Calculation of partial capacitances using a modified iterative complex image method
A method will be presented which is suitable to calculate the overall and partial capacitances of two rectangularly shaped conductors over a three-layered material. It is based on the complex image method. The solution for the determination of the necessary exponential terms used by the complex imag...
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| creator | Rehfuss, S. Gorecki, C. Peters, D. Laur, R. |
| description | A method will be presented which is suitable to calculate the overall and partial capacitances of two rectangularly shaped conductors over a three-layered material. It is based on the complex image method. The solution for the determination of the necessary exponential terms used by the complex image method is shown. The terms are calculated using an iterative approach which will be compared with a previous method. The complex images are used to calculate the partial capacitances of the desired structures. The used structure consists of a three-layered material underneath the conductors but a multi-layered material can also be modelled. The method which has to be used in the case of a multi-layered material will also be presented. |
| doi_str_mv | 10.1109/DTIP.2003.1287014 |
| format | Conference Proceeding |
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It is based on the complex image method. The solution for the determination of the necessary exponential terms used by the complex image method is shown. The terms are calculated using an iterative approach which will be compared with a previous method. The complex images are used to calculate the partial capacitances of the desired structures. The used structure consists of a three-layered material underneath the conductors but a multi-layered material can also be modelled. The method which has to be used in the case of a multi-layered material will also be presented.</description><identifier>ISBN: 078037066X</identifier><identifier>ISBN: 9780780370661</identifier><identifier>DOI: 10.1109/DTIP.2003.1287014</identifier><language>eng</language><publisher>Piscataway NJ: IEEE</publisher><subject>Applied sciences ; Capacitance ; Coils ; Communications technology ; Conducting materials ; Electronics ; Exact sciences and technology ; Inductance ; Iterative methods ; Micro- and nanoelectromechanical devices (mems/nems) ; Microelectronics ; Microstrip ; Numerical stability ; Permittivity ; Semiconductor electronics. Microelectronics. Optoelectronics. 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It is based on the complex image method. The solution for the determination of the necessary exponential terms used by the complex image method is shown. The terms are calculated using an iterative approach which will be compared with a previous method. The complex images are used to calculate the partial capacitances of the desired structures. The used structure consists of a three-layered material underneath the conductors but a multi-layered material can also be modelled. The method which has to be used in the case of a multi-layered material will also be presented.</description><subject>Applied sciences</subject><subject>Capacitance</subject><subject>Coils</subject><subject>Communications technology</subject><subject>Conducting materials</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Inductance</subject><subject>Iterative methods</subject><subject>Micro- and nanoelectromechanical devices (mems/nems)</subject><subject>Microelectronics</subject><subject>Microstrip</subject><subject>Numerical stability</subject><subject>Permittivity</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. 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Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>online_resources</toplevel><creatorcontrib>Rehfuss, S.</creatorcontrib><creatorcontrib>Gorecki, C.</creatorcontrib><creatorcontrib>Peters, D.</creatorcontrib><creatorcontrib>Laur, R.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Rehfuss, S.</au><au>Gorecki, C.</au><au>Peters, D.</au><au>Laur, R.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Calculation of partial capacitances using a modified iterative complex image method</atitle><btitle>Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS 2003</btitle><stitle>DTIP</stitle><date>2003</date><risdate>2003</risdate><spage>90</spage><epage>94</epage><pages>90-94</pages><isbn>078037066X</isbn><isbn>9780780370661</isbn><abstract>A method will be presented which is suitable to calculate the overall and partial capacitances of two rectangularly shaped conductors over a three-layered material. It is based on the complex image method. The solution for the determination of the necessary exponential terms used by the complex image method is shown. The terms are calculated using an iterative approach which will be compared with a previous method. The complex images are used to calculate the partial capacitances of the desired structures. The used structure consists of a three-layered material underneath the conductors but a multi-layered material can also be modelled. The method which has to be used in the case of a multi-layered material will also be presented.</abstract><cop>Piscataway NJ</cop><pub>IEEE</pub><doi>10.1109/DTIP.2003.1287014</doi><tpages>5</tpages></addata></record> |
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| identifier | ISBN: 078037066X |
| ispartof | Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS 2003, 2003, p.90-94 |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Applied sciences Capacitance Coils Communications technology Conducting materials Electronics Exact sciences and technology Inductance Iterative methods Micro- and nanoelectromechanical devices (mems/nems) Microelectronics Microstrip Numerical stability Permittivity Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
| title | Calculation of partial capacitances using a modified iterative complex image method |
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