A SiGe/Si Heterojunction Phototransistor for High Sensitivity Light Detection
Silicon-based heterojunction phototransistors (HPTs) with their advantages of high internal gain, high responsivity, and compatibility with CMOS processes have attracted much attention in high-sensitivity light detection. In this article, the SiGe/Si HPT with an illuminated area of 50\times 50~\mu...
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Veröffentlicht in: | IEEE transactions on electron devices 2024-11, Vol.71 (11), p.6857-6863 |
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creator | Xie, Hongyun Shen, Xiaoting Ge, Yunpeng Xu, Zimai Liu, Ziming Ma, Yudong Na, Weicong Jin, Dongyue Zhang, Wanrong |
description | Silicon-based heterojunction phototransistors (HPTs) with their advantages of high internal gain, high responsivity, and compatibility with CMOS processes have attracted much attention in high-sensitivity light detection. In this article, the SiGe/Si HPT with an illuminated area of 50\times 50~\mu m2 for high responsivity and sensitivity was designed and fabricated. The optical responsivity of the fabricated SiGe/Si HPT reached 1.717 and 12.379 A/W for 405 and 650 nm, their specific detectivity values were 1.54\times 10^{{10}} and 11.16\times 10^{{10}}~\text {cm}\cdot \text {Hz}^{{0.5}}\cdot \text {W}^{-{1}} , respectively. An analytic model was developed to discuss current amplification for different wavelengths when considering absorption efficiency and carrier transportation. The emitter thickness was optimized as 60 nm to significantly improve the current amplification under short wavelengths. The achieved optical responsivity of the optimized SiGe/Si HPT for 405 and 650 nm respectively were 13.756 and 13.904 A/W, and the specific detectivity were 12.41\times 10^{{10}} and 12.54\times 10^{{10}}~\text {cm}\cdot \text {Hz}^{{0.5}} \cdot \text {W}^{-{1}} . |
doi_str_mv | 10.1109/TED.2024.3467218 |
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In this article, the SiGe/Si HPT with an illuminated area of <inline-formula> <tex-math notation="LaTeX">50\times 50~\mu </tex-math></inline-formula>m2 for high responsivity and sensitivity was designed and fabricated. The optical responsivity of the fabricated SiGe/Si HPT reached 1.717 and 12.379 A/W for 405 and 650 nm, their specific detectivity values were <inline-formula> <tex-math notation="LaTeX">1.54\times 10^{{10}} </tex-math></inline-formula> and <inline-formula> <tex-math notation="LaTeX">11.16\times 10^{{10}}~\text {cm}\cdot \text {Hz}^{{0.5}}\cdot \text {W}^{-{1}} </tex-math></inline-formula>, respectively. An analytic model was developed to discuss current amplification for different wavelengths when considering absorption efficiency and carrier transportation. The emitter thickness was optimized as 60 nm to significantly improve the current amplification under short wavelengths. The achieved optical responsivity of the optimized SiGe/Si HPT for 405 and 650 nm respectively were 13.756 and 13.904 A/W, and the specific detectivity were <inline-formula> <tex-math notation="LaTeX">12.41\times 10^{{10}} </tex-math></inline-formula> and <inline-formula> <tex-math notation="LaTeX">12.54\times 10^{{10}}~\text {cm}\cdot \text {Hz}^{{0.5}} \cdot \text {W}^{-{1}} </tex-math></inline-formula>.]]></description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/TED.2024.3467218</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>IEEE</publisher><subject>Absorption ; Dark current ; Light detection ; Noise ; Optical device fabrication ; Optical sensors ; Photoconductivity ; responsivity ; Sensitivity ; SiGe/Si heterojunction phototransistors (HPTs) ; Silicon germanium ; specific detectivity ; Turning ; Voltage measurement</subject><ispartof>IEEE transactions on electron devices, 2024-11, Vol.71 (11), p.6857-6863</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c147t-80633e5d2e55276fdba9111a49f61352429f8eac3021a9c22ec8221701c3941a3</cites><orcidid>0000-0001-7914-9411 ; 0000-0002-7534-1470 ; 0000-0001-9775-5124</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10709352$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10709352$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Xie, Hongyun</creatorcontrib><creatorcontrib>Shen, Xiaoting</creatorcontrib><creatorcontrib>Ge, Yunpeng</creatorcontrib><creatorcontrib>Xu, Zimai</creatorcontrib><creatorcontrib>Liu, Ziming</creatorcontrib><creatorcontrib>Ma, Yudong</creatorcontrib><creatorcontrib>Na, Weicong</creatorcontrib><creatorcontrib>Jin, Dongyue</creatorcontrib><creatorcontrib>Zhang, Wanrong</creatorcontrib><title>A SiGe/Si Heterojunction Phototransistor for High Sensitivity Light Detection</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description><![CDATA[Silicon-based heterojunction phototransistors (HPTs) with their advantages of high internal gain, high responsivity, and compatibility with CMOS processes have attracted much attention in high-sensitivity light detection. In this article, the SiGe/Si HPT with an illuminated area of <inline-formula> <tex-math notation="LaTeX">50\times 50~\mu </tex-math></inline-formula>m2 for high responsivity and sensitivity was designed and fabricated. The optical responsivity of the fabricated SiGe/Si HPT reached 1.717 and 12.379 A/W for 405 and 650 nm, their specific detectivity values were <inline-formula> <tex-math notation="LaTeX">1.54\times 10^{{10}} </tex-math></inline-formula> and <inline-formula> <tex-math notation="LaTeX">11.16\times 10^{{10}}~\text {cm}\cdot \text {Hz}^{{0.5}}\cdot \text {W}^{-{1}} </tex-math></inline-formula>, respectively. An analytic model was developed to discuss current amplification for different wavelengths when considering absorption efficiency and carrier transportation. The emitter thickness was optimized as 60 nm to significantly improve the current amplification under short wavelengths. The achieved optical responsivity of the optimized SiGe/Si HPT for 405 and 650 nm respectively were 13.756 and 13.904 A/W, and the specific detectivity were <inline-formula> <tex-math notation="LaTeX">12.41\times 10^{{10}} </tex-math></inline-formula> and <inline-formula> <tex-math notation="LaTeX">12.54\times 10^{{10}}~\text {cm}\cdot \text {Hz}^{{0.5}} \cdot \text {W}^{-{1}} </tex-math></inline-formula>.]]></description><subject>Absorption</subject><subject>Dark current</subject><subject>Light detection</subject><subject>Noise</subject><subject>Optical device fabrication</subject><subject>Optical sensors</subject><subject>Photoconductivity</subject><subject>responsivity</subject><subject>Sensitivity</subject><subject>SiGe/Si heterojunction phototransistors (HPTs)</subject><subject>Silicon germanium</subject><subject>specific detectivity</subject><subject>Turning</subject><subject>Voltage measurement</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkMFOAjEQhhujiYjePXjoCyx0pt3u9kgAwQSjCXje1DIrJcqatprw9hTh4GEymT_zzSQfY_cgBgDCDFfTyQAFqoFUukKoL1gPyrIqjFb6kvWEgLowspbX7CbGbR61UthjzyO-9DMaLj2fU6LQbX92Lvlux183XepSsLvoY-oCb3PN_ceGLylHyf_6tOeLHCQ-yeQfdMuuWvsZ6e7c--ztcboaz4vFy-xpPFoUDlSVilpoKalcI5UlVrpdv1sDAFaZVoMsUaFpa7JOCgRrHCK5GhEqAU4aBVb2mTjddaGLMVDbfAf_ZcO-AdEcdTRZR3PU0Zx1ZOThhHgi-rdeCZM_ygPzy1sz</recordid><startdate>202411</startdate><enddate>202411</enddate><creator>Xie, Hongyun</creator><creator>Shen, Xiaoting</creator><creator>Ge, Yunpeng</creator><creator>Xu, Zimai</creator><creator>Liu, Ziming</creator><creator>Ma, Yudong</creator><creator>Na, Weicong</creator><creator>Jin, Dongyue</creator><creator>Zhang, Wanrong</creator><general>IEEE</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0001-7914-9411</orcidid><orcidid>https://orcid.org/0000-0002-7534-1470</orcidid><orcidid>https://orcid.org/0000-0001-9775-5124</orcidid></search><sort><creationdate>202411</creationdate><title>A SiGe/Si Heterojunction Phototransistor for High Sensitivity Light Detection</title><author>Xie, Hongyun ; Shen, Xiaoting ; Ge, Yunpeng ; Xu, Zimai ; Liu, Ziming ; Ma, Yudong ; Na, Weicong ; Jin, Dongyue ; Zhang, Wanrong</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c147t-80633e5d2e55276fdba9111a49f61352429f8eac3021a9c22ec8221701c3941a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Absorption</topic><topic>Dark current</topic><topic>Light detection</topic><topic>Noise</topic><topic>Optical device fabrication</topic><topic>Optical sensors</topic><topic>Photoconductivity</topic><topic>responsivity</topic><topic>Sensitivity</topic><topic>SiGe/Si heterojunction phototransistors (HPTs)</topic><topic>Silicon germanium</topic><topic>specific detectivity</topic><topic>Turning</topic><topic>Voltage measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Xie, Hongyun</creatorcontrib><creatorcontrib>Shen, Xiaoting</creatorcontrib><creatorcontrib>Ge, Yunpeng</creatorcontrib><creatorcontrib>Xu, Zimai</creatorcontrib><creatorcontrib>Liu, Ziming</creatorcontrib><creatorcontrib>Ma, Yudong</creatorcontrib><creatorcontrib>Na, Weicong</creatorcontrib><creatorcontrib>Jin, Dongyue</creatorcontrib><creatorcontrib>Zhang, Wanrong</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Xie, Hongyun</au><au>Shen, Xiaoting</au><au>Ge, Yunpeng</au><au>Xu, Zimai</au><au>Liu, Ziming</au><au>Ma, Yudong</au><au>Na, Weicong</au><au>Jin, Dongyue</au><au>Zhang, Wanrong</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A SiGe/Si Heterojunction Phototransistor for High Sensitivity Light Detection</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>2024-11</date><risdate>2024</risdate><volume>71</volume><issue>11</issue><spage>6857</spage><epage>6863</epage><pages>6857-6863</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract><![CDATA[Silicon-based heterojunction phototransistors (HPTs) with their advantages of high internal gain, high responsivity, and compatibility with CMOS processes have attracted much attention in high-sensitivity light detection. In this article, the SiGe/Si HPT with an illuminated area of <inline-formula> <tex-math notation="LaTeX">50\times 50~\mu </tex-math></inline-formula>m2 for high responsivity and sensitivity was designed and fabricated. The optical responsivity of the fabricated SiGe/Si HPT reached 1.717 and 12.379 A/W for 405 and 650 nm, their specific detectivity values were <inline-formula> <tex-math notation="LaTeX">1.54\times 10^{{10}} </tex-math></inline-formula> and <inline-formula> <tex-math notation="LaTeX">11.16\times 10^{{10}}~\text {cm}\cdot \text {Hz}^{{0.5}}\cdot \text {W}^{-{1}} </tex-math></inline-formula>, respectively. An analytic model was developed to discuss current amplification for different wavelengths when considering absorption efficiency and carrier transportation. The emitter thickness was optimized as 60 nm to significantly improve the current amplification under short wavelengths. The achieved optical responsivity of the optimized SiGe/Si HPT for 405 and 650 nm respectively were 13.756 and 13.904 A/W, and the specific detectivity were <inline-formula> <tex-math notation="LaTeX">12.41\times 10^{{10}} </tex-math></inline-formula> and <inline-formula> <tex-math notation="LaTeX">12.54\times 10^{{10}}~\text {cm}\cdot \text {Hz}^{{0.5}} \cdot \text {W}^{-{1}} </tex-math></inline-formula>.]]></abstract><pub>IEEE</pub><doi>10.1109/TED.2024.3467218</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0001-7914-9411</orcidid><orcidid>https://orcid.org/0000-0002-7534-1470</orcidid><orcidid>https://orcid.org/0000-0001-9775-5124</orcidid></addata></record> |
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subjects | Absorption Dark current Light detection Noise Optical device fabrication Optical sensors Photoconductivity responsivity Sensitivity SiGe/Si heterojunction phototransistors (HPTs) Silicon germanium specific detectivity Turning Voltage measurement |
title | A SiGe/Si Heterojunction Phototransistor for High Sensitivity Light Detection |
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