A Novel 550-fs Time-Resolution 7.5-bit Stochastic Time-to-Digital Converter Based on Two Arbiter Groups
This paper presents a novel two arbiter groups based stochastic time-to-digital converter (STDC) to achieve a better linearity and larger measurement range compared to a traditional STDC. Traditional STDCs with one arbiter group have a bad linearity and narrow measurement range, for the nonlinear ti...
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Veröffentlicht in: | IEEE transactions on instrumentation and measurement 2023-01, Vol.72, p.1-1 |
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description | This paper presents a novel two arbiter groups based stochastic time-to-digital converter (STDC) to achieve a better linearity and larger measurement range compared to a traditional STDC. Traditional STDCs with one arbiter group have a bad linearity and narrow measurement range, for the nonlinear time-to-digital transfer function that described by a Gaussian cumulative distribution function (CDF). To improve the linearity, a basic two arbiter groups based STDC is proposed firstly. Through properly shifting the time offset distributions of the two arbiter groups away from each other by applying a global time offset reference to them, a virtual uniform distribution could be formed between the two shifted time offset mean values. To achieve a large measurement range, a dual-input dual-output periodic signal generator (DIDO-PSG) and a global time offset setting circuit (GTOSC) are further designed for the proposed STDC to obtain two pairs of time offset distributions with twice measurements for one input time interval. Through properly setting the mean values of the four time-offset distributions based on GTOSC, an overall transfer function with a large linear part that contributes to a good linearity could be achieved. Finally, a test chip prototype fabricated in a 0.18-μm CMOS technology demonstrates 550-fs time resolution and 0.105-ns measurement range with -1.81 LSB INL at 50MS/s, which is much better than traditional STDCs. |
doi_str_mv | 10.1109/TIM.2023.3282263 |
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Traditional STDCs with one arbiter group have a bad linearity and narrow measurement range, for the nonlinear time-to-digital transfer function that described by a Gaussian cumulative distribution function (CDF). To improve the linearity, a basic two arbiter groups based STDC is proposed firstly. Through properly shifting the time offset distributions of the two arbiter groups away from each other by applying a global time offset reference to them, a virtual uniform distribution could be formed between the two shifted time offset mean values. To achieve a large measurement range, a dual-input dual-output periodic signal generator (DIDO-PSG) and a global time offset setting circuit (GTOSC) are further designed for the proposed STDC to obtain two pairs of time offset distributions with twice measurements for one input time interval. Through properly setting the mean values of the four time-offset distributions based on GTOSC, an overall transfer function with a large linear part that contributes to a good linearity could be achieved. Finally, a test chip prototype fabricated in a 0.18-μm CMOS technology demonstrates 550-fs time resolution and 0.105-ns measurement range with -1.81 LSB INL at 50MS/s, which is much better than traditional STDCs.</description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/TIM.2023.3282263</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>arbiter group ; Circuit design ; Delays ; Distribution functions ; dual-input dual-output periodic signal generator (DIDO-PSG) ; Gaussian distribution ; global time offset reference ; Linearity ; Normal distribution ; Semiconductor device measurement ; Signal generators ; Signal resolution ; stochastic time-to-digital converter (STDC) ; Time measurement ; time offset ; time-to-digital converter (TDC) ; Transfer functions ; ultra-fine time resolution</subject><ispartof>IEEE transactions on instrumentation and measurement, 2023-01, Vol.72, p.1-1</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2023</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c245t-daaf2784f04a85e1fb6c6fd208078ea1c885b2ec6698c386832f4ffc8842d9003</cites><orcidid>0000-0003-2999-2202 ; 0000-0002-8319-9128 ; 0000-0003-4231-8669</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10143272$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27922,27923,54756</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10143272$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Liu, Mingming</creatorcontrib><creatorcontrib>Lai, Xinquan</creatorcontrib><creatorcontrib>Wang, Yuheng</creatorcontrib><title>A Novel 550-fs Time-Resolution 7.5-bit Stochastic Time-to-Digital Converter Based on Two Arbiter Groups</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>This paper presents a novel two arbiter groups based stochastic time-to-digital converter (STDC) to achieve a better linearity and larger measurement range compared to a traditional STDC. Traditional STDCs with one arbiter group have a bad linearity and narrow measurement range, for the nonlinear time-to-digital transfer function that described by a Gaussian cumulative distribution function (CDF). To improve the linearity, a basic two arbiter groups based STDC is proposed firstly. Through properly shifting the time offset distributions of the two arbiter groups away from each other by applying a global time offset reference to them, a virtual uniform distribution could be formed between the two shifted time offset mean values. To achieve a large measurement range, a dual-input dual-output periodic signal generator (DIDO-PSG) and a global time offset setting circuit (GTOSC) are further designed for the proposed STDC to obtain two pairs of time offset distributions with twice measurements for one input time interval. Through properly setting the mean values of the four time-offset distributions based on GTOSC, an overall transfer function with a large linear part that contributes to a good linearity could be achieved. Finally, a test chip prototype fabricated in a 0.18-μm CMOS technology demonstrates 550-fs time resolution and 0.105-ns measurement range with -1.81 LSB INL at 50MS/s, which is much better than traditional STDCs.</description><subject>arbiter group</subject><subject>Circuit design</subject><subject>Delays</subject><subject>Distribution functions</subject><subject>dual-input dual-output periodic signal generator (DIDO-PSG)</subject><subject>Gaussian distribution</subject><subject>global time offset reference</subject><subject>Linearity</subject><subject>Normal distribution</subject><subject>Semiconductor device measurement</subject><subject>Signal generators</subject><subject>Signal resolution</subject><subject>stochastic time-to-digital converter (STDC)</subject><subject>Time measurement</subject><subject>time offset</subject><subject>time-to-digital converter (TDC)</subject><subject>Transfer functions</subject><subject>ultra-fine time resolution</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkD1PwzAURS0EEqWwMzBYYnbwd5yxFCiVCkgQ5shN7JIqrYvtFPHvcZUOTE-6uuc9vQPANcEZIbi4K-cvGcWUZYwqSiU7ASMiRI4KKekpGGFMFCq4kOfgIoQ1xjiXPB-B1QS-ur3poBAY2QDLdmPQuwmu62PrtjDPBFq2EX5EV3_pENt6qESHHtpVG3UHp267Nz4aD-91MA1MVPnj4MQnLoUz7_pduARnVnfBXB3nGHw-PZbTZ7R4m82nkwWqKRcRNVpbmituMddKGGKXspa2oVjhXBlNaqXEkppaykLVTEnFqOXWppjTpsCYjcHtsHfn3XdvQqzWrvfbdLJKXtLLgnOWWnho1d6F4I2tdr7daP9bEVwddFZJZ3XQWR11JuRmQFpjzL864YzmlP0Bw_FvTA</recordid><startdate>20230101</startdate><enddate>20230101</enddate><creator>Liu, Mingming</creator><creator>Lai, Xinquan</creator><creator>Wang, Yuheng</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0003-2999-2202</orcidid><orcidid>https://orcid.org/0000-0002-8319-9128</orcidid><orcidid>https://orcid.org/0000-0003-4231-8669</orcidid></search><sort><creationdate>20230101</creationdate><title>A Novel 550-fs Time-Resolution 7.5-bit Stochastic Time-to-Digital Converter Based on Two Arbiter Groups</title><author>Liu, Mingming ; Lai, Xinquan ; Wang, Yuheng</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c245t-daaf2784f04a85e1fb6c6fd208078ea1c885b2ec6698c386832f4ffc8842d9003</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>arbiter group</topic><topic>Circuit design</topic><topic>Delays</topic><topic>Distribution functions</topic><topic>dual-input dual-output periodic signal generator (DIDO-PSG)</topic><topic>Gaussian distribution</topic><topic>global time offset reference</topic><topic>Linearity</topic><topic>Normal distribution</topic><topic>Semiconductor device measurement</topic><topic>Signal generators</topic><topic>Signal resolution</topic><topic>stochastic time-to-digital converter (STDC)</topic><topic>Time measurement</topic><topic>time offset</topic><topic>time-to-digital converter (TDC)</topic><topic>Transfer functions</topic><topic>ultra-fine time resolution</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Liu, Mingming</creatorcontrib><creatorcontrib>Lai, Xinquan</creatorcontrib><creatorcontrib>Wang, Yuheng</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Liu, Mingming</au><au>Lai, Xinquan</au><au>Wang, Yuheng</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Novel 550-fs Time-Resolution 7.5-bit Stochastic Time-to-Digital Converter Based on Two Arbiter Groups</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>2023-01-01</date><risdate>2023</risdate><volume>72</volume><spage>1</spage><epage>1</epage><pages>1-1</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>This paper presents a novel two arbiter groups based stochastic time-to-digital converter (STDC) to achieve a better linearity and larger measurement range compared to a traditional STDC. Traditional STDCs with one arbiter group have a bad linearity and narrow measurement range, for the nonlinear time-to-digital transfer function that described by a Gaussian cumulative distribution function (CDF). To improve the linearity, a basic two arbiter groups based STDC is proposed firstly. Through properly shifting the time offset distributions of the two arbiter groups away from each other by applying a global time offset reference to them, a virtual uniform distribution could be formed between the two shifted time offset mean values. To achieve a large measurement range, a dual-input dual-output periodic signal generator (DIDO-PSG) and a global time offset setting circuit (GTOSC) are further designed for the proposed STDC to obtain two pairs of time offset distributions with twice measurements for one input time interval. Through properly setting the mean values of the four time-offset distributions based on GTOSC, an overall transfer function with a large linear part that contributes to a good linearity could be achieved. Finally, a test chip prototype fabricated in a 0.18-μm CMOS technology demonstrates 550-fs time resolution and 0.105-ns measurement range with -1.81 LSB INL at 50MS/s, which is much better than traditional STDCs.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TIM.2023.3282263</doi><tpages>1</tpages><orcidid>https://orcid.org/0000-0003-2999-2202</orcidid><orcidid>https://orcid.org/0000-0002-8319-9128</orcidid><orcidid>https://orcid.org/0000-0003-4231-8669</orcidid></addata></record> |
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subjects | arbiter group Circuit design Delays Distribution functions dual-input dual-output periodic signal generator (DIDO-PSG) Gaussian distribution global time offset reference Linearity Normal distribution Semiconductor device measurement Signal generators Signal resolution stochastic time-to-digital converter (STDC) Time measurement time offset time-to-digital converter (TDC) Transfer functions ultra-fine time resolution |
title | A Novel 550-fs Time-Resolution 7.5-bit Stochastic Time-to-Digital Converter Based on Two Arbiter Groups |
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