A method to design MMICs for high production yields
In this paper, a MMIC (monolithic microwave integrated circuit) design technique, oriented to the optimization of the production yields, is illustrated. This method, based on a sensitivity analysis, i.e. on the circuit behavior for variations of passive elements from their nominal value, and on the...
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creator | Comparini, M. Di Pasquale, A. Feudale, M. Giorgio, A. Perri, A.G. |
description | In this paper, a MMIC (monolithic microwave integrated circuit) design technique, oriented to the optimization of the production yields, is illustrated. This method, based on a sensitivity analysis, i.e. on the circuit behavior for variations of passive elements from their nominal value, and on the contemporary determination of the production yields, allows the identification of the circuit elements to obtain high production yield. Moreover it allows an appropriate choice of the circuit topology. As an example, this technique has been applied to design a MMIC to be employed on equipment where a high number of devices is required. |
doi_str_mv | 10.1109/ICECS.2002.1046184 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_1046184</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1046184</ieee_id><sourcerecordid>1046184</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-323ac208aef0c8211897b3ae39e7947b5fa4286c498d9c8cea3823e422943fc93</originalsourceid><addsrcrecordid>eNotj8FqAjEURQOl0GLnB-wmPzDTJC-ZJEsZbDuguGhdS0xenBQ1Mpku_PsK9XLg7A5cQuacNZwz-9Z3y-6rEYyJhjPZciMfSGW1YTdAK9vCE6lK-WG3SSWZEs8EFvSE05ADnTINWNLhTNfrvis05pEO6TDQy5jDr59SPtNrwmMoL-QxumPB6u4Z2b4vv7vPerX56LvFqk5cq6kGAc4LZhxG5o3g3Fi9B4dgUVup9yo6KUzrpTXBeuPRgRGAUggrIXoLM_L6302IuLuM6eTG6-5-Df4A2adCfg</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>A method to design MMICs for high production yields</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Comparini, M. ; Di Pasquale, A. ; Feudale, M. ; Giorgio, A. ; Perri, A.G.</creator><creatorcontrib>Comparini, M. ; Di Pasquale, A. ; Feudale, M. ; Giorgio, A. ; Perri, A.G.</creatorcontrib><description>In this paper, a MMIC (monolithic microwave integrated circuit) design technique, oriented to the optimization of the production yields, is illustrated. This method, based on a sensitivity analysis, i.e. on the circuit behavior for variations of passive elements from their nominal value, and on the contemporary determination of the production yields, allows the identification of the circuit elements to obtain high production yield. Moreover it allows an appropriate choice of the circuit topology. As an example, this technique has been applied to design a MMIC to be employed on equipment where a high number of devices is required.</description><identifier>ISBN: 9780780375963</identifier><identifier>ISBN: 0780375963</identifier><identifier>DOI: 10.1109/ICECS.2002.1046184</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuit topology ; Design methodology ; Design optimization ; Integrated circuit yield ; Microwave integrated circuits ; Microwave theory and techniques ; MMICs ; Monolithic integrated circuits ; Production ; Sensitivity analysis</subject><ispartof>9th International Conference on Electronics, Circuits and Systems, 2002, Vol.2, p.421-424 vol.2</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1046184$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,777,781,786,787,2052,4036,4037,27906,54901</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1046184$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Comparini, M.</creatorcontrib><creatorcontrib>Di Pasquale, A.</creatorcontrib><creatorcontrib>Feudale, M.</creatorcontrib><creatorcontrib>Giorgio, A.</creatorcontrib><creatorcontrib>Perri, A.G.</creatorcontrib><title>A method to design MMICs for high production yields</title><title>9th International Conference on Electronics, Circuits and Systems</title><addtitle>ICECS</addtitle><description>In this paper, a MMIC (monolithic microwave integrated circuit) design technique, oriented to the optimization of the production yields, is illustrated. This method, based on a sensitivity analysis, i.e. on the circuit behavior for variations of passive elements from their nominal value, and on the contemporary determination of the production yields, allows the identification of the circuit elements to obtain high production yield. Moreover it allows an appropriate choice of the circuit topology. As an example, this technique has been applied to design a MMIC to be employed on equipment where a high number of devices is required.</description><subject>Circuit topology</subject><subject>Design methodology</subject><subject>Design optimization</subject><subject>Integrated circuit yield</subject><subject>Microwave integrated circuits</subject><subject>Microwave theory and techniques</subject><subject>MMICs</subject><subject>Monolithic integrated circuits</subject><subject>Production</subject><subject>Sensitivity analysis</subject><isbn>9780780375963</isbn><isbn>0780375963</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2002</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8FqAjEURQOl0GLnB-wmPzDTJC-ZJEsZbDuguGhdS0xenBQ1Mpku_PsK9XLg7A5cQuacNZwz-9Z3y-6rEYyJhjPZciMfSGW1YTdAK9vCE6lK-WG3SSWZEs8EFvSE05ADnTINWNLhTNfrvis05pEO6TDQy5jDr59SPtNrwmMoL-QxumPB6u4Z2b4vv7vPerX56LvFqk5cq6kGAc4LZhxG5o3g3Fi9B4dgUVup9yo6KUzrpTXBeuPRgRGAUggrIXoLM_L6302IuLuM6eTG6-5-Df4A2adCfg</recordid><startdate>2002</startdate><enddate>2002</enddate><creator>Comparini, M.</creator><creator>Di Pasquale, A.</creator><creator>Feudale, M.</creator><creator>Giorgio, A.</creator><creator>Perri, A.G.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2002</creationdate><title>A method to design MMICs for high production yields</title><author>Comparini, M. ; Di Pasquale, A. ; Feudale, M. ; Giorgio, A. ; Perri, A.G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-323ac208aef0c8211897b3ae39e7947b5fa4286c498d9c8cea3823e422943fc93</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Circuit topology</topic><topic>Design methodology</topic><topic>Design optimization</topic><topic>Integrated circuit yield</topic><topic>Microwave integrated circuits</topic><topic>Microwave theory and techniques</topic><topic>MMICs</topic><topic>Monolithic integrated circuits</topic><topic>Production</topic><topic>Sensitivity analysis</topic><toplevel>online_resources</toplevel><creatorcontrib>Comparini, M.</creatorcontrib><creatorcontrib>Di Pasquale, A.</creatorcontrib><creatorcontrib>Feudale, M.</creatorcontrib><creatorcontrib>Giorgio, A.</creatorcontrib><creatorcontrib>Perri, A.G.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Comparini, M.</au><au>Di Pasquale, A.</au><au>Feudale, M.</au><au>Giorgio, A.</au><au>Perri, A.G.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>A method to design MMICs for high production yields</atitle><btitle>9th International Conference on Electronics, Circuits and Systems</btitle><stitle>ICECS</stitle><date>2002</date><risdate>2002</risdate><volume>2</volume><spage>421</spage><epage>424 vol.2</epage><pages>421-424 vol.2</pages><isbn>9780780375963</isbn><isbn>0780375963</isbn><abstract>In this paper, a MMIC (monolithic microwave integrated circuit) design technique, oriented to the optimization of the production yields, is illustrated. This method, based on a sensitivity analysis, i.e. on the circuit behavior for variations of passive elements from their nominal value, and on the contemporary determination of the production yields, allows the identification of the circuit elements to obtain high production yield. Moreover it allows an appropriate choice of the circuit topology. As an example, this technique has been applied to design a MMIC to be employed on equipment where a high number of devices is required.</abstract><pub>IEEE</pub><doi>10.1109/ICECS.2002.1046184</doi></addata></record> |
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subjects | Circuit topology Design methodology Design optimization Integrated circuit yield Microwave integrated circuits Microwave theory and techniques MMICs Monolithic integrated circuits Production Sensitivity analysis |
title | A method to design MMICs for high production yields |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-20T01%3A13%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=A%20method%20to%20design%20MMICs%20for%20high%20production%20yields&rft.btitle=9th%20International%20Conference%20on%20Electronics,%20Circuits%20and%20Systems&rft.au=Comparini,%20M.&rft.date=2002&rft.volume=2&rft.spage=421&rft.epage=424%20vol.2&rft.pages=421-424%20vol.2&rft.isbn=9780780375963&rft.isbn_list=0780375963&rft_id=info:doi/10.1109/ICECS.2002.1046184&rft_dat=%3Cieee_6IE%3E1046184%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1046184&rfr_iscdi=true |