An inverse technique to evaluate thickness and permittivity using reflection of plane wave from inhomogeneous dielectrics

This paper presents an easy to use method to estimate the thickness and permittivity of layered dielectrics. The reflection spectrum of plane electromagnetic wave incident upon multiple layers of dielectrics is analysed to determine the thickness and dielectric constant of one of the layers in a mul...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Thakur, K.P., Holmes, W.S., Carter, G.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Delamination Dielectric measurements Electromagnetic measurements Electromagnetic reflection Electromagnetic scattering Equations Fresnel reflection Optical reflection Permittivity Polarization
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