Performance comparison between six-port and five-port reflectometer
This paper presents a feasibility study for replacing six-port reflectometers by five-port reflectometers for vector measurements in microwave frequency bands. A new calibration technique is proposed for calibrating the five-port reflectometer. This procedure requires only a short circuit as a stand...
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| creator | Chahine, S.A. Huyart, B. Osman, Z. |
| description | This paper presents a feasibility study for replacing six-port reflectometers by five-port reflectometers for vector measurements in microwave frequency bands. A new calibration technique is proposed for calibrating the five-port reflectometer. This procedure requires only a short circuit as a standard. The comparison of the practical results obtained by the five-port system with those measured by six-port reflectometers proves its efficiency. |
| doi_str_mv | 10.1109/NRSC.2003.157316 |
| format | Conference Proceeding |
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A new calibration technique is proposed for calibrating the five-port reflectometer. This procedure requires only a short circuit as a standard. The comparison of the practical results obtained by the five-port system with those measured by six-port reflectometers proves its efficiency.</description><identifier>ISBN: 9775031753</identifier><identifier>ISBN: 9789775031754</identifier><identifier>DOI: 10.1109/NRSC.2003.157316</identifier><language>eng</language><publisher>IEEE</publisher><subject>Attenuation measurement ; Calibration ; Circuits ; Detectors ; Power measurement ; Radar detection ; Reflection ; Schottky diodes ; Telecommunications ; Voltage</subject><ispartof>Proceedings of the Twentieth National Radio Science Conference (NRSC'2003) (IEEE Cat. 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The comparison of the practical results obtained by the five-port system with those measured by six-port reflectometers proves its efficiency.</description><subject>Attenuation measurement</subject><subject>Calibration</subject><subject>Circuits</subject><subject>Detectors</subject><subject>Power measurement</subject><subject>Radar detection</subject><subject>Reflection</subject><subject>Schottky diodes</subject><subject>Telecommunications</subject><subject>Voltage</subject><isbn>9775031753</isbn><isbn>9789775031754</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2003</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotjktLxDAUhQMiqOPsBTf5A625vUlvspTiCwYVnf2QSW8hMm1KWnz8ewszZ3M4m-98QtyAKgGUu3v9-GzKSikswRBCfSauHJFRCGTwQqyn6Ust0Qastpeieefcpdz7IbAMqR99jlMa5J7nH-ZBTvG3GFOepR9a2cVvPq7M3YHDnHqeOV-L884fJl6feiW2jw_b5rnYvD29NPebIjo1F153LaG1rJf72jnnSRFWSNwqw0EvlrVuUWsi3JMHVLRIOhvqyjIFhytxe8RGZt6NOfY-_-2ggoUC-A-Q-kd3</recordid><startdate>2003</startdate><enddate>2003</enddate><creator>Chahine, S.A.</creator><creator>Huyart, B.</creator><creator>Osman, Z.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2003</creationdate><title>Performance comparison between six-port and five-port reflectometer</title><author>Chahine, S.A. ; Huyart, B. ; Osman, Z.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-a4fd7388e40006999a7073237ed05ec497764d344773b7a130745198c628e7c93</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Attenuation measurement</topic><topic>Calibration</topic><topic>Circuits</topic><topic>Detectors</topic><topic>Power measurement</topic><topic>Radar detection</topic><topic>Reflection</topic><topic>Schottky diodes</topic><topic>Telecommunications</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Chahine, S.A.</creatorcontrib><creatorcontrib>Huyart, B.</creatorcontrib><creatorcontrib>Osman, Z.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chahine, S.A.</au><au>Huyart, B.</au><au>Osman, Z.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Performance comparison between six-port and five-port reflectometer</atitle><btitle>Proceedings of the Twentieth National Radio Science Conference (NRSC'2003) (IEEE Cat. No.03EX665)</btitle><stitle>NRSC</stitle><date>2003</date><risdate>2003</risdate><spage>B9</spage><epage>1</epage><pages>B9-1</pages><isbn>9775031753</isbn><isbn>9789775031754</isbn><abstract>This paper presents a feasibility study for replacing six-port reflectometers by five-port reflectometers for vector measurements in microwave frequency bands. A new calibration technique is proposed for calibrating the five-port reflectometer. This procedure requires only a short circuit as a standard. The comparison of the practical results obtained by the five-port system with those measured by six-port reflectometers proves its efficiency.</abstract><pub>IEEE</pub><doi>10.1109/NRSC.2003.157316</doi></addata></record> |
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| identifier | ISBN: 9775031753 |
| ispartof | Proceedings of the Twentieth National Radio Science Conference (NRSC'2003) (IEEE Cat. No.03EX665), 2003, p.B9-1 |
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| language | eng |
| recordid | cdi_ieee_primary_1217321 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Attenuation measurement Calibration Circuits Detectors Power measurement Radar detection Reflection Schottky diodes Telecommunications Voltage |
| title | Performance comparison between six-port and five-port reflectometer |
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