Understanding the link between complex digital devices Soft Error Rate and the running software
Due to their complex architecture, the radiation sensitivity of general-purpose processors is intrinsically linked to the software that is executed. In order to obtain a consistent assessment of the fault tolerance during radiation experiments, it is necessary to have software representative of the...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2023-08, Vol.70 (8), p.1-1 |
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| container_title | IEEE transactions on nuclear science |
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| creator | Noizette, Luc Miller, Florent Colladant, Thierry Helen, Youri Leveugle, Regis |
| description | Due to their complex architecture, the radiation sensitivity of general-purpose processors is intrinsically linked to the software that is executed. In order to obtain a consistent assessment of the fault tolerance during radiation experiments, it is necessary to have software representative of the final application. For this purpose, we are developing a methodology based on the application profiling tool that allows us to have a detailed view of the use of hardware resources according to the software profile. This analysis flow has been applied on a RISC-V softcore for different applications allowing us to formulate a link between the fault tolerance and the software profile. |
| doi_str_mv | 10.1109/TNS.2023.3284899 |
| format | Article |
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| source | IEEE Electronic Library (IEL) |
| subjects | Complex Digital Devices Computer architecture Engineering Sciences Fault tolerance Fault tolerant systems Hardware Instruction sets (computers) Logic gates Micro and nanotechnologies Microelectronics Program processors Radiation RISC RISC-V SER Soft errors Software Software Profiling Virtual Platform |
| title | Understanding the link between complex digital devices Soft Error Rate and the running software |
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