Thermal crosstalk in a group of pyroelectric sensitive elements for thermal imaging
Temperature distributions under periodical thermal excitation and the response of the thermal imaging device, composed of the group of pyroelectric sensitive elements mounted on a single silicon substrate, are presented. The sensitive element consists of a covering metal layer, infrared polymer abso...
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Veröffentlicht in: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control ferroelectrics, and frequency control, 2003-06, Vol.50 (6), p.720-723 |
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container_title | IEEE transactions on ultrasonics, ferroelectrics, and frequency control |
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creator | Yung Sup Yoon Samoilov, V.B. Kletsky, S.V. |
description | Temperature distributions under periodical thermal excitation and the response of the thermal imaging device, composed of the group of pyroelectric sensitive elements mounted on a single silicon substrate, are presented. The sensitive element consists of a covering metal layer, infrared polymer absorber, front metal contact, sensitive pyroelectric element, the interconnecting column, and the bulk silicon readout. The results of numerical modeling show that the thermal crosstalk between sensitive elements to be critical especially at low frequency (f |
doi_str_mv | 10.1109/TUFFC.2003.1209561 |
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The sensitive element consists of a covering metal layer, infrared polymer absorber, front metal contact, sensitive pyroelectric element, the interconnecting column, and the bulk silicon readout. The results of numerical modeling show that the thermal crosstalk between sensitive elements to be critical especially at low frequency (f<10 Hz) of periodically modulated light.</description><identifier>ISSN: 0885-3010</identifier><identifier>EISSN: 1525-8955</identifier><identifier>DOI: 10.1109/TUFFC.2003.1209561</identifier><identifier>PMID: 12839185</identifier><identifier>CODEN: ITUCER</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Contact ; Crosstalk ; Exact sciences and technology ; Ferroelectric materials ; Frequency ; Infrared ; Infrared detectors ; Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Low frequencies ; Numerical models ; Optical modulation ; Physics ; Polymers ; Pyroelectricity ; Sensor arrays ; Silicon ; Silicon substrates ; Thermal imaging</subject><ispartof>IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2003-06, Vol.50 (6), p.720-723</ispartof><rights>2003 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2003</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c440t-a8901fb042a3acf1c04b56e9ffd242fcc8a4ef5e8b3ca7bf3660e0059cf9f6bd3</citedby><cites>FETCH-LOGICAL-c440t-a8901fb042a3acf1c04b56e9ffd242fcc8a4ef5e8b3ca7bf3660e0059cf9f6bd3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1209561$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1209561$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=14873060$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/12839185$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Yung Sup Yoon</creatorcontrib><creatorcontrib>Samoilov, V.B.</creatorcontrib><creatorcontrib>Kletsky, S.V.</creatorcontrib><title>Thermal crosstalk in a group of pyroelectric sensitive elements for thermal imaging</title><title>IEEE transactions on ultrasonics, ferroelectrics, and frequency control</title><addtitle>T-UFFC</addtitle><addtitle>IEEE Trans Ultrason Ferroelectr Freq Control</addtitle><description>Temperature distributions under periodical thermal excitation and the response of the thermal imaging device, composed of the group of pyroelectric sensitive elements mounted on a single silicon substrate, are presented. The sensitive element consists of a covering metal layer, infrared polymer absorber, front metal contact, sensitive pyroelectric element, the interconnecting column, and the bulk silicon readout. The results of numerical modeling show that the thermal crosstalk between sensitive elements to be critical especially at low frequency (f<10 Hz) of periodically modulated light.</description><subject>Contact</subject><subject>Crosstalk</subject><subject>Exact sciences and technology</subject><subject>Ferroelectric materials</subject><subject>Frequency</subject><subject>Infrared</subject><subject>Infrared detectors</subject><subject>Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Low frequencies</subject><subject>Numerical models</subject><subject>Optical modulation</subject><subject>Physics</subject><subject>Polymers</subject><subject>Pyroelectricity</subject><subject>Sensor arrays</subject><subject>Silicon</subject><subject>Silicon substrates</subject><subject>Thermal imaging</subject><issn>0885-3010</issn><issn>1525-8955</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqFkU1rFEEQhhtRzJr4BxSkEZRcZq3-3O5jWFwNBDxkc256eqvXifOxds8I-ff2ZgciHvRUUDz1FlUPIW8YLBkD-2l7t9mslxxALBkHqzR7RhZMcVUZq9RzsgBjVCWAwRl5lfM9AJPS8pfkjHEjLDNqQW633zF1vqUhDTmPvv1Bm556uk_DdKBDpIeHNGCLYUxNoBn73IzNL6Sl1WE_ZhqHRMc5o-n8vun3F-RF9G3G13M9J3ebz9v11-rm25fr9dVNFaSEsfLGAos1SO6FD5EFkLXSaGPcccljCMZLjApNLYJf1VFoDQigbIg26nonzsnHU-4hDT8nzKPrmhywbX2Pw5TdSkiurYT_gtxoKZWyBbz8J8j0ignDJGMFff8Xej9MqS_3OmMkV0KALhA_QY_fTRjdIZUnpQfHwB0dukeH7ujQzQ7L0Ls5eao73D2NzNIK8GEGfA6-jcn3oclPnDSrsvx49tsT1yDiHzGnNb8BxI2tUw</recordid><startdate>20030601</startdate><enddate>20030601</enddate><creator>Yung Sup Yoon</creator><creator>Samoilov, V.B.</creator><creator>Kletsky, S.V.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope><scope>7X8</scope></search><sort><creationdate>20030601</creationdate><title>Thermal crosstalk in a group of pyroelectric sensitive elements for thermal imaging</title><author>Yung Sup Yoon ; Samoilov, V.B. ; Kletsky, S.V.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c440t-a8901fb042a3acf1c04b56e9ffd242fcc8a4ef5e8b3ca7bf3660e0059cf9f6bd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Contact</topic><topic>Crosstalk</topic><topic>Exact sciences and technology</topic><topic>Ferroelectric materials</topic><topic>Frequency</topic><topic>Infrared</topic><topic>Infrared detectors</topic><topic>Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Low frequencies</topic><topic>Numerical models</topic><topic>Optical modulation</topic><topic>Physics</topic><topic>Polymers</topic><topic>Pyroelectricity</topic><topic>Sensor arrays</topic><topic>Silicon</topic><topic>Silicon substrates</topic><topic>Thermal imaging</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yung Sup Yoon</creatorcontrib><creatorcontrib>Samoilov, V.B.</creatorcontrib><creatorcontrib>Kletsky, S.V.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>IEEE transactions on ultrasonics, ferroelectrics, and frequency control</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Yung Sup Yoon</au><au>Samoilov, V.B.</au><au>Kletsky, S.V.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Thermal crosstalk in a group of pyroelectric sensitive elements for thermal imaging</atitle><jtitle>IEEE transactions on ultrasonics, ferroelectrics, and frequency control</jtitle><stitle>T-UFFC</stitle><addtitle>IEEE Trans Ultrason Ferroelectr Freq Control</addtitle><date>2003-06-01</date><risdate>2003</risdate><volume>50</volume><issue>6</issue><spage>720</spage><epage>723</epage><pages>720-723</pages><issn>0885-3010</issn><eissn>1525-8955</eissn><coden>ITUCER</coden><abstract>Temperature distributions under periodical thermal excitation and the response of the thermal imaging device, composed of the group of pyroelectric sensitive elements mounted on a single silicon substrate, are presented. The sensitive element consists of a covering metal layer, infrared polymer absorber, front metal contact, sensitive pyroelectric element, the interconnecting column, and the bulk silicon readout. The results of numerical modeling show that the thermal crosstalk between sensitive elements to be critical especially at low frequency (f<10 Hz) of periodically modulated light.</abstract><cop>New York, NY</cop><pub>IEEE</pub><pmid>12839185</pmid><doi>10.1109/TUFFC.2003.1209561</doi><tpages>4</tpages></addata></record> |
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subjects | Contact Crosstalk Exact sciences and technology Ferroelectric materials Frequency Infrared Infrared detectors Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques Instruments, apparatus, components and techniques common to several branches of physics and astronomy Low frequencies Numerical models Optical modulation Physics Polymers Pyroelectricity Sensor arrays Silicon Silicon substrates Thermal imaging |
title | Thermal crosstalk in a group of pyroelectric sensitive elements for thermal imaging |
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