A Survey on Unsupervised Anomaly Detection Algorithms for Industrial Images
In line with the development of Industry 4.0, surface defect detection/anomaly detection becomes topical subject in industry field. Improving efficiency as well as saving labor costs has steadily become a matter of great concern in practice, where deep learning-based algorithms perform better than t...
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description | In line with the development of Industry 4.0, surface defect detection/anomaly detection becomes topical subject in industry field. Improving efficiency as well as saving labor costs has steadily become a matter of great concern in practice, where deep learning-based algorithms perform better than traditional vision inspection methods in recent years. While existing deep learning-based algorithms are biased towards supervised learning, which not only necessitates a huge amount of labeled data and human labor, but also brings about inefficiency and limitations. In contrast, recent research shows that unsupervised learning has great potential in tackling above disadvantages for visual industrial anomaly detection. In this survey, we summarize current challenges and provide a thorough overview of recently proposed unsupervised algorithms for visual industrial anomaly detection covering five categories, whose innovation points and frameworks are described in detail. Meanwhile, publicly available datasets for industrial anomaly detection are introduced. By comparing different classes of methods, the advantages and disadvantages of anomaly detection algorithms are summarized. Based on the current research framework, we point out the core issue that remains to be resolved and provide further improvement directions. Meanwhile based on the latest technological trends, we offer insights into future research directions. It is expected to assist both the research community and industry in developing a broader and cross-domain perspective. |
doi_str_mv | 10.1109/ACCESS.2023.3282993 |
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fullrecord | <record><control><sourceid>proquest_ieee_</sourceid><recordid>TN_cdi_ieee_primary_10144292</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>10144292</ieee_id><doaj_id>oai_doaj_org_article_cfae3510ae1f46be90205e15c33966f5</doaj_id><sourcerecordid>2824110474</sourcerecordid><originalsourceid>FETCH-LOGICAL-c409t-658c6d9c80ffa3818159aa91e8f03fcf898cb19a71cb5755c3ba4f9688eb780a3</originalsourceid><addsrcrecordid>eNpNUcFOwzAMrRBITLAvgEMlzh1J07TJsSoDKiZxGDtHaeqMTm0zknbS_p6MTmi-2Hr2e7b8guABowXGiD_nRbFcrxcxismCxCzmnFwFsxinPCKUpNcX9W0wd26HfDAP0WwWfOTherQHOIamDze9G_dgD42DOsx708n2GL7AAGpofDtvt8Y2w3fnQm1sWPb16AbbyDYsO7kFdx_caNk6mJ_zXbB5XX4V79Hq860s8lWkEsSHKKVMpTVXDGktCcMMUy4lx8A0IlppxpmqMJcZVhXNKFWkkonmKWNQZQxJcheUk25t5E7sbdNJexRGNuIPMHYrpB0a1YJQWgKhGEnAOkkr4ChGFLDXJDxNNfVaT5PW3pqfEdwgdma0vT9f-Fcm_sFJlvgpMk0pa5yzoP-3YiROJojJBHEyQZxN8KzHidUAwAUDJ0nMY_ILS9uCjw</addsrcrecordid><sourcetype>Open Website</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2824110474</pqid></control><display><type>article</type><title>A Survey on Unsupervised Anomaly Detection Algorithms for Industrial Images</title><source>IEEE Open Access Journals</source><source>DOAJ Directory of Open Access Journals</source><source>EZB-FREE-00999 freely available EZB journals</source><creator>Cui, Yajie ; Liu, Zhaoxiang ; Lian, Shiguo</creator><creatorcontrib>Cui, Yajie ; Liu, Zhaoxiang ; Lian, Shiguo</creatorcontrib><description>In line with the development of Industry 4.0, surface defect detection/anomaly detection becomes topical subject in industry field. Improving efficiency as well as saving labor costs has steadily become a matter of great concern in practice, where deep learning-based algorithms perform better than traditional vision inspection methods in recent years. While existing deep learning-based algorithms are biased towards supervised learning, which not only necessitates a huge amount of labeled data and human labor, but also brings about inefficiency and limitations. In contrast, recent research shows that unsupervised learning has great potential in tackling above disadvantages for visual industrial anomaly detection. In this survey, we summarize current challenges and provide a thorough overview of recently proposed unsupervised algorithms for visual industrial anomaly detection covering five categories, whose innovation points and frameworks are described in detail. Meanwhile, publicly available datasets for industrial anomaly detection are introduced. By comparing different classes of methods, the advantages and disadvantages of anomaly detection algorithms are summarized. Based on the current research framework, we point out the core issue that remains to be resolved and provide further improvement directions. Meanwhile based on the latest technological trends, we offer insights into future research directions. It is expected to assist both the research community and industry in developing a broader and cross-domain perspective.</description><identifier>ISSN: 2169-3536</identifier><identifier>EISSN: 2169-3536</identifier><identifier>DOI: 10.1109/ACCESS.2023.3282993</identifier><identifier>CODEN: IAECCG</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Algorithms ; Anomalies ; Anomaly detection ; Deep learning ; Filter banks ; Gabor filters ; Industrial Anomaly detection ; Industrial development ; Industry 4.0 ; Inspection ; Labor ; Machine learning ; Production ; Supervised learning ; Surface defects ; Surveys ; Unsupervised learning ; Visualization</subject><ispartof>IEEE access, 2023-01, Vol.11, p.1-1</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2023</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c409t-658c6d9c80ffa3818159aa91e8f03fcf898cb19a71cb5755c3ba4f9688eb780a3</citedby><cites>FETCH-LOGICAL-c409t-658c6d9c80ffa3818159aa91e8f03fcf898cb19a71cb5755c3ba4f9688eb780a3</cites><orcidid>0000-0003-2958-898X ; 0000-0002-1267-0277</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10144292$$EHTML$$P50$$Gieee$$Hfree_for_read</linktohtml><link.rule.ids>314,777,781,861,2096,27614,27905,27906,54914</link.rule.ids></links><search><creatorcontrib>Cui, Yajie</creatorcontrib><creatorcontrib>Liu, Zhaoxiang</creatorcontrib><creatorcontrib>Lian, Shiguo</creatorcontrib><title>A Survey on Unsupervised Anomaly Detection Algorithms for Industrial Images</title><title>IEEE access</title><addtitle>Access</addtitle><description>In line with the development of Industry 4.0, surface defect detection/anomaly detection becomes topical subject in industry field. Improving efficiency as well as saving labor costs has steadily become a matter of great concern in practice, where deep learning-based algorithms perform better than traditional vision inspection methods in recent years. While existing deep learning-based algorithms are biased towards supervised learning, which not only necessitates a huge amount of labeled data and human labor, but also brings about inefficiency and limitations. In contrast, recent research shows that unsupervised learning has great potential in tackling above disadvantages for visual industrial anomaly detection. In this survey, we summarize current challenges and provide a thorough overview of recently proposed unsupervised algorithms for visual industrial anomaly detection covering five categories, whose innovation points and frameworks are described in detail. Meanwhile, publicly available datasets for industrial anomaly detection are introduced. By comparing different classes of methods, the advantages and disadvantages of anomaly detection algorithms are summarized. Based on the current research framework, we point out the core issue that remains to be resolved and provide further improvement directions. Meanwhile based on the latest technological trends, we offer insights into future research directions. It is expected to assist both the research community and industry in developing a broader and cross-domain perspective.</description><subject>Algorithms</subject><subject>Anomalies</subject><subject>Anomaly detection</subject><subject>Deep learning</subject><subject>Filter banks</subject><subject>Gabor filters</subject><subject>Industrial Anomaly detection</subject><subject>Industrial development</subject><subject>Industry 4.0</subject><subject>Inspection</subject><subject>Labor</subject><subject>Machine learning</subject><subject>Production</subject><subject>Supervised learning</subject><subject>Surface defects</subject><subject>Surveys</subject><subject>Unsupervised learning</subject><subject>Visualization</subject><issn>2169-3536</issn><issn>2169-3536</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid>ESBDL</sourceid><sourceid>RIE</sourceid><sourceid>DOA</sourceid><recordid>eNpNUcFOwzAMrRBITLAvgEMlzh1J07TJsSoDKiZxGDtHaeqMTm0zknbS_p6MTmi-2Hr2e7b8guABowXGiD_nRbFcrxcxismCxCzmnFwFsxinPCKUpNcX9W0wd26HfDAP0WwWfOTherQHOIamDze9G_dgD42DOsx708n2GL7AAGpofDtvt8Y2w3fnQm1sWPb16AbbyDYsO7kFdx_caNk6mJ_zXbB5XX4V79Hq860s8lWkEsSHKKVMpTVXDGktCcMMUy4lx8A0IlppxpmqMJcZVhXNKFWkkonmKWNQZQxJcheUk25t5E7sbdNJexRGNuIPMHYrpB0a1YJQWgKhGEnAOkkr4ChGFLDXJDxNNfVaT5PW3pqfEdwgdma0vT9f-Fcm_sFJlvgpMk0pa5yzoP-3YiROJojJBHEyQZxN8KzHidUAwAUDJ0nMY_ILS9uCjw</recordid><startdate>20230101</startdate><enddate>20230101</enddate><creator>Cui, Yajie</creator><creator>Liu, Zhaoxiang</creator><creator>Lian, Shiguo</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>ESBDL</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>DOA</scope><orcidid>https://orcid.org/0000-0003-2958-898X</orcidid><orcidid>https://orcid.org/0000-0002-1267-0277</orcidid></search><sort><creationdate>20230101</creationdate><title>A Survey on Unsupervised Anomaly Detection Algorithms for Industrial Images</title><author>Cui, Yajie ; Liu, Zhaoxiang ; Lian, Shiguo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c409t-658c6d9c80ffa3818159aa91e8f03fcf898cb19a71cb5755c3ba4f9688eb780a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Algorithms</topic><topic>Anomalies</topic><topic>Anomaly detection</topic><topic>Deep learning</topic><topic>Filter banks</topic><topic>Gabor filters</topic><topic>Industrial Anomaly detection</topic><topic>Industrial development</topic><topic>Industry 4.0</topic><topic>Inspection</topic><topic>Labor</topic><topic>Machine learning</topic><topic>Production</topic><topic>Supervised learning</topic><topic>Surface defects</topic><topic>Surveys</topic><topic>Unsupervised learning</topic><topic>Visualization</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cui, Yajie</creatorcontrib><creatorcontrib>Liu, Zhaoxiang</creatorcontrib><creatorcontrib>Lian, Shiguo</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE Open Access Journals</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>DOAJ Directory of Open Access Journals</collection><jtitle>IEEE access</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cui, Yajie</au><au>Liu, Zhaoxiang</au><au>Lian, Shiguo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Survey on Unsupervised Anomaly Detection Algorithms for Industrial Images</atitle><jtitle>IEEE access</jtitle><stitle>Access</stitle><date>2023-01-01</date><risdate>2023</risdate><volume>11</volume><spage>1</spage><epage>1</epage><pages>1-1</pages><issn>2169-3536</issn><eissn>2169-3536</eissn><coden>IAECCG</coden><abstract>In line with the development of Industry 4.0, surface defect detection/anomaly detection becomes topical subject in industry field. Improving efficiency as well as saving labor costs has steadily become a matter of great concern in practice, where deep learning-based algorithms perform better than traditional vision inspection methods in recent years. While existing deep learning-based algorithms are biased towards supervised learning, which not only necessitates a huge amount of labeled data and human labor, but also brings about inefficiency and limitations. In contrast, recent research shows that unsupervised learning has great potential in tackling above disadvantages for visual industrial anomaly detection. In this survey, we summarize current challenges and provide a thorough overview of recently proposed unsupervised algorithms for visual industrial anomaly detection covering five categories, whose innovation points and frameworks are described in detail. Meanwhile, publicly available datasets for industrial anomaly detection are introduced. By comparing different classes of methods, the advantages and disadvantages of anomaly detection algorithms are summarized. Based on the current research framework, we point out the core issue that remains to be resolved and provide further improvement directions. Meanwhile based on the latest technological trends, we offer insights into future research directions. It is expected to assist both the research community and industry in developing a broader and cross-domain perspective.</abstract><cop>Piscataway</cop><pub>IEEE</pub><doi>10.1109/ACCESS.2023.3282993</doi><tpages>1</tpages><orcidid>https://orcid.org/0000-0003-2958-898X</orcidid><orcidid>https://orcid.org/0000-0002-1267-0277</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Algorithms Anomalies Anomaly detection Deep learning Filter banks Gabor filters Industrial Anomaly detection Industrial development Industry 4.0 Inspection Labor Machine learning Production Supervised learning Surface defects Surveys Unsupervised learning Visualization |
title | A Survey on Unsupervised Anomaly Detection Algorithms for Industrial Images |
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