Dielectric sleeve resonator techniques for variable-temperature microwave characterization of ferroelectric materials

Low-loss sleeve resonators can be used for accurate microwave dielectric characterization of rod-shaped test specimens. The test specimen is inserted into the dielectric sleeve resonator and placed centrally in a metal cavity. With the use of additional sleeve resonators having differing external di...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Geyer, R.G., Kabos, P., Baker-Jarvis, J.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Closed-form solution Dielectric loss measurement Dielectric losses Dielectric measurements Frequency Permittivity measurement Resonance Tellurium Temperature Testing
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!