An improved thin film permanent magnet material and novel magnet design for magnetoresistive sensor biasing
A high-performance CoPt thin-film permanent-magnet material and a magnet design have been developed to provide an integrated bias field source for unshielded magnetoresistive (MR) reproduce heads. A 1- mu m-thick deposited permanent magnet is located above the MR element and away from the media; it...
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Veröffentlicht in: | IEEE transactions on magnetics 1990-09, Vol.26 (5), p.2409-2411 |
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container_title | IEEE transactions on magnetics |
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creator | Smith, N. Brucker, C.F. Spada, F.E. |
description | A high-performance CoPt thin-film permanent-magnet material and a magnet design have been developed to provide an integrated bias field source for unshielded magnetoresistive (MR) reproduce heads. A 1- mu m-thick deposited permanent magnet is located above the MR element and away from the media; it is fully encapsulated and removed from the head/media interface. Problems of mutual demagnetization between magnet and media, galvanic corrosion at the exposed MR and magnet edges, and MR film degradation from an inhomogeneous adjacent permanent-magnet layer are eliminated. A CoPt magnet of specific geometry is designed to produce hard and easy axis bias fields, providing good single-domain stability while maintaining high MR sensitivity. The CoPt sputter deposition is a room-temperature process which is compatible with other temperature-sensitive head materials.< > |
doi_str_mv | 10.1109/20.104747 |
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A 1- mu m-thick deposited permanent magnet is located above the MR element and away from the media; it is fully encapsulated and removed from the head/media interface. Problems of mutual demagnetization between magnet and media, galvanic corrosion at the exposed MR and magnet edges, and MR film degradation from an inhomogeneous adjacent permanent-magnet layer are eliminated. A CoPt magnet of specific geometry is designed to produce hard and easy axis bias fields, providing good single-domain stability while maintaining high MR sensitivity. The CoPt sputter deposition is a room-temperature process which is compatible with other temperature-sensitive head materials.< ></description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/20.104747</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Corrosion ; Degradation ; Demagnetization ; Exact sciences and technology ; Galvanizing ; Magnetic heads ; Magnetic materials ; Magnetic properties and materials ; Magnetoresistance ; Metals. 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A 1- mu m-thick deposited permanent magnet is located above the MR element and away from the media; it is fully encapsulated and removed from the head/media interface. Problems of mutual demagnetization between magnet and media, galvanic corrosion at the exposed MR and magnet edges, and MR film degradation from an inhomogeneous adjacent permanent-magnet layer are eliminated. A CoPt magnet of specific geometry is designed to produce hard and easy axis bias fields, providing good single-domain stability while maintaining high MR sensitivity. The CoPt sputter deposition is a room-temperature process which is compatible with other temperature-sensitive head materials.< ></description><subject>Applied sciences</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Corrosion</subject><subject>Degradation</subject><subject>Demagnetization</subject><subject>Exact sciences and technology</subject><subject>Galvanizing</subject><subject>Magnetic heads</subject><subject>Magnetic materials</subject><subject>Magnetic properties and materials</subject><subject>Magnetoresistance</subject><subject>Metals. Metallurgy</subject><subject>Nonhomogeneous media</subject><subject>Permanent magnets</subject><subject>Physics</subject><subject>Transistors</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1990</creationdate><recordtype>article</recordtype><recordid>eNqNkL1PwzAQxS0EEqUwsDJ5AYkhYMeOHY9VxZdUiQXmyHUuxZA4xZdW4r_H_UAwMj3du9970h0h55zdcM7MbZ6USS31ARlxI3nGmDKHZMQYLzMjlTwmJ4jvaZQFZyPyMQnUd8vYr6Gmw5sPtPFtR5cQOxsgDLSziwAbGSB621IbahoS3f5sakC_SLE-7p0-JgcHvwaKEDD5c2_Rh8UpOWpsi3C21zF5vb97mT5ms-eHp-lkljkhyiHjdaFtKWShpSmdErKp5yUrQTrnmNBWC2OMcoozKxTkpebFHGrD63yuc9UoMSZXu9501ucKcKg6jw7aNl3Ur7BKEVHI_D-gzDnjG_B6B7rYI0ZoqmX0nY1fFWfV5u9VnnT798Re7kstOts20Qbn8TdgRGGMLhJ3seM8APzp25Z8AxDFitM</recordid><startdate>19900901</startdate><enddate>19900901</enddate><creator>Smith, N.</creator><creator>Brucker, C.F.</creator><creator>Spada, F.E.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SE</scope><scope>7SP</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>8BQ</scope></search><sort><creationdate>19900901</creationdate><title>An improved thin film permanent magnet material and novel magnet design for magnetoresistive sensor biasing</title><author>Smith, N. ; Brucker, C.F. ; Spada, F.E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c338t-1d57a83457498c634fdb808e4ccc037a739996c610a36e28715bed91d2b726f63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1990</creationdate><topic>Applied sciences</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Corrosion</topic><topic>Degradation</topic><topic>Demagnetization</topic><topic>Exact sciences and technology</topic><topic>Galvanizing</topic><topic>Magnetic heads</topic><topic>Magnetic materials</topic><topic>Magnetic properties and materials</topic><topic>Magnetoresistance</topic><topic>Metals. Metallurgy</topic><topic>Nonhomogeneous media</topic><topic>Permanent magnets</topic><topic>Physics</topic><topic>Transistors</topic><toplevel>online_resources</toplevel><creatorcontrib>Smith, N.</creatorcontrib><creatorcontrib>Brucker, C.F.</creatorcontrib><creatorcontrib>Spada, F.E.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>METADEX</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Smith, N.</au><au>Brucker, C.F.</au><au>Spada, F.E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An improved thin film permanent magnet material and novel magnet design for magnetoresistive sensor biasing</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>1990-09-01</date><risdate>1990</risdate><volume>26</volume><issue>5</issue><spage>2409</spage><epage>2411</epage><pages>2409-2411</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>A high-performance CoPt thin-film permanent-magnet material and a magnet design have been developed to provide an integrated bias field source for unshielded magnetoresistive (MR) reproduce heads. A 1- mu m-thick deposited permanent magnet is located above the MR element and away from the media; it is fully encapsulated and removed from the head/media interface. Problems of mutual demagnetization between magnet and media, galvanic corrosion at the exposed MR and magnet edges, and MR film degradation from an inhomogeneous adjacent permanent-magnet layer are eliminated. A CoPt magnet of specific geometry is designed to produce hard and easy axis bias fields, providing good single-domain stability while maintaining high MR sensitivity. The CoPt sputter deposition is a room-temperature process which is compatible with other temperature-sensitive head materials.< ></abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/20.104747</doi><tpages>3</tpages></addata></record> |
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ispartof | IEEE transactions on magnetics, 1990-09, Vol.26 (5), p.2409-2411 |
issn | 0018-9464 1941-0069 |
language | eng |
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source | IEEE Electronic Library (IEL) |
subjects | Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Corrosion Degradation Demagnetization Exact sciences and technology Galvanizing Magnetic heads Magnetic materials Magnetic properties and materials Magnetoresistance Metals. Metallurgy Nonhomogeneous media Permanent magnets Physics Transistors |
title | An improved thin film permanent magnet material and novel magnet design for magnetoresistive sensor biasing |
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