Automated, accurate macromodelling of digital aggressors for power/ground/substrate noise prediction
Noise analysis and power distribution network reliability assessment is extremely important in deep sub-micron digital and mixed-signal circuit design. Both relate closely to the nonlinear loading impact of digital circuits. Consequently, accurate estimation of the latter is critical. In this paper,...
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creator | Zhe Wang Murgai, R. Roychowdhury, J. |
description | Noise analysis and power distribution network reliability assessment is extremely important in deep sub-micron digital and mixed-signal circuit design. Both relate closely to the nonlinear loading impact of digital circuits. Consequently, accurate estimation of the latter is critical. In this paper, we present extraction techniques that automatically generate a family of small, time-varying macromodels for digital cell libraries, at the time of their library characterization. Our approach is based on importing and adapting the time-varying pade (TVP) method, for linear time-varying (LTV) model reduction, from the mixed-signal macromodelling domain. Our approach features naturally higher accuracy than previous ones, and in addition, offers the user a tradeoff between accuracy and macromodel complexity. A key attraction of our approach is that it can be merged into cell library extraction methodologies to produce accurate-by-construction noise models for digital blocks. Simulations and comparisons confirming the efficacy of our approach are provided. |
doi_str_mv | 10.1109/DATE.2004.1268984 |
format | Conference Proceeding |
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Both relate closely to the nonlinear loading impact of digital circuits. Consequently, accurate estimation of the latter is critical. In this paper, we present extraction techniques that automatically generate a family of small, time-varying macromodels for digital cell libraries, at the time of their library characterization. Our approach is based on importing and adapting the time-varying pade (TVP) method, for linear time-varying (LTV) model reduction, from the mixed-signal macromodelling domain. Our approach features naturally higher accuracy than previous ones, and in addition, offers the user a tradeoff between accuracy and macromodel complexity. A key attraction of our approach is that it can be merged into cell library extraction methodologies to produce accurate-by-construction noise models for digital blocks. Simulations and comparisons confirming the efficacy of our approach are provided.</description><identifier>ISSN: 1530-1591</identifier><identifier>ISBN: 0769520855</identifier><identifier>ISBN: 9780769520858</identifier><identifier>EISSN: 1558-1101</identifier><identifier>DOI: 10.1109/DATE.2004.1268984</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuit noise ; Circuit synthesis ; Digital circuits ; Inductance ; Power supplies ; Power systems ; Software libraries ; Switches ; System-on-a-chip ; Voltage</subject><ispartof>Proceedings Design, Automation and Test in Europe Conference and Exhibition, 2004, Vol.2, p.824-829 Vol.2</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1268984$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1268984$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Zhe Wang</creatorcontrib><creatorcontrib>Murgai, R.</creatorcontrib><creatorcontrib>Roychowdhury, J.</creatorcontrib><title>Automated, accurate macromodelling of digital aggressors for power/ground/substrate noise prediction</title><title>Proceedings Design, Automation and Test in Europe Conference and Exhibition</title><addtitle>DATE</addtitle><description>Noise analysis and power distribution network reliability assessment is extremely important in deep sub-micron digital and mixed-signal circuit design. 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Simulations and comparisons confirming the efficacy of our approach are provided.</description><subject>Circuit noise</subject><subject>Circuit synthesis</subject><subject>Digital circuits</subject><subject>Inductance</subject><subject>Power supplies</subject><subject>Power systems</subject><subject>Software libraries</subject><subject>Switches</subject><subject>System-on-a-chip</subject><subject>Voltage</subject><issn>1530-1591</issn><issn>1558-1101</issn><isbn>0769520855</isbn><isbn>9780769520858</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2004</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotkMtqwzAUREUf0DTNB5Ru9AG1oytblrQMafqAQDfpOtzoYVRsK0g2pX_ftM1sZuAwsxhC7oGVAEwvn1a7TckZq0vgjdKqviAzEEIVJwqX5JbJRgvOlBBXv6BiBQgNN2SR8yc7qdI1NPWM2NU0xh5HZx8pGjOlU6Q9mhT7aF3XhaGl0VMb2jBiR7Ftk8s5pkx9TPQYv1xatilOg13m6ZDHv_4QQ3b0mJwNZgxxuCPXHrvsFmefk4_nzW79WmzfX97Wq20RQFZj4QClZNgY0WgnDSjnuTxYaRWgkZWqBfoD50I3TJsa0KIALq2RzKPnTFZz8vC_G5xz-2MKPabv_fmg6gcblVoL</recordid><startdate>2004</startdate><enddate>2004</enddate><creator>Zhe Wang</creator><creator>Murgai, R.</creator><creator>Roychowdhury, J.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2004</creationdate><title>Automated, accurate macromodelling of digital aggressors for power/ground/substrate noise prediction</title><author>Zhe Wang ; Murgai, R. ; Roychowdhury, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i173t-e1a770a6c569e7c18ef27bd7d81ac73845afb2259609c41ada5127dc70faf2073</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Circuit noise</topic><topic>Circuit synthesis</topic><topic>Digital circuits</topic><topic>Inductance</topic><topic>Power supplies</topic><topic>Power systems</topic><topic>Software libraries</topic><topic>Switches</topic><topic>System-on-a-chip</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Zhe Wang</creatorcontrib><creatorcontrib>Murgai, R.</creatorcontrib><creatorcontrib>Roychowdhury, J.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Zhe Wang</au><au>Murgai, R.</au><au>Roychowdhury, J.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Automated, accurate macromodelling of digital aggressors for power/ground/substrate noise prediction</atitle><btitle>Proceedings Design, Automation and Test in Europe Conference and Exhibition</btitle><stitle>DATE</stitle><date>2004</date><risdate>2004</risdate><volume>2</volume><spage>824</spage><epage>829 Vol.2</epage><pages>824-829 Vol.2</pages><issn>1530-1591</issn><eissn>1558-1101</eissn><isbn>0769520855</isbn><isbn>9780769520858</isbn><abstract>Noise analysis and power distribution network reliability assessment is extremely important in deep sub-micron digital and mixed-signal circuit design. Both relate closely to the nonlinear loading impact of digital circuits. Consequently, accurate estimation of the latter is critical. In this paper, we present extraction techniques that automatically generate a family of small, time-varying macromodels for digital cell libraries, at the time of their library characterization. Our approach is based on importing and adapting the time-varying pade (TVP) method, for linear time-varying (LTV) model reduction, from the mixed-signal macromodelling domain. Our approach features naturally higher accuracy than previous ones, and in addition, offers the user a tradeoff between accuracy and macromodel complexity. A key attraction of our approach is that it can be merged into cell library extraction methodologies to produce accurate-by-construction noise models for digital blocks. Simulations and comparisons confirming the efficacy of our approach are provided.</abstract><pub>IEEE</pub><doi>10.1109/DATE.2004.1268984</doi></addata></record> |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Circuit noise Circuit synthesis Digital circuits Inductance Power supplies Power systems Software libraries Switches System-on-a-chip Voltage |
title | Automated, accurate macromodelling of digital aggressors for power/ground/substrate noise prediction |
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