The new methods automated photoelectric spectral analysis with use the standard samples and virtual standards
The essential deficiency of traditional methods of spectral analysis, founded on building of calibration graphs on kits for state standard samples (SSS), is the impossibility of the determination of inaccuracy and validity obtained separately results when undertaking current production analyses. As...
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| creator | Veshkurtsev, J.M. Odinets, A.I. Altyntsev, M.P. |
| description | The essential deficiency of traditional methods of spectral analysis, founded on building of calibration graphs on kits for state standard samples (SSS), is the impossibility of the determination of inaccuracy and validity obtained separately results when undertaking current production analyses. As a rule, the degree of accuracy of spectral methods is realized only for industrial laboratories. Herewith the main attention is paid to the definition of accuracy and convergence of results for existing types of material by way of frequent repetitions of cycles from ten and more measurements. |
| doi_str_mv | 10.1109/APEIE.2002.1075802 |
| format | Conference Proceeding |
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As a rule, the degree of accuracy of spectral methods is realized only for industrial laboratories. Herewith the main attention is paid to the definition of accuracy and convergence of results for existing types of material by way of frequent repetitions of cycles from ten and more measurements.</description><identifier>ISBN: 9780780373617</identifier><identifier>ISBN: 0780373618</identifier><identifier>DOI: 10.1109/APEIE.2002.1075802</identifier><language>eng</language><publisher>IEEE</publisher><subject>Calibration ; Convergence ; Graphics ; Laboratories ; Performance evaluation ; Production ; Qualifications ; Spectral analysis ; Standards development ; Voltage</subject><ispartof>Proceedings, 6th International Conference on Actual Problems of Electronic Instrument Engineering, 2002, p.112-115</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1075802$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1075802$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Veshkurtsev, J.M.</creatorcontrib><creatorcontrib>Odinets, A.I.</creatorcontrib><creatorcontrib>Altyntsev, M.P.</creatorcontrib><title>The new methods automated photoelectric spectral analysis with use the standard samples and virtual standards</title><title>Proceedings, 6th International Conference on Actual Problems of Electronic Instrument Engineering</title><addtitle>APEIE</addtitle><description>The essential deficiency of traditional methods of spectral analysis, founded on building of calibration graphs on kits for state standard samples (SSS), is the impossibility of the determination of inaccuracy and validity obtained separately results when undertaking current production analyses. As a rule, the degree of accuracy of spectral methods is realized only for industrial laboratories. Herewith the main attention is paid to the definition of accuracy and convergence of results for existing types of material by way of frequent repetitions of cycles from ten and more measurements.</description><subject>Calibration</subject><subject>Convergence</subject><subject>Graphics</subject><subject>Laboratories</subject><subject>Performance evaluation</subject><subject>Production</subject><subject>Qualifications</subject><subject>Spectral analysis</subject><subject>Standards development</subject><subject>Voltage</subject><isbn>9780780373617</isbn><isbn>0780373618</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2002</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1kN1qwzAMhQ1jsNHlBbYbv0AyO47j-LKUbCsUuovcF2HLxCN_xO5K334e68QBHTjSBxIhz5wVnDP9uv1s921RMlYWnCnZsPKOZFo1LEkoUXP1QLIQvliqSlaM1Y9k7HqkE17oiLGfbaBwjvMIES1d-jnOOKCJqzc0LL8GBgoTDNfgA7342NNzQBoTIkSYLKyWBhiXARNnsvTbr_GcVv7D8ETuHQwBs1vfkO6t7XYf-eH4vt9tD7nXLObW1o02UkkhKuc0F04ZVxnHBFelM5qn2yQAutqUyjrrBKR5JVWJKGRtxIa8_GE9Ip6W1Y-wXk-3n4gf2tRagg</recordid><startdate>2002</startdate><enddate>2002</enddate><creator>Veshkurtsev, J.M.</creator><creator>Odinets, A.I.</creator><creator>Altyntsev, M.P.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2002</creationdate><title>The new methods automated photoelectric spectral analysis with use the standard samples and virtual standards</title><author>Veshkurtsev, J.M. ; Odinets, A.I. ; Altyntsev, M.P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-dd689c575334ff913f7cf4cf03172fc917585aaef6c27dfdf3a89c7572ee356c3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Calibration</topic><topic>Convergence</topic><topic>Graphics</topic><topic>Laboratories</topic><topic>Performance evaluation</topic><topic>Production</topic><topic>Qualifications</topic><topic>Spectral analysis</topic><topic>Standards development</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Veshkurtsev, J.M.</creatorcontrib><creatorcontrib>Odinets, A.I.</creatorcontrib><creatorcontrib>Altyntsev, M.P.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Veshkurtsev, J.M.</au><au>Odinets, A.I.</au><au>Altyntsev, M.P.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>The new methods automated photoelectric spectral analysis with use the standard samples and virtual standards</atitle><btitle>Proceedings, 6th International Conference on Actual Problems of Electronic Instrument Engineering</btitle><stitle>APEIE</stitle><date>2002</date><risdate>2002</risdate><spage>112</spage><epage>115</epage><pages>112-115</pages><isbn>9780780373617</isbn><isbn>0780373618</isbn><abstract>The essential deficiency of traditional methods of spectral analysis, founded on building of calibration graphs on kits for state standard samples (SSS), is the impossibility of the determination of inaccuracy and validity obtained separately results when undertaking current production analyses. As a rule, the degree of accuracy of spectral methods is realized only for industrial laboratories. Herewith the main attention is paid to the definition of accuracy and convergence of results for existing types of material by way of frequent repetitions of cycles from ten and more measurements.</abstract><pub>IEEE</pub><doi>10.1109/APEIE.2002.1075802</doi><tpages>4</tpages></addata></record> |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Calibration Convergence Graphics Laboratories Performance evaluation Production Qualifications Spectral analysis Standards development Voltage |
| title | The new methods automated photoelectric spectral analysis with use the standard samples and virtual standards |
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