Three-dimensional μXRF Imaging System for Curved Surface
Micro X-ray Fluorescence (μXRF) is a technology for non-destructive detection of elements with high resolution. Currently, the μXRF imaging system cannot scan with a fixed distance and incident angle, which highly affects the measurement consistency of curved objects. To solve this problem, we devel...
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Veröffentlicht in: | IEEE transactions on instrumentation and measurement 2024-10, p.1-1 |
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Sprache: | eng |
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