An Auto-Calibrated Measurement System for 1-D Matrices of Impedimetric Sensors
Impedance measurement ICs are widely used in embedded systems for single-sensor measurements. Thereby, the impedance value of the target sensor is calculated by comparing its measurement signal with one of a given reference element. This is known as the calibration process. To automate the calibrati...
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| Veröffentlicht in: | IEEE sensors journal 2024-05, Vol.24 (9), p.14970-14976 |
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| creator | Hu, Zheng Kallel, Ahmed Yahia Lu, Tianqi Al-Hamry, Ammar Kanoun, Olfa |
| description | Impedance measurement ICs are widely used in embedded systems for single-sensor measurements. Thereby, the impedance value of the target sensor is calculated by comparing its measurement signal with one of a given reference element. This is known as the calibration process. To automate the calibration process for multisensor measurements, multiplexers (MUXs) are recommended. But the switch on-resistances of MUXs cause additional measurement deviations, unless expensive MUXs with very low switch on-resistances or buffer functions are used. To overcome the need for specially designed MUXs, a circuit structure based on two MUXs in the feedback loop of one voltage follower is proposed in this work, with dc bias circuits. This solution is experimentally validated in a prototype system based on the AD5933 chip for a 1-D sensor matrix. Compared to the common single MUX system, the proposed approach has suppressed the average measurement deviation from 6.01% to 0.06% in the impedance magnitude measurements and from 10.75% to 0.13% for the resistive targets. |
| doi_str_mv | 10.1109/JSEN.2024.3366948 |
| format | Article |
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Thereby, the impedance value of the target sensor is calculated by comparing its measurement signal with one of a given reference element. This is known as the calibration process. To automate the calibration process for multisensor measurements, multiplexers (MUXs) are recommended. But the switch on-resistances of MUXs cause additional measurement deviations, unless expensive MUXs with very low switch on-resistances or buffer functions are used. To overcome the need for specially designed MUXs, a circuit structure based on two MUXs in the feedback loop of one voltage follower is proposed in this work, with dc bias circuits. This solution is experimentally validated in a prototype system based on the AD5933 chip for a 1-D sensor matrix. 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Compared to the common single MUX system, the proposed approach has suppressed the average measurement deviation from 6.01% to 0.06% in the impedance magnitude measurements and from 10.75% to 0.13% for the resistive targets.</description><subject>1-D matrix</subject><subject>AD5933</subject><subject>Calibration</subject><subject>Circuit design</subject><subject>Deviation</subject><subject>Electrical resistance measurement</subject><subject>Embedded systems</subject><subject>Feedback loops</subject><subject>Impedance</subject><subject>Impedance measurement</subject><subject>impedimetric sensors</subject><subject>Integrated circuits</subject><subject>multiplexer (MUX)</subject><subject>Multiplexing</subject><subject>Sensors</subject><subject>Switches</subject><subject>voltage follower</subject><subject>Voltage measurement</subject><issn>1530-437X</issn><issn>1558-1748</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkE1Lw0AQhhdRsFZ_gOBhwXPqzn5l91hq1UpbD1Xwtmw2E0hpkrqbHvrvbagHT_MyPO8MPITcA5sAMPv0vpmvJ5xxORFCayvNBRmBUiaDXJrLIQuWSZF_X5OblLaMgc1VPiLraUunh77LZn5XF9H3WNIV-nSI2GDb080x9djQqosUsme68n2sAybaVXTR7LGsGxw2dINt6mK6JVeV3yW8-5tj8vUy_5y9ZcuP18VsuswCl7rPrC_BMKOBs0IWOufMBwhgUCth86LSZSggiNJj6YNW3FTacl4qNFxZjYUYk8fz3X3sfg6YerftDrE9vXSCSSstF4KdKDhTIXYpRazcPtaNj0cHzA3a3KDNDdrcn7ZT5-HcqRHxHy9zEEqLX_myaG0</recordid><startdate>20240501</startdate><enddate>20240501</enddate><creator>Hu, Zheng</creator><creator>Kallel, Ahmed Yahia</creator><creator>Lu, Tianqi</creator><creator>Al-Hamry, Ammar</creator><creator>Kanoun, Olfa</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| subjects | 1-D matrix AD5933 Calibration Circuit design Deviation Electrical resistance measurement Embedded systems Feedback loops Impedance Impedance measurement impedimetric sensors Integrated circuits multiplexer (MUX) Multiplexing Sensors Switches voltage follower Voltage measurement |
| title | An Auto-Calibrated Measurement System for 1-D Matrices of Impedimetric Sensors |
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