Experimental validation of crosstalk simulations for on-chip interconnects at high frequencies using S-parameters

Since advanced microprocessors are designed based on simulation tools, accurate assessments of the amount of crosstalk noise are of paramount importance to avoid logic failures and less-than-optimal designs. With increasing clock frequencies, inductive effects become more important, and the validity...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Kobrinsky, M.J., Chakravarty, S., Dan Jiao, Harmes, M., List, S., Mazumder, M.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Concurrent computing Conductors Crosstalk Electrical resistance measurement Frequency measurement Logic Noise measurement Scattering parameters Signal processing Testing
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