Experimental and Equivalent Circuit Analysis Approach to Estimate Contact Resistances on Different Sections in a D-Shaped NI HTS Coil
With well-known self-protecting behaviors of no-insulation (NI) high temperature superconductor (HTS) coils, their performance was verified by numerous high field magnets. As one of the initial investigations of the NI HTS technique being applied to toroidal field (TF) coils, an equivalent circuit a...
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| Veröffentlicht in: | IEEE transactions on applied superconductivity 2023-08, Vol.33 (5), p.1-5 |
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| container_title | IEEE transactions on applied superconductivity |
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| creator | Lee, Jung Tae Kim, Geonyoung Kim, Jaemin Bang, Jeseok Im, Chaemin Jang, Wonseok Choi, Kibum Yoon, Miyeon Kim, Woo-Seok Hahn, Seungyong |
| description | With well-known self-protecting behaviors of no-insulation (NI) high temperature superconductor (HTS) coils, their performance was verified by numerous high field magnets. As one of the initial investigations of the NI HTS technique being applied to toroidal field (TF) coils, an equivalent circuit analysis is carried out on a D-shaped NI HTS coil to predict its electromagnetic behaviors regarding the contact resistance, one of the most important parameters for NI HTS coils. A charging/discharging test is performed at 77 K to obtain the experimental data for contact resistance estimation. Using the measured voltage and the pressure dependency of surface contact resistivity, a combination of contact resistance is obtained through the modified lumped circuit and the partial element equivalent circuit simulation by which the shape-dependent contact resistance can be estimated. The results are expected to provide a source for careful management in the design stage to consider the uneven contact resistance and possible uneven electromagnetic behavior among different sections of the TF coil. |
| doi_str_mv | 10.1109/TASC.2023.3262217 |
| format | Article |
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As one of the initial investigations of the NI HTS technique being applied to toroidal field (TF) coils, an equivalent circuit analysis is carried out on a D-shaped NI HTS coil to predict its electromagnetic behaviors regarding the contact resistance, one of the most important parameters for NI HTS coils. A charging/discharging test is performed at 77 K to obtain the experimental data for contact resistance estimation. Using the measured voltage and the pressure dependency of surface contact resistivity, a combination of contact resistance is obtained through the modified lumped circuit and the partial element equivalent circuit simulation by which the shape-dependent contact resistance can be estimated. The results are expected to provide a source for careful management in the design stage to consider the uneven contact resistance and possible uneven electromagnetic behavior among different sections of the TF coil.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/TASC.2023.3262217</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Coils ; Computational modeling ; Contact pressure ; Contact resistance ; D-shaped coil ; Electrical measurement ; Electromagnetic properties ; equivalent circuit analysis ; Equivalent circuits ; High field magnets ; high temperature superconductor ; High temperature superconductors ; Integrated circuit modeling ; Load modeling ; no-insulation coil ; Pressure dependence ; Windings</subject><ispartof>IEEE transactions on applied superconductivity, 2023-08, Vol.33 (5), p.1-5</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2023</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c294t-71a766e01cb487202713556361a4a415a3fc003bad94db3b89e454d11eb352bc3</citedby><cites>FETCH-LOGICAL-c294t-71a766e01cb487202713556361a4a415a3fc003bad94db3b89e454d11eb352bc3</cites><orcidid>0000-0001-6394-5325 ; 0000-0003-3633-9455 ; 0000-0002-4511-4162 ; 0000-0002-2082-2015 ; 0000-0002-4761-6334 ; 0000-0001-7311-1383 ; 0000-0003-4785-3804 ; 0000-0002-3591-9805 ; 0009-0008-9815-6949</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10081445$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10081445$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Lee, Jung Tae</creatorcontrib><creatorcontrib>Kim, Geonyoung</creatorcontrib><creatorcontrib>Kim, Jaemin</creatorcontrib><creatorcontrib>Bang, Jeseok</creatorcontrib><creatorcontrib>Im, Chaemin</creatorcontrib><creatorcontrib>Jang, Wonseok</creatorcontrib><creatorcontrib>Choi, Kibum</creatorcontrib><creatorcontrib>Yoon, Miyeon</creatorcontrib><creatorcontrib>Kim, Woo-Seok</creatorcontrib><creatorcontrib>Hahn, Seungyong</creatorcontrib><title>Experimental and Equivalent Circuit Analysis Approach to Estimate Contact Resistances on Different Sections in a D-Shaped NI HTS Coil</title><title>IEEE transactions on applied superconductivity</title><addtitle>TASC</addtitle><description>With well-known self-protecting behaviors of no-insulation (NI) high temperature superconductor (HTS) coils, their performance was verified by numerous high field magnets. 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The results are expected to provide a source for careful management in the design stage to consider the uneven contact resistance and possible uneven electromagnetic behavior among different sections of the TF coil.</description><subject>Coils</subject><subject>Computational modeling</subject><subject>Contact pressure</subject><subject>Contact resistance</subject><subject>D-shaped coil</subject><subject>Electrical measurement</subject><subject>Electromagnetic properties</subject><subject>equivalent circuit analysis</subject><subject>Equivalent circuits</subject><subject>High field magnets</subject><subject>high temperature superconductor</subject><subject>High temperature superconductors</subject><subject>Integrated circuit modeling</subject><subject>Load modeling</subject><subject>no-insulation coil</subject><subject>Pressure dependence</subject><subject>Windings</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkE1Lw0AQhoMoWKs_QPCw4Dl1Zz_ycSxptYWiYOs5bDYTuiVN0uxG7A_wf7ulPXiaYXjegfcJgkegEwCavmym62zCKOMTziLGIL4KRiBlEjIJ8trvVEKYMMZvgztrd5SCSIQcBb_znw57s8fGqZqopiTzw2C-Ve0PJDO9Howj00bVR2ssmXZd3yq9Ja4lc-vMXjkkWeuz2pFP9IhTjUZL2obMTFVhf3qzRu1M21hiGqLILFxvVYcleV-SxWbt46a-D24qVVt8uMxx8PU632SLcPXxtsymq1CzVLgwBhVHEVLQhUhi3zYGLmXEI1BCCZCKV5pSXqgyFWXBiyRFIUUJgAWXrNB8HDyf__oahwGty3ft0Pt2NmcJTVMGIBNPwZnSfWttj1XeeUOqP-ZA85Pt_GQ7P9nOL7Z95umcMYj4j6cJCCH5H-ZHexU</recordid><startdate>20230801</startdate><enddate>20230801</enddate><creator>Lee, Jung Tae</creator><creator>Kim, Geonyoung</creator><creator>Kim, Jaemin</creator><creator>Bang, Jeseok</creator><creator>Im, Chaemin</creator><creator>Jang, Wonseok</creator><creator>Choi, Kibum</creator><creator>Yoon, Miyeon</creator><creator>Kim, Woo-Seok</creator><creator>Hahn, Seungyong</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| source | IEEE Electronic Library (IEL) |
| subjects | Coils Computational modeling Contact pressure Contact resistance D-shaped coil Electrical measurement Electromagnetic properties equivalent circuit analysis Equivalent circuits High field magnets high temperature superconductor High temperature superconductors Integrated circuit modeling Load modeling no-insulation coil Pressure dependence Windings |
| title | Experimental and Equivalent Circuit Analysis Approach to Estimate Contact Resistances on Different Sections in a D-Shaped NI HTS Coil |
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