Thick film temperature sensor

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Julius, M., Sutarna, N., Hadi, P.S.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 50
container_issue
container_start_page 47
container_title
container_volume
creator Julius, M.
Sutarna, N.
Hadi, P.S.
description
doi_str_mv 10.1109/ASENSE.2003.1224991
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_1224991</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1224991</ieee_id><sourcerecordid>1224991</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-4bc42791805b71e51d9cae56a9ba53b9c751c8058d00cd20e0b26f0c8cc04f73</originalsourceid><addsrcrecordid>eNotjkFqwzAQRQWh0DTNCULAF7A7I1mWtAzBbQOhXTj7II3HVE3cBsld9PYNNH_zFg8eX4gVQoUI7mnTtW9dW0kAVaGUtXM4Ew9gLCiLgOZeLHP-hOuUa5TUc7E-fEQ6FUM8j8XE44WTn34SF5m_8nd6FHeDP2de3rgQ3XN72L6W-_eX3XazL6ODqawD1dI4tKCDQdbYO_KsG--C1yo4MhrpKm0PQL0EhiCbAcgSQT0YtRCr_2pk5uMlxdGn3-Ptv_oDLmQ6vA</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Thick film temperature sensor</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Julius, M. ; Sutarna, N. ; Hadi, P.S.</creator><creatorcontrib>Julius, M. ; Sutarna, N. ; Hadi, P.S.</creatorcontrib><identifier>ISBN: 0780381017</identifier><identifier>ISBN: 9780780381018</identifier><identifier>DOI: 10.1109/ASENSE.2003.1224991</identifier><language>eng</language><publisher>IEEE</publisher><subject>Atmosphere ; Atmospheric measurements ; Conductors ; Electrical resistance measurement ; Equations ; Palladium ; Substrates ; Temperature measurement ; Temperature sensors ; Thick films</subject><ispartof>Asian Conference on Sensors, 2003. AsiaSense 2003, 2003, p.47-50</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1224991$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1224991$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Julius, M.</creatorcontrib><creatorcontrib>Sutarna, N.</creatorcontrib><creatorcontrib>Hadi, P.S.</creatorcontrib><title>Thick film temperature sensor</title><title>Asian Conference on Sensors, 2003. AsiaSense 2003</title><addtitle>ASENSE</addtitle><subject>Atmosphere</subject><subject>Atmospheric measurements</subject><subject>Conductors</subject><subject>Electrical resistance measurement</subject><subject>Equations</subject><subject>Palladium</subject><subject>Substrates</subject><subject>Temperature measurement</subject><subject>Temperature sensors</subject><subject>Thick films</subject><isbn>0780381017</isbn><isbn>9780780381018</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2003</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotjkFqwzAQRQWh0DTNCULAF7A7I1mWtAzBbQOhXTj7II3HVE3cBsld9PYNNH_zFg8eX4gVQoUI7mnTtW9dW0kAVaGUtXM4Ew9gLCiLgOZeLHP-hOuUa5TUc7E-fEQ6FUM8j8XE44WTn34SF5m_8nd6FHeDP2de3rgQ3XN72L6W-_eX3XazL6ODqawD1dI4tKCDQdbYO_KsG--C1yo4MhrpKm0PQL0EhiCbAcgSQT0YtRCr_2pk5uMlxdGn3-Ptv_oDLmQ6vA</recordid><startdate>2003</startdate><enddate>2003</enddate><creator>Julius, M.</creator><creator>Sutarna, N.</creator><creator>Hadi, P.S.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2003</creationdate><title>Thick film temperature sensor</title><author>Julius, M. ; Sutarna, N. ; Hadi, P.S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-4bc42791805b71e51d9cae56a9ba53b9c751c8058d00cd20e0b26f0c8cc04f73</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Atmosphere</topic><topic>Atmospheric measurements</topic><topic>Conductors</topic><topic>Electrical resistance measurement</topic><topic>Equations</topic><topic>Palladium</topic><topic>Substrates</topic><topic>Temperature measurement</topic><topic>Temperature sensors</topic><topic>Thick films</topic><toplevel>online_resources</toplevel><creatorcontrib>Julius, M.</creatorcontrib><creatorcontrib>Sutarna, N.</creatorcontrib><creatorcontrib>Hadi, P.S.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Julius, M.</au><au>Sutarna, N.</au><au>Hadi, P.S.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Thick film temperature sensor</atitle><btitle>Asian Conference on Sensors, 2003. AsiaSense 2003</btitle><stitle>ASENSE</stitle><date>2003</date><risdate>2003</risdate><spage>47</spage><epage>50</epage><pages>47-50</pages><isbn>0780381017</isbn><isbn>9780780381018</isbn><pub>IEEE</pub><doi>10.1109/ASENSE.2003.1224991</doi><tpages>4</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISBN: 0780381017
ispartof Asian Conference on Sensors, 2003. AsiaSense 2003, 2003, p.47-50
issn
language eng
recordid cdi_ieee_primary_1224991
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Atmosphere
Atmospheric measurements
Conductors
Electrical resistance measurement
Equations
Palladium
Substrates
Temperature measurement
Temperature sensors
Thick films
title Thick film temperature sensor
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T22%3A10%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Thick%20film%20temperature%20sensor&rft.btitle=Asian%20Conference%20on%20Sensors,%202003.%20AsiaSense%202003&rft.au=Julius,%20M.&rft.date=2003&rft.spage=47&rft.epage=50&rft.pages=47-50&rft.isbn=0780381017&rft.isbn_list=9780780381018&rft_id=info:doi/10.1109/ASENSE.2003.1224991&rft_dat=%3Cieee_6IE%3E1224991%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1224991&rfr_iscdi=true