Passive Intermodulation on Microstrip Induced by Microstructured Edge

Considering the distributed electrothermal coupling effect, passive intermodulation (PIM) products in very long microstrip lines (MLs) have been deeply studied theoretically and experimentally; however, the complex PIM behaviors of short MLs (SMLs) arising from edge defects are still not well presen...

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Veröffentlicht in:	IEEE transactions on microwave theory and techniques 2024-03, Vol.72 (3), p.1489-1502
Hauptverfasser:	Cao, Zhi, Cai, Yahui, Zhao, Xiaolong, Zhang, Songchang, Zhang, Keyue, Chen, Xiong, He, Yongning
Format:	Artikel
Sprache:	eng
Schlagworte:	Conductors Crystal defects Discontinuous nanoscale defects edge defects Fabrication Image edge detection Intermodulation Intermodulation distortion microscale structures Microstrip Microstrip transmission lines Nonlinearity passive intermodulation (PIM) Sapphire Scanning electron microscopy short microstrip lines (SMLs) Substrates
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