Characterization of fully fragmented high-energy heavy ion beams for SEE testing through measurements and simulations
Fully fragmented, very-high-energy heavy ion beams offer interesting possibilities for radiation hardness assurance testing of electronic components exposed to the Galactic Cosmic Ray space environment. In this paper, we perform the dosimetry of these fully fragmented ion beams through a combination...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2024-11, p.1-1 |
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| creator | Waets, Andreas Alia, Ruben Garcia Bilko, Kacper Emriskova, Natalia Esposito, Luigi Salvatore Schuy, Christoph Wagner, Tim Nieminen, Petteri Schneider, Uwe |
| description | Fully fragmented, very-high-energy heavy ion beams offer interesting possibilities for radiation hardness assurance testing of electronic components exposed to the Galactic Cosmic Ray space environment. In this paper, we perform the dosimetry of these fully fragmented ion beams through a combination of silicon solid state detector measurements and detailed Monte Carlo simulations in FLUKA focusing on the interaction between beam and device under test. The tested experimental configurations highlight the challenges for implementing this method in VHE ion facilities. The Monte Carlo simulations offer further insight in the optimization of this approach. |
| doi_str_mv | 10.1109/TNS.2024.3492039 |
| format | Article |
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The Monte Carlo simulations offer further insight in the optimization of this approach.</description><subject>Alternative radiation hardness assurance (RHA)</subject><subject>CERN</subject><subject>Codes</subject><subject>Energy measurement</subject><subject>FLUKA</subject><subject>Geant4</subject><subject>GSI</subject><subject>Ion beams</subject><subject>Ions</subject><subject>Lead</subject><subject>Monte Carlo methods</subject><subject>Monte Carlo simulations</subject><subject>nuclear fragmentation</subject><subject>Particle beam measurements</subject><subject>Radiation effects</subject><subject>Semiconductor diodes</subject><subject>Silicon</subject><subject>silicon detector</subject><subject>single Event Effects (SEEs)</subject><subject>SRIM</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>ESBDL</sourceid><sourceid>RIE</sourceid><recordid>eNpNkEtLw0AUhQdRsFb3LlzMH0idZ9NZSqkPKLpo9-Fm5k4SyUNmEiH-ehPbhavDgfOAj5B7zlacM_N4fD-sBBNqJZURTJoLsuBabxKu080lWTDGN4lRxlyTmxg_J6s00wsybEsIYHsM1Q_0VdfSzlM_1PVIfYCiwbZHR8uqKBNsMRQjLRG-Rzonc4QmUt8FetjtaI-xr9qC9mXohqKkDUIcAs4LkULraKyaof77iLfkykMd8e6sS3J83h23r8n-4-Vt-7RP7FqYJAWVp1xblDwHzYziLjcpGMW4MyisZVKDyZWXa506ZKgFaGEdd2sHNge5JOw0a0MXY0CffYWqgTBmnGUztWyils3UsjO1qfJwqlSI-C-e6omdkb9yd2xY</recordid><startdate>20241114</startdate><enddate>20241114</enddate><creator>Waets, Andreas</creator><creator>Alia, Ruben Garcia</creator><creator>Bilko, Kacper</creator><creator>Emriskova, Natalia</creator><creator>Esposito, Luigi Salvatore</creator><creator>Schuy, Christoph</creator><creator>Wagner, Tim</creator><creator>Nieminen, Petteri</creator><creator>Schneider, Uwe</creator><general>IEEE</general><scope>97E</scope><scope>ESBDL</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0002-4865-851X</orcidid><orcidid>https://orcid.org/0000-0002-0825-8255</orcidid><orcidid>https://orcid.org/0000-0002-5834-8515</orcidid><orcidid>https://orcid.org/0000-0002-6450-9784</orcidid><orcidid>https://orcid.org/0000-0001-8030-1804</orcidid></search><sort><creationdate>20241114</creationdate><title>Characterization of fully fragmented high-energy heavy ion beams for SEE testing through measurements and simulations</title><author>Waets, Andreas ; 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| source | IEEE Electronic Library (IEL) |
| subjects | Alternative radiation hardness assurance (RHA) CERN Codes Energy measurement FLUKA Geant4 GSI Ion beams Ions Lead Monte Carlo methods Monte Carlo simulations nuclear fragmentation Particle beam measurements Radiation effects Semiconductor diodes Silicon silicon detector single Event Effects (SEEs) SRIM |
| title | Characterization of fully fragmented high-energy heavy ion beams for SEE testing through measurements and simulations |
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