Simultaneous Extraction of Mobility Enhancement Factor and Threshold Voltage With Parasitic Resistances in Amorphous Oxide Semiconductor Thin-Film Transistors

This study presents a technique for simultaneous and consistent extraction of the mobility enhancement factor ( \gamma ) and the threshold voltage ( \textit{V}_{\textit{T}} ) with parasitic source and drain resistances ( \textit{R}_{\textit{S}} and \textit{R}_{\textit{D}} ) in amorphous oxide semi...

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