Development of a Lithography Simulation Tool Set in Various Optical Conditions for Source Mask Optimization
Resolution Enhancement Techniques (RETs) in optical lithography have become essential for achieving the continuous shrinkage of technology nodes. The primary techniques in RETs include source mask optimization. Generally, lithography simulation, which estimates the image formed on wafers, is utilize...
Gespeichert in:
Veröffentlicht in: | IEEE access 2024, Vol.12, p.58490-58501 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!