Metal reflectivity investigation at 110-200 GHz
Reflectivity investigations were directed at high reflection metals like silver, copper, gold and aluminium to get mirrors with minimum possible reflection losses and on real metals and alloys which are widely used in high power electronics like stainless steel, titanium, brass and so on. The mm-wav...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng ; rus |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 539 |
|---|---|
| container_issue | |
| container_start_page | 538 |
| container_title | |
| container_volume | |
| creator | Myasnikova, S.E. Bogdashov, A.A. Parshin, V.V. Rodin, Yu.V. |
| description | Reflectivity investigations were directed at high reflection metals like silver, copper, gold and aluminium to get mirrors with minimum possible reflection losses and on real metals and alloys which are widely used in high power electronics like stainless steel, titanium, brass and so on. The mm-wave range is a specific range because just in this range the skin-layer of metals may be higher as well as lower than the value of roughness for the main types of mechanical treatment. So it is expected that there must be a strong dependence of the reflection losses versus the roughness. This was confirmed by the experimental results. |
| doi_str_mv | 10.1109/CRMICO.2002.1137345 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_1137345</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1137345</ieee_id><sourcerecordid>1137345</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-5d3db877439f6b0a9887d3a930b33bcac49ddd89f4dfdd5d95c3cbbe6ae662443</originalsourceid><addsrcrecordid>eNotj8tqAjEYRgOlYLHzBG7yAqPJ_Ln9yzK0KiiCtGvJVVKmtswEwT59A3X1wVmcw0fIgrMl5wxX_XG_7Q_LjrGuAtAg5ANpUBtUSqMyvGMz0kzTJ2OMV2aMfiKrfSx2oGNMQ_QlX3O50Xy5xqnksy35-0JtoVXfVi1db36fyWOywxSb-87Jx9vre79pd4f1tn_ZtZlrWVoZIDijtQBMyjGLNRbAIjAH4Lz1AkMIBpMIKQQZUHrwzkVlo1KdEDAni39vjjGefsb8Zcfb6X4L_gAfkkIz</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Metal reflectivity investigation at 110-200 GHz</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Myasnikova, S.E. ; Bogdashov, A.A. ; Parshin, V.V. ; Rodin, Yu.V.</creator><creatorcontrib>Myasnikova, S.E. ; Bogdashov, A.A. ; Parshin, V.V. ; Rodin, Yu.V.</creatorcontrib><description>Reflectivity investigations were directed at high reflection metals like silver, copper, gold and aluminium to get mirrors with minimum possible reflection losses and on real metals and alloys which are widely used in high power electronics like stainless steel, titanium, brass and so on. The mm-wave range is a specific range because just in this range the skin-layer of metals may be higher as well as lower than the value of roughness for the main types of mechanical treatment. So it is expected that there must be a strong dependence of the reflection losses versus the roughness. This was confirmed by the experimental results.</description><identifier>ISBN: 9789667968120</identifier><identifier>ISBN: 966796812X</identifier><identifier>DOI: 10.1109/CRMICO.2002.1137345</identifier><language>eng ; rus</language><publisher>IEEE</publisher><subject>Aluminum alloys ; Copper alloys ; Gold alloys ; Iron alloys ; Mirrors ; Power electronics ; Reflection ; Reflectivity ; Silver ; Titanium alloys</subject><ispartof>12th International Conference Microwave and Telecommunication Technology, 2002, p.538-539</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1137345$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1137345$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Myasnikova, S.E.</creatorcontrib><creatorcontrib>Bogdashov, A.A.</creatorcontrib><creatorcontrib>Parshin, V.V.</creatorcontrib><creatorcontrib>Rodin, Yu.V.</creatorcontrib><title>Metal reflectivity investigation at 110-200 GHz</title><title>12th International Conference Microwave and Telecommunication Technology</title><addtitle>CRMICO</addtitle><description>Reflectivity investigations were directed at high reflection metals like silver, copper, gold and aluminium to get mirrors with minimum possible reflection losses and on real metals and alloys which are widely used in high power electronics like stainless steel, titanium, brass and so on. The mm-wave range is a specific range because just in this range the skin-layer of metals may be higher as well as lower than the value of roughness for the main types of mechanical treatment. So it is expected that there must be a strong dependence of the reflection losses versus the roughness. This was confirmed by the experimental results.</description><subject>Aluminum alloys</subject><subject>Copper alloys</subject><subject>Gold alloys</subject><subject>Iron alloys</subject><subject>Mirrors</subject><subject>Power electronics</subject><subject>Reflection</subject><subject>Reflectivity</subject><subject>Silver</subject><subject>Titanium alloys</subject><isbn>9789667968120</isbn><isbn>966796812X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2002</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tqAjEYRgOlYLHzBG7yAqPJ_Ln9yzK0KiiCtGvJVVKmtswEwT59A3X1wVmcw0fIgrMl5wxX_XG_7Q_LjrGuAtAg5ANpUBtUSqMyvGMz0kzTJ2OMV2aMfiKrfSx2oGNMQ_QlX3O50Xy5xqnksy35-0JtoVXfVi1db36fyWOywxSb-87Jx9vre79pd4f1tn_ZtZlrWVoZIDijtQBMyjGLNRbAIjAH4Lz1AkMIBpMIKQQZUHrwzkVlo1KdEDAni39vjjGefsb8Zcfb6X4L_gAfkkIz</recordid><startdate>2002</startdate><enddate>2002</enddate><creator>Myasnikova, S.E.</creator><creator>Bogdashov, A.A.</creator><creator>Parshin, V.V.</creator><creator>Rodin, Yu.V.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2002</creationdate><title>Metal reflectivity investigation at 110-200 GHz</title><author>Myasnikova, S.E. ; Bogdashov, A.A. ; Parshin, V.V. ; Rodin, Yu.V.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-5d3db877439f6b0a9887d3a930b33bcac49ddd89f4dfdd5d95c3cbbe6ae662443</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng ; rus</language><creationdate>2002</creationdate><topic>Aluminum alloys</topic><topic>Copper alloys</topic><topic>Gold alloys</topic><topic>Iron alloys</topic><topic>Mirrors</topic><topic>Power electronics</topic><topic>Reflection</topic><topic>Reflectivity</topic><topic>Silver</topic><topic>Titanium alloys</topic><toplevel>online_resources</toplevel><creatorcontrib>Myasnikova, S.E.</creatorcontrib><creatorcontrib>Bogdashov, A.A.</creatorcontrib><creatorcontrib>Parshin, V.V.</creatorcontrib><creatorcontrib>Rodin, Yu.V.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Myasnikova, S.E.</au><au>Bogdashov, A.A.</au><au>Parshin, V.V.</au><au>Rodin, Yu.V.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Metal reflectivity investigation at 110-200 GHz</atitle><btitle>12th International Conference Microwave and Telecommunication Technology</btitle><stitle>CRMICO</stitle><date>2002</date><risdate>2002</risdate><spage>538</spage><epage>539</epage><pages>538-539</pages><isbn>9789667968120</isbn><isbn>966796812X</isbn><abstract>Reflectivity investigations were directed at high reflection metals like silver, copper, gold and aluminium to get mirrors with minimum possible reflection losses and on real metals and alloys which are widely used in high power electronics like stainless steel, titanium, brass and so on. The mm-wave range is a specific range because just in this range the skin-layer of metals may be higher as well as lower than the value of roughness for the main types of mechanical treatment. So it is expected that there must be a strong dependence of the reflection losses versus the roughness. This was confirmed by the experimental results.</abstract><pub>IEEE</pub><doi>10.1109/CRMICO.2002.1137345</doi><tpages>2</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISBN: 9789667968120 |
| ispartof | 12th International Conference Microwave and Telecommunication Technology, 2002, p.538-539 |
| issn | |
| language | eng ; rus |
| recordid | cdi_ieee_primary_1137345 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Aluminum alloys Copper alloys Gold alloys Iron alloys Mirrors Power electronics Reflection Reflectivity Silver Titanium alloys |
| title | Metal reflectivity investigation at 110-200 GHz |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-06T05%3A34%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Metal%20reflectivity%20investigation%20at%20110-200%20GHz&rft.btitle=12th%20International%20Conference%20Microwave%20and%20Telecommunication%20Technology&rft.au=Myasnikova,%20S.E.&rft.date=2002&rft.spage=538&rft.epage=539&rft.pages=538-539&rft.isbn=9789667968120&rft.isbn_list=966796812X&rft_id=info:doi/10.1109/CRMICO.2002.1137345&rft_dat=%3Cieee_6IE%3E1137345%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1137345&rfr_iscdi=true |