Exploring new analog test methods with Eagle Tester (test vehicle: OVIC)
This report details the development on Analog IC devices, the OVIC (Over Voltage Protection IC) on the Eagle Test System (ETS) tester platform. New test interface design and setup were evaluated. These setups were considered with the in-house test handler platform in mind. The setups were mainly con...
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| creator | Lim Wee Teck |
| description | This report details the development on Analog IC devices, the OVIC (Over Voltage Protection IC) on the Eagle Test System (ETS) tester platform. New test interface design and setup were evaluated. These setups were considered with the in-house test handler platform in mind. The setups were mainly constrained by physical space constrains. The effects of cable length on DUT performance and floating versus grounded DUT were also evaluated. This development was primarily motivated by test accuracy, efficiency and effectiveness on the ETS. The output response of the experiment were voltage, current and timing. Results indicate that with short test cable and grounded DUT, very repeatable readings could be achieved. Longer test cables or a floating DUT setup would require proper characterisation of the test setup if any of these is to be implemented. |
| doi_str_mv | 10.1109/SMELEC.2002.1217854 |
| format | Conference Proceeding |
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New test interface design and setup were evaluated. These setups were considered with the in-house test handler platform in mind. The setups were mainly constrained by physical space constrains. The effects of cable length on DUT performance and floating versus grounded DUT were also evaluated. This development was primarily motivated by test accuracy, efficiency and effectiveness on the ETS. The output response of the experiment were voltage, current and timing. Results indicate that with short test cable and grounded DUT, very repeatable readings could be achieved. Longer test cables or a floating DUT setup would require proper characterisation of the test setup if any of these is to be implemented.</description><identifier>ISBN: 9780780375789</identifier><identifier>ISBN: 0780375785</identifier><identifier>DOI: 10.1109/SMELEC.2002.1217854</identifier><language>eng</language><publisher>IEEE</publisher><subject>Analog integrated circuits ; Assembly systems ; Circuit testing ; Costs ; Integrated circuit testing ; Packaging ; Semiconductor device testing ; System testing ; Vehicles ; Voltage</subject><ispartof>ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. 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Longer test cables or a floating DUT setup would require proper characterisation of the test setup if any of these is to be implemented.</description><subject>Analog integrated circuits</subject><subject>Assembly systems</subject><subject>Circuit testing</subject><subject>Costs</subject><subject>Integrated circuit testing</subject><subject>Packaging</subject><subject>Semiconductor device testing</subject><subject>System testing</subject><subject>Vehicles</subject><subject>Voltage</subject><isbn>9780780375789</isbn><isbn>0780375785</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2002</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj01Lw0AYhBdEUGp-QS971EPivvuR3fUmIdpCpAer17LpvklW0qQkweq_b9AOAwPPwMAQsgSWADD7-P6WF3mWcMZ4Ahy0UfKKRFYbNltopY29IdE4frFZwiot-S1Z5T_Hth9CV9MOT9R1ru1rOuE40QNOTe9HegpTQ3NXt0i3M8eB3v_139iEfYtPdPO5zh7uyHXl2hGjSy7Ix0u-zVZxsXldZ89FHECrKbbepxXXyjslNaRMpsyydG_AGFtZAJRWSylUWdqKiTL1Hlyp0TilJHfoxYIs_3cDIu6OQzi44Xd3-SvOEeNKMQ</recordid><startdate>2002</startdate><enddate>2002</enddate><creator>Lim Wee Teck</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2002</creationdate><title>Exploring new analog test methods with Eagle Tester (test vehicle: OVIC)</title><author>Lim Wee Teck</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-9dd6f275da547160460906c81889f911e4974435bb9f03b6dd1ab7e8a5542aed3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Analog integrated circuits</topic><topic>Assembly systems</topic><topic>Circuit testing</topic><topic>Costs</topic><topic>Integrated circuit testing</topic><topic>Packaging</topic><topic>Semiconductor device testing</topic><topic>System testing</topic><topic>Vehicles</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Lim Wee Teck</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lim Wee Teck</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Exploring new analog test methods with Eagle Tester (test vehicle: OVIC)</atitle><btitle>ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575)</btitle><stitle>SMELEC</stitle><date>2002</date><risdate>2002</risdate><spage>409</spage><epage>414</epage><pages>409-414</pages><isbn>9780780375789</isbn><isbn>0780375785</isbn><abstract>This report details the development on Analog IC devices, the OVIC (Over Voltage Protection IC) on the Eagle Test System (ETS) tester platform. New test interface design and setup were evaluated. These setups were considered with the in-house test handler platform in mind. The setups were mainly constrained by physical space constrains. The effects of cable length on DUT performance and floating versus grounded DUT were also evaluated. This development was primarily motivated by test accuracy, efficiency and effectiveness on the ETS. The output response of the experiment were voltage, current and timing. Results indicate that with short test cable and grounded DUT, very repeatable readings could be achieved. Longer test cables or a floating DUT setup would require proper characterisation of the test setup if any of these is to be implemented.</abstract><pub>IEEE</pub><doi>10.1109/SMELEC.2002.1217854</doi><tpages>6</tpages></addata></record> |
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| ispartof | ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575), 2002, p.409-414 |
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| language | eng |
| recordid | cdi_ieee_primary_1217854 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Analog integrated circuits Assembly systems Circuit testing Costs Integrated circuit testing Packaging Semiconductor device testing System testing Vehicles Voltage |
| title | Exploring new analog test methods with Eagle Tester (test vehicle: OVIC) |
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