; Frequency ; Inductance ; Large scale integration ; Noise ; Power lines ; Pulsed power supplies ; RLC circuits ; Space vector pulse width modulation ; Very large scale integration ; Voltage</subject><ispartof>IEEE electron device letters, 2004-05, Vol.25 (5), p.302-304</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2004</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c349t-b594f5bcdd4ef6e50ea952c5574d0462adc8845ca513c8ca158e44b16d8697983</citedby><cites>FETCH-LOGICAL-c349t-b594f5bcdd4ef6e50ea952c5574d0462adc8845ca513c8ca158e44b16d8697983</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1295114$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1295114$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Jung-Suk Goo</creatorcontrib><creatorcontrib>Hale, S.</creatorcontrib><creatorcontrib>Zamudio, L.</creatorcontrib><creatorcontrib>Pelella, M.M.</creatorcontrib><creatorcontrib>Klein, R.</creatorcontrib><creatorcontrib>Butler, S.</creatorcontrib><creatorcontrib>Judy Xilin An</creatorcontrib><creatorcontrib>Lee, M.</creatorcontrib><creatorcontrib>Icel, A.B.</creatorcontrib><title>Switching-mode dependence of inductive noise in VLSI power bus lines</title><title>IEEE electron device letters</title><addtitle>LED</addtitle><description>The switching-mode dependence of inductive noise on the power bus lines has been investigated. As the maximum operation frequency of the very large-scale integration is determined by the slowest response in the critical path, suppression of inductive noise in power lines is crucial. Circuits with 50% duty cycle are almost free of inductive noise. Contrarily, the low duty cycle circuits are highly subject to the inductive noise thus the decoupling capacitor needs to be carefully implemented, considering the line inductance and effective frequency. The conventional "10/spl times/ of switching-capacitor" rule-of-thumb is not applicable to decoupling capacitor implementation and can cause worse inductive noise than a "no capacitor" situation.</description><subject>Buses (vehicles)</subject><subject>Capacitors</subject><subject>Circuit noise</subject><subject>Circuits</subject><subject>Decoupling</subject><subject>Devices</subject><subject>Frequency</subject><subject>Inductance</subject><subject>Large scale integration</subject><subject>Noise</subject><subject>Power lines</subject><subject>Pulsed power supplies</subject><subject>RLC circuits</subject><subject>Space vector pulse width modulation</subject><subject>Very large scale integration</subject><subject>Voltage</subject><issn>0741-3106</issn><issn>1558-0563</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kMFLwzAUh4MoOKdnD16KBz11y0uTNDnKNnUw8DD1GtrkVTO2djarw__ejAqCB0-PB9_vx3sfIZdARwBUjxez6YhRykeKSQH0iAxACJVSIbNjMqA5hzQDKk_JWQgrSoHznA_IdLn3O_vu67d00zhMHG6xdlhbTJoq8bXr7M5_YlI3PmDck9fFcp5smz22SdmFZO1rDOfkpCrWAS9-5pC83M-eJ4_p4ulhPrlbpDbjepeWQvNKlNY5jpVEQbHQglkhcu4ol6xwVikubCEgs8oWIBRyXoJ0Supcq2xIbvvebdt8dBh2ZuODxfW6qLHpglFaMoCYjuTNvyRTkjEq8whe_wFXTdfW8QujGcSzQbMIjXvItk0ILVZm2_pN0X4ZoOYg30T55iDf9PJj4qpPeET8pZkWADz7BrcwfhM</recordid><startdate>20040501</startdate><enddate>20040501</enddate><creator>Jung-Suk Goo</creator><creator>Hale, S.</creator><creator>Zamudio, L.</creator><creator>Pelella, M.M.</creator><creator>Klein, R.</creator><creator>Butler, S.</creator><creator>Judy Xilin An</creator><creator>Lee, M.</creator><creator>Icel, A.B.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20040501</creationdate><title>Switching-mode dependence of inductive noise in VLSI power bus lines</title><author>Jung-Suk Goo ; Hale, S. ; Zamudio, L. ; Pelella, M.M. ; Klein, R. ; Butler, S. ; Judy Xilin An ; Lee, M. ; Icel, A.B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c349t-b594f5bcdd4ef6e50ea952c5574d0462adc8845ca513c8ca158e44b16d8697983</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Buses (vehicles)</topic><topic>Capacitors</topic><topic>Circuit noise</topic><topic>Circuits</topic><topic>Decoupling</topic><topic>Devices</topic><topic>Frequency</topic><topic>Inductance</topic><topic>Large scale integration</topic><topic>Noise</topic><topic>Power lines</topic><topic>Pulsed power supplies</topic><topic>RLC circuits</topic><topic>Space vector pulse width modulation</topic><topic>Very large scale integration</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jung-Suk Goo</creatorcontrib><creatorcontrib>Hale, S.</creatorcontrib><creatorcontrib>Zamudio, L.</creatorcontrib><creatorcontrib>Pelella, M.M.</creatorcontrib><creatorcontrib>Klein, R.</creatorcontrib><creatorcontrib>Butler, S.</creatorcontrib><creatorcontrib>Judy Xilin An</creatorcontrib><creatorcontrib>Lee, M.</creatorcontrib><creatorcontrib>Icel, A.B.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE electron device letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jung-Suk Goo</au><au>Hale, S.</au><au>Zamudio, L.</au><au>Pelella, M.M.</au><au>Klein, R.</au><au>Butler, S.</au><au>Judy Xilin An</au><au>Lee, M.</au><au>Icel, A.B.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Switching-mode dependence of inductive noise in VLSI power bus lines</atitle><jtitle>IEEE electron device letters</jtitle><stitle>LED</stitle><date>2004-05-01</date><risdate>2004</risdate><volume>25</volume><issue>5</issue><spage>302</spage><epage>304</epage><pages>302-304</pages><issn>0741-3106</issn><eissn>1558-0563</eissn><coden>EDLEDZ</coden><abstract>The switching-mode dependence of inductive noise on the power bus lines has been investigated. As the maximum operation frequency of the very large-scale integration is determined by the slowest response in the critical path, suppression of inductive noise in power lines is crucial. Circuits with 50% duty cycle are almost free of inductive noise. Contrarily, the low duty cycle circuits are highly subject to the inductive noise thus the decoupling capacitor needs to be carefully implemented, considering the line inductance and effective frequency. The conventional "10/spl times/ of switching-capacitor" rule-of-thumb is not applicable to decoupling capacitor implementation and can cause worse inductive noise than a "no capacitor" situation.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/LED.2004.826510</doi><tpages>3</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0741-3106
ispartof IEEE electron device letters, 2004-05, Vol.25 (5), p.302-304
issn 0741-3106
1558-0563
language eng
recordid cdi_ieee_primary_1295114
source IEEE Electronic Library (IEL)
subjects Buses (vehicles)
Capacitors
Circuit noise
Circuits
Decoupling
Devices
Frequency
Inductance
Large scale integration
Noise
Power lines
Pulsed power supplies
RLC circuits
Space vector pulse width modulation
Very large scale integration
Voltage
title Switching-mode dependence of inductive noise in VLSI power bus lines
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T19%3A34%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Switching-mode%20dependence%20of%20inductive%20noise%20in%20VLSI%20power%20bus%20lines&rft.jtitle=IEEE%20electron%20device%20letters&rft.au=Jung-Suk%20Goo&rft.date=2004-05-01&rft.volume=25&rft.issue=5&rft.spage=302&rft.epage=304&rft.pages=302-304&rft.issn=0741-3106&rft.eissn=1558-0563&rft.coden=EDLEDZ&rft_id=info:doi/10.1109/LED.2004.826510&rft_dat=%3Cproquest_RIE%3E28622067%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=921349192&rft_id=info:pmid/&rft_ieee_id=1295114&rfr_iscdi=true