Picosecond carrier dynamics in a-Si/sub 0.5/Ge/sub 0.5/:H measured with a free-electron laser

A picosecond time-resolved pump and probe experiment has been performed on a thin a-Si/sub 0.5/Ge/sub 0.5/:H film using the short optical pulses generated by the superconducting accelerator-pumped free-electron laser (FEL) at Stanford University. The FEL was tuned at 1.5 mu m. The probe beam was at...

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Veröffentlicht in:IEEE journal of quantum electronics 1991-12, Vol.27 (12), p.2714-2717
Hauptverfasser: Fauchet, P.M., Young, D.A., Nighan, W.L., Fortmann, C.M.
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container_issue 12
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container_title IEEE journal of quantum electronics
container_volume 27
creator Fauchet, P.M.
Young, D.A.
Nighan, W.L.
Fortmann, C.M.
description A picosecond time-resolved pump and probe experiment has been performed on a thin a-Si/sub 0.5/Ge/sub 0.5/:H film using the short optical pulses generated by the superconducting accelerator-pumped free-electron laser (FEL) at Stanford University. The FEL was tuned at 1.5 mu m. The probe beam was at the fundamental wavelength, and the pump beam was obtained after frequency doubling. The authors found that the transmission decreases due to photogeneration of carriers and then recovers on a 6 ps time scale. This recovery is the signature of ultrafast carrier recombination. It is faster than in a-Si:H for similar conditions. A possible origin of the difference is discussed.< >
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subjects Acceleration
Free electron lasers
Laser beams
Laser excitation
Laser tuning
Optical films
Optical pulse generation
Optical pulses
Probes
Superconducting films
title Picosecond carrier dynamics in a-Si/sub 0.5/Ge/sub 0.5/:H measured with a free-electron laser
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