Aging-aware Critical Path Selection via Graph Attention Networks

In advanced technology nodes, aging effects like negative and positive bias temperature instability (NBTI and PBTI) become increasingly significant, making timing closure and optimization more challenging. Unfortunately, conventional critical path selection tools used in reliability-aware design flo...

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Veröffentlicht in:	IEEE transactions on computer-aided design of integrated circuits and systems 2023-12, Vol.42 (12), p.1-1
Hauptverfasser:	Ye, Yuyang, Chen, Tinghuan, Gao, Yifei, Yan, Hao, Yu, Bei, Shi, Longxing
Format:	Artikel
Sprache:	eng
Schlagworte:	Aging Algorithms Circuits Computation Critical path Degradation Delays Integrated circuit modeling Libraries Machine learning Reliability SPICE
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