The effect of voltage frequency on partial discharge activity
The knowledge of partial discharge (PD) as a physical phenomenon has made considerable progress in the last decade(s). These efforts have led to a validated statistical-mathematical model able to simulate the PD behavior in dielectric bounded spheroidal cavities. Recent studies demonstrated that an...
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creator | Bodega, R. Cavallini, A. Morshuis, P.H.F. Wester, F.J. |
description | The knowledge of partial discharge (PD) as a physical phenomenon has made considerable progress in the last decade(s). These efforts have led to a validated statistical-mathematical model able to simulate the PD behavior in dielectric bounded spheroidal cavities. Recent studies demonstrated that an approach based on simulations can give both qualitative information on the PD process and a good estimation of the main PD quantities (PD magnitude, PD inception/extinction voltage, PD pattern). This theoretical operating procedure was until now restricted to discharges ignited at the power stress frequency of 50 (60) Hz. In this paper the authors describe the use of a procedure to simulate partial discharges in dielectric bounded spheroidal cavities at frequencies in the range of 0.1 Hz...1000 Hz. Information on the effect of voltage frequency on the PD process has been derived from the simulation results. The results were validated by measurements at a range of test frequencies on test specimens containing spherical cavities. |
doi_str_mv | 10.1109/CEIDP.2002.1048889 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>pascalfrancis_6IE</sourceid><recordid>TN_cdi_ieee_primary_1048889</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1048889</ieee_id><sourcerecordid>15786345</sourcerecordid><originalsourceid>FETCH-LOGICAL-i135t-13ad9a41a93ee8899d5a668115f9dfe7709d78a04952bd83b992ae2b42efc5a3</originalsourceid><addsrcrecordid>eNpFkE1LxDAYhAMiqOv-Ab3k4rE1n21y8CB11YUFPfS-vE3euJHarW1c6L-3UMG5zGEehmEIueEs55zZ-2qzfXrPBWMi50wZY-wZuWKlYbLUTOgLsh7HTzZLaS6VuSQP9QEphoAu0WOgp2Ob4ANpGPD7Bzs30WNHexhShJb6OLoDDHMMLsVTTNM1OQ_Qjrj-8xWpnzd19Zrt3l621eMui1zqlHEJ3oLiYCXivMl6DUVhONfB-oBlyawvDTBltWi8kY21AlA0SmBwGuSK3C21PYwO2jBA5-K474f4BcO057o0hVR65m4XLiLif7wcIX8BBkZTdQ</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>The effect of voltage frequency on partial discharge activity</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Bodega, R. ; Cavallini, A. ; Morshuis, P.H.F. ; Wester, F.J.</creator><creatorcontrib>Bodega, R. ; Cavallini, A. ; Morshuis, P.H.F. ; Wester, F.J.</creatorcontrib><description>The knowledge of partial discharge (PD) as a physical phenomenon has made considerable progress in the last decade(s). These efforts have led to a validated statistical-mathematical model able to simulate the PD behavior in dielectric bounded spheroidal cavities. Recent studies demonstrated that an approach based on simulations can give both qualitative information on the PD process and a good estimation of the main PD quantities (PD magnitude, PD inception/extinction voltage, PD pattern). This theoretical operating procedure was until now restricted to discharges ignited at the power stress frequency of 50 (60) Hz. In this paper the authors describe the use of a procedure to simulate partial discharges in dielectric bounded spheroidal cavities at frequencies in the range of 0.1 Hz...1000 Hz. Information on the effect of voltage frequency on the PD process has been derived from the simulation results. The results were validated by measurements at a range of test frequencies on test specimens containing spherical cavities.</description><identifier>ISBN: 0780375025</identifier><identifier>ISBN: 9780780375024</identifier><identifier>DOI: 10.1109/CEIDP.2002.1048889</identifier><language>eng</language><publisher>Piscataway NJ: IEEE</publisher><subject>Aging ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Dielectric breakdown and space-charge effects ; Dielectric measurements ; Dielectric properties of solids and liquids ; Dielectrics, piezoelectrics, and ferroelectrics and their properties ; Exact sciences and technology ; Frequency measurement ; Insulation ; Numerical simulation ; Partial discharge measurement ; Partial discharges ; Physics ; Stress ; Testing ; Voltage</subject><ispartof>Annual Report Conference on Electrical Insulation and Dielectric Phenomena, 2002, p.685-689</ispartof><rights>2004 INIST-CNRS</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1048889$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1048889$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=15786345$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Bodega, R.</creatorcontrib><creatorcontrib>Cavallini, A.</creatorcontrib><creatorcontrib>Morshuis, P.H.F.</creatorcontrib><creatorcontrib>Wester, F.J.</creatorcontrib><title>The effect of voltage frequency on partial discharge activity</title><title>Annual Report Conference on Electrical Insulation and Dielectric Phenomena</title><addtitle>CEIDP</addtitle><description>The knowledge of partial discharge (PD) as a physical phenomenon has made considerable progress in the last decade(s). These efforts have led to a validated statistical-mathematical model able to simulate the PD behavior in dielectric bounded spheroidal cavities. Recent studies demonstrated that an approach based on simulations can give both qualitative information on the PD process and a good estimation of the main PD quantities (PD magnitude, PD inception/extinction voltage, PD pattern). This theoretical operating procedure was until now restricted to discharges ignited at the power stress frequency of 50 (60) Hz. In this paper the authors describe the use of a procedure to simulate partial discharges in dielectric bounded spheroidal cavities at frequencies in the range of 0.1 Hz...1000 Hz. Information on the effect of voltage frequency on the PD process has been derived from the simulation results. The results were validated by measurements at a range of test frequencies on test specimens containing spherical cavities.</description><subject>Aging</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Dielectric breakdown and space-charge effects</subject><subject>Dielectric measurements</subject><subject>Dielectric properties of solids and liquids</subject><subject>Dielectrics, piezoelectrics, and ferroelectrics and their properties</subject><subject>Exact sciences and technology</subject><subject>Frequency measurement</subject><subject>Insulation</subject><subject>Numerical simulation</subject><subject>Partial discharge measurement</subject><subject>Partial discharges</subject><subject>Physics</subject><subject>Stress</subject><subject>Testing</subject><subject>Voltage</subject><isbn>0780375025</isbn><isbn>9780780375024</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2002</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFkE1LxDAYhAMiqOv-Ab3k4rE1n21y8CB11YUFPfS-vE3euJHarW1c6L-3UMG5zGEehmEIueEs55zZ-2qzfXrPBWMi50wZY-wZuWKlYbLUTOgLsh7HTzZLaS6VuSQP9QEphoAu0WOgp2Ob4ANpGPD7Bzs30WNHexhShJb6OLoDDHMMLsVTTNM1OQ_Qjrj-8xWpnzd19Zrt3l621eMui1zqlHEJ3oLiYCXivMl6DUVhONfB-oBlyawvDTBltWi8kY21AlA0SmBwGuSK3C21PYwO2jBA5-K474f4BcO057o0hVR65m4XLiLif7wcIX8BBkZTdQ</recordid><startdate>2002</startdate><enddate>2002</enddate><creator>Bodega, R.</creator><creator>Cavallini, A.</creator><creator>Morshuis, P.H.F.</creator><creator>Wester, F.J.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>IQODW</scope></search><sort><creationdate>2002</creationdate><title>The effect of voltage frequency on partial discharge activity</title><author>Bodega, R. ; Cavallini, A. ; Morshuis, P.H.F. ; Wester, F.J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i135t-13ad9a41a93ee8899d5a668115f9dfe7709d78a04952bd83b992ae2b42efc5a3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Aging</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Dielectric breakdown and space-charge effects</topic><topic>Dielectric measurements</topic><topic>Dielectric properties of solids and liquids</topic><topic>Dielectrics, piezoelectrics, and ferroelectrics and their properties</topic><topic>Exact sciences and technology</topic><topic>Frequency measurement</topic><topic>Insulation</topic><topic>Numerical simulation</topic><topic>Partial discharge measurement</topic><topic>Partial discharges</topic><topic>Physics</topic><topic>Stress</topic><topic>Testing</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Bodega, R.</creatorcontrib><creatorcontrib>Cavallini, A.</creatorcontrib><creatorcontrib>Morshuis, P.H.F.</creatorcontrib><creatorcontrib>Wester, F.J.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bodega, R.</au><au>Cavallini, A.</au><au>Morshuis, P.H.F.</au><au>Wester, F.J.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>The effect of voltage frequency on partial discharge activity</atitle><btitle>Annual Report Conference on Electrical Insulation and Dielectric Phenomena</btitle><stitle>CEIDP</stitle><date>2002</date><risdate>2002</risdate><spage>685</spage><epage>689</epage><pages>685-689</pages><isbn>0780375025</isbn><isbn>9780780375024</isbn><abstract>The knowledge of partial discharge (PD) as a physical phenomenon has made considerable progress in the last decade(s). These efforts have led to a validated statistical-mathematical model able to simulate the PD behavior in dielectric bounded spheroidal cavities. Recent studies demonstrated that an approach based on simulations can give both qualitative information on the PD process and a good estimation of the main PD quantities (PD magnitude, PD inception/extinction voltage, PD pattern). This theoretical operating procedure was until now restricted to discharges ignited at the power stress frequency of 50 (60) Hz. In this paper the authors describe the use of a procedure to simulate partial discharges in dielectric bounded spheroidal cavities at frequencies in the range of 0.1 Hz...1000 Hz. Information on the effect of voltage frequency on the PD process has been derived from the simulation results. The results were validated by measurements at a range of test frequencies on test specimens containing spherical cavities.</abstract><cop>Piscataway NJ</cop><pub>IEEE</pub><doi>10.1109/CEIDP.2002.1048889</doi><tpages>5</tpages></addata></record> |
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subjects | Aging Condensed matter: electronic structure, electrical, magnetic, and optical properties Dielectric breakdown and space-charge effects Dielectric measurements Dielectric properties of solids and liquids Dielectrics, piezoelectrics, and ferroelectrics and their properties Exact sciences and technology Frequency measurement Insulation Numerical simulation Partial discharge measurement Partial discharges Physics Stress Testing Voltage |
title | The effect of voltage frequency on partial discharge activity |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T11%3A03%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=The%20effect%20of%20voltage%20frequency%20on%20partial%20discharge%20activity&rft.btitle=Annual%20Report%20Conference%20on%20Electrical%20Insulation%20and%20Dielectric%20Phenomena&rft.au=Bodega,%20R.&rft.date=2002&rft.spage=685&rft.epage=689&rft.pages=685-689&rft.isbn=0780375025&rft.isbn_list=9780780375024&rft_id=info:doi/10.1109/CEIDP.2002.1048889&rft_dat=%3Cpascalfrancis_6IE%3E15786345%3C/pascalfrancis_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1048889&rfr_iscdi=true |