Vector corrected noise temperature measurements
A new one-port technique for measuring noise temperature is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port measurements of noise temperature made with commercial systems is demonstrated without using isolators. Equations for correcting mismatch erro...
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| Veröffentlicht in: | 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278) 2002, Vol.3, p.2253-2256 vol.3 |
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| container_end_page | 2256 vol.3 |
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| container_start_page | 2253 |
| container_title | 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278) |
| container_volume | 3 |
| creator | Weatherspoon, M.H. Dunleavy, L.P. Boudiaf, A. Randa, J. |
| description | A new one-port technique for measuring noise temperature is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port measurements of noise temperature made with commercial systems is demonstrated without using isolators. Equations for correcting mismatch errors are developed as part of the available vector noise temperature equation. Results, presented for a C-band solid-state cold noise source and a pair of microwave solid-state noise diodes, are shown to be in good agreement with radiometric measurements of the same sources. |
| doi_str_mv | 10.1109/MWSYM.2002.1012322 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_6IE</sourceid><recordid>TN_cdi_ieee_primary_1012322</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1012322</ieee_id><sourcerecordid>27789572</sourcerecordid><originalsourceid>FETCH-LOGICAL-i248t-fcda0a7f1e512c31a867f03eb4f54ae49ddfa38a5257b54dbf89ca15c240d0523</originalsourceid><addsrcrecordid>eNotUMlqwzAUFF2gJs0PtBeferPz9CRZ0rGEbpDQQ_eTUeQncIljV3IO_fu6JMPAzGEYhmHsikPJOdjF-uPla10iAJYcOArEE5ah0lWhkVenbG61gYlCo7D2jGXApS0qqT4v2Dylb5ggFVgQGVu8kx_7mPs-xslRk-_6NlE-UjdQdOM-Ut6RS5N2tBvTJTsPbptoftQZe7u_e10-Fqvnh6fl7apoUZqxCL5x4HTgpDh6wZ2pdABBGxmUdCRt0wQnjFPT7I2SzSYY6x1XHiU0oFDM2M2hd4j9z57SWHdt8rTduh31-1Sj1sYq_R-8PgRbIqqH2HYu_tbHX8Qfx59U7A</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>27789572</pqid></control><display><type>article</type><title>Vector corrected noise temperature measurements</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Weatherspoon, M.H. ; Dunleavy, L.P. ; Boudiaf, A. ; Randa, J.</creator><creatorcontrib>Weatherspoon, M.H. ; Dunleavy, L.P. ; Boudiaf, A. ; Randa, J.</creatorcontrib><description>A new one-port technique for measuring noise temperature is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port measurements of noise temperature made with commercial systems is demonstrated without using isolators. Equations for correcting mismatch errors are developed as part of the available vector noise temperature equation. Results, presented for a C-band solid-state cold noise source and a pair of microwave solid-state noise diodes, are shown to be in good agreement with radiometric measurements of the same sources.</description><identifier>ISSN: 0149-645X</identifier><identifier>ISBN: 9780780372399</identifier><identifier>ISBN: 0780372395</identifier><identifier>EISSN: 2576-7216</identifier><identifier>DOI: 10.1109/MWSYM.2002.1012322</identifier><language>eng</language><publisher>IEEE</publisher><subject>Diodes ; Error correction ; Isolators ; Microwave radiometry ; NIST ; Noise figure ; Noise measurement ; Performance evaluation ; Temperature measurement ; USA Councils</subject><ispartof>2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278), 2002, Vol.3, p.2253-2256 vol.3</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1012322$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1012322$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Weatherspoon, M.H.</creatorcontrib><creatorcontrib>Dunleavy, L.P.</creatorcontrib><creatorcontrib>Boudiaf, A.</creatorcontrib><creatorcontrib>Randa, J.</creatorcontrib><title>Vector corrected noise temperature measurements</title><title>2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278)</title><addtitle>MWSYM</addtitle><description>A new one-port technique for measuring noise temperature is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port measurements of noise temperature made with commercial systems is demonstrated without using isolators. Equations for correcting mismatch errors are developed as part of the available vector noise temperature equation. Results, presented for a C-band solid-state cold noise source and a pair of microwave solid-state noise diodes, are shown to be in good agreement with radiometric measurements of the same sources.</description><subject>Diodes</subject><subject>Error correction</subject><subject>Isolators</subject><subject>Microwave radiometry</subject><subject>NIST</subject><subject>Noise figure</subject><subject>Noise measurement</subject><subject>Performance evaluation</subject><subject>Temperature measurement</subject><subject>USA Councils</subject><issn>0149-645X</issn><issn>2576-7216</issn><isbn>9780780372399</isbn><isbn>0780372395</isbn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotUMlqwzAUFF2gJs0PtBeferPz9CRZ0rGEbpDQQ_eTUeQncIljV3IO_fu6JMPAzGEYhmHsikPJOdjF-uPla10iAJYcOArEE5ah0lWhkVenbG61gYlCo7D2jGXApS0qqT4v2Dylb5ggFVgQGVu8kx_7mPs-xslRk-_6NlE-UjdQdOM-Ut6RS5N2tBvTJTsPbptoftQZe7u_e10-Fqvnh6fl7apoUZqxCL5x4HTgpDh6wZ2pdABBGxmUdCRt0wQnjFPT7I2SzSYY6x1XHiU0oFDM2M2hd4j9z57SWHdt8rTduh31-1Sj1sYq_R-8PgRbIqqH2HYu_tbHX8Qfx59U7A</recordid><startdate>2002</startdate><enddate>2002</enddate><creator>Weatherspoon, M.H.</creator><creator>Dunleavy, L.P.</creator><creator>Boudiaf, A.</creator><creator>Randa, J.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>2002</creationdate><title>Vector corrected noise temperature measurements</title><author>Weatherspoon, M.H. ; Dunleavy, L.P. ; Boudiaf, A. ; Randa, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i248t-fcda0a7f1e512c31a867f03eb4f54ae49ddfa38a5257b54dbf89ca15c240d0523</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Diodes</topic><topic>Error correction</topic><topic>Isolators</topic><topic>Microwave radiometry</topic><topic>NIST</topic><topic>Noise figure</topic><topic>Noise measurement</topic><topic>Performance evaluation</topic><topic>Temperature measurement</topic><topic>USA Councils</topic><toplevel>online_resources</toplevel><creatorcontrib>Weatherspoon, M.H.</creatorcontrib><creatorcontrib>Dunleavy, L.P.</creatorcontrib><creatorcontrib>Boudiaf, A.</creatorcontrib><creatorcontrib>Randa, J.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Weatherspoon, M.H.</au><au>Dunleavy, L.P.</au><au>Boudiaf, A.</au><au>Randa, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Vector corrected noise temperature measurements</atitle><jtitle>2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278)</jtitle><stitle>MWSYM</stitle><date>2002</date><risdate>2002</risdate><volume>3</volume><spage>2253</spage><epage>2256 vol.3</epage><pages>2253-2256 vol.3</pages><issn>0149-645X</issn><eissn>2576-7216</eissn><isbn>9780780372399</isbn><isbn>0780372395</isbn><abstract>A new one-port technique for measuring noise temperature is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port measurements of noise temperature made with commercial systems is demonstrated without using isolators. Equations for correcting mismatch errors are developed as part of the available vector noise temperature equation. Results, presented for a C-band solid-state cold noise source and a pair of microwave solid-state noise diodes, are shown to be in good agreement with radiometric measurements of the same sources.</abstract><pub>IEEE</pub><doi>10.1109/MWSYM.2002.1012322</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record> |
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| identifier | ISSN: 0149-645X |
| ispartof | 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278), 2002, Vol.3, p.2253-2256 vol.3 |
| issn | 0149-645X 2576-7216 |
| language | eng |
| recordid | cdi_ieee_primary_1012322 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Diodes Error correction Isolators Microwave radiometry NIST Noise figure Noise measurement Performance evaluation Temperature measurement USA Councils |
| title | Vector corrected noise temperature measurements |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T17%3A48%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Vector%20corrected%20noise%20temperature%20measurements&rft.jtitle=2002%20IEEE%20MTT-S%20International%20Microwave%20Symposium%20Digest%20(Cat.%20No.02CH37278)&rft.au=Weatherspoon,%20M.H.&rft.date=2002&rft.volume=3&rft.spage=2253&rft.epage=2256%20vol.3&rft.pages=2253-2256%20vol.3&rft.issn=0149-645X&rft.eissn=2576-7216&rft.isbn=9780780372399&rft.isbn_list=0780372395&rft_id=info:doi/10.1109/MWSYM.2002.1012322&rft_dat=%3Cproquest_6IE%3E27789572%3C/proquest_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=27789572&rft_id=info:pmid/&rft_ieee_id=1012322&rfr_iscdi=true |