Mechanical and Structural Properties of Graphene Oxide and Reduced Graphene Oxide Doped YBCO
YBCO (Y 1 Ba 2 Cu 3 O 7-δ ) was doped with graphene oxide (GO) and reduced graphene oxide (rGO) in the following percentage weight concentrations: 0.1, 0.5 and 1% wt.. Lattice parameters, crystallite size, orthorhombicity and lattice strain were calculated using XRD analysis. The porosity of samples...
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Veröffentlicht in: | IEEE transactions on applied superconductivity 2023-08, Vol.33 (5), p.1-10 |
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description | YBCO (Y 1 Ba 2 Cu 3 O 7-δ ) was doped with graphene oxide (GO) and reduced graphene oxide (rGO) in the following percentage weight concentrations: 0.1, 0.5 and 1% wt.. Lattice parameters, crystallite size, orthorhombicity and lattice strain were calculated using XRD analysis. The porosity of samples decreased by a maximum of 29% and 17% for GO and rGO doped samples respectively. Microhardness measurements were conducted using the Vickers hardness method at loads in the range of 0.245 - 2.940 N. These micro hardness measurements were used to calculate the Vickers hardness ( H V ), elastic modulus ( E ), yield strength ( Y ), fracture toughness ( K IC ) and brittleness index ( B ) of the material. H V was greater in GO doped samples than in rGO doped samples. E increased by 63.94% for rGO and 85.52% for GO doped samples. Y increased by 63.80% for rGO and 85.40% for GO doped samples. B decreased by 48.11% for rGO and 43.78% for GO doped samples. There was an increase in K IC for both GO and rGO samples. The indentation size effect (ISE) was observed during micro-hardness measurements. This ISE behaviour was analyzed using Meyers Law, PSR model, elastic/plastic deformation model and Hays Kendall model. The results showed that the Hay Kendall approach best described the ISE behaviour of the samples. |
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Z. ; Jarvis, A.L.L ; Swanson, A.</creator><creatorcontrib>Gaffoor, M. Z. ; Jarvis, A.L.L ; Swanson, A.</creatorcontrib><description>YBCO (Y 1 Ba 2 Cu 3 O 7-δ ) was doped with graphene oxide (GO) and reduced graphene oxide (rGO) in the following percentage weight concentrations: 0.1, 0.5 and 1% wt.. Lattice parameters, crystallite size, orthorhombicity and lattice strain were calculated using XRD analysis. The porosity of samples decreased by a maximum of 29% and 17% for GO and rGO doped samples respectively. Microhardness measurements were conducted using the Vickers hardness method at loads in the range of 0.245 - 2.940 N. These micro hardness measurements were used to calculate the Vickers hardness ( H V ), elastic modulus ( E ), yield strength ( Y ), fracture toughness ( K IC ) and brittleness index ( B ) of the material. H V was greater in GO doped samples than in rGO doped samples. E increased by 63.94% for rGO and 85.52% for GO doped samples. Y increased by 63.80% for rGO and 85.40% for GO doped samples. B decreased by 48.11% for rGO and 43.78% for GO doped samples. There was an increase in K IC for both GO and rGO samples. The indentation size effect (ISE) was observed during micro-hardness measurements. This ISE behaviour was analyzed using Meyers Law, PSR model, elastic/plastic deformation model and Hays Kendall model. The results showed that the Hay Kendall approach best described the ISE behaviour of the samples.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/TASC.2023.3253464</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Crystallites ; Deformable models ; Diamond pyramid hardness ; Doping ; Elastic deformation ; Fracture toughness ; Graphene ; graphene oxide ; Heat treating ; Indentation ; Lattice parameters ; Lattice strain ; Lattices ; Mechanical factors ; Modulus of elasticity ; Plastic deformation ; porosity and YBCO ; Size effects ; vickers hardness ; X-ray scattering ; Yttrium barium copper oxide</subject><ispartof>IEEE transactions on applied superconductivity, 2023-08, Vol.33 (5), p.1-10</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2023</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c294t-e27ccb493f352559113f20afb213cf95fac7a84bd905d15e64d76cce8e429cca3</citedby><cites>FETCH-LOGICAL-c294t-e27ccb493f352559113f20afb213cf95fac7a84bd905d15e64d76cce8e429cca3</cites><orcidid>0000-0002-9965-4746 ; 0000-0002-5125-7530 ; 0000-0002-1558-7508</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10061548$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10061548$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Gaffoor, M. Z.</creatorcontrib><creatorcontrib>Jarvis, A.L.L</creatorcontrib><creatorcontrib>Swanson, A.</creatorcontrib><title>Mechanical and Structural Properties of Graphene Oxide and Reduced Graphene Oxide Doped YBCO</title><title>IEEE transactions on applied superconductivity</title><addtitle>TASC</addtitle><description>YBCO (Y 1 Ba 2 Cu 3 O 7-δ ) was doped with graphene oxide (GO) and reduced graphene oxide (rGO) in the following percentage weight concentrations: 0.1, 0.5 and 1% wt.. Lattice parameters, crystallite size, orthorhombicity and lattice strain were calculated using XRD analysis. The porosity of samples decreased by a maximum of 29% and 17% for GO and rGO doped samples respectively. Microhardness measurements were conducted using the Vickers hardness method at loads in the range of 0.245 - 2.940 N. These micro hardness measurements were used to calculate the Vickers hardness ( H V ), elastic modulus ( E ), yield strength ( Y ), fracture toughness ( K IC ) and brittleness index ( B ) of the material. H V was greater in GO doped samples than in rGO doped samples. E increased by 63.94% for rGO and 85.52% for GO doped samples. Y increased by 63.80% for rGO and 85.40% for GO doped samples. B decreased by 48.11% for rGO and 43.78% for GO doped samples. There was an increase in K IC for both GO and rGO samples. The indentation size effect (ISE) was observed during micro-hardness measurements. This ISE behaviour was analyzed using Meyers Law, PSR model, elastic/plastic deformation model and Hays Kendall model. The results showed that the Hay Kendall approach best described the ISE behaviour of the samples.</description><subject>Crystallites</subject><subject>Deformable models</subject><subject>Diamond pyramid hardness</subject><subject>Doping</subject><subject>Elastic deformation</subject><subject>Fracture toughness</subject><subject>Graphene</subject><subject>graphene oxide</subject><subject>Heat treating</subject><subject>Indentation</subject><subject>Lattice parameters</subject><subject>Lattice strain</subject><subject>Lattices</subject><subject>Mechanical factors</subject><subject>Modulus of elasticity</subject><subject>Plastic deformation</subject><subject>porosity and YBCO</subject><subject>Size effects</subject><subject>vickers hardness</subject><subject>X-ray scattering</subject><subject>Yttrium barium copper oxide</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE1Lw0AQhhdRsFZ_gOAh4Dl1vybJHmusVahUbD0IwrLdnaUpNYmbBPTfm9oexNPMMM87Aw8hl4yOGKPqZjle5CNOuRgJDkIm8ogMGEAWc2Bw3PcUWJxxLk7JWdNsKGUykzAg709o16YsrNlGpnTRog2dbbvQj8-hqjG0BTZR5aNpMPUaS4zmX4XDX_YFXWfR_V_d9TEXvd3m83Ny4s22wYtDHZLX-8kyf4hn8-ljPp7FlivZxshTa1dSCS-AAyjGhOfU-BVnwnoF3tjUZHLlFAXHABPp0sRazFByZa0RQ3K9v1uH6rPDptWbqgtl_1LzVKVcJZmAnmJ7yoaqaQJ6XYfiw4RvzajeSdQ7iXonUR8k9pmrfaZAxD88TRjITPwAuANtbw</recordid><startdate>20230801</startdate><enddate>20230801</enddate><creator>Gaffoor, M. Z.</creator><creator>Jarvis, A.L.L</creator><creator>Swanson, A.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-9965-4746</orcidid><orcidid>https://orcid.org/0000-0002-5125-7530</orcidid><orcidid>https://orcid.org/0000-0002-1558-7508</orcidid></search><sort><creationdate>20230801</creationdate><title>Mechanical and Structural Properties of Graphene Oxide and Reduced Graphene Oxide Doped YBCO</title><author>Gaffoor, M. Z. ; Jarvis, A.L.L ; Swanson, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c294t-e27ccb493f352559113f20afb213cf95fac7a84bd905d15e64d76cce8e429cca3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Crystallites</topic><topic>Deformable models</topic><topic>Diamond pyramid hardness</topic><topic>Doping</topic><topic>Elastic deformation</topic><topic>Fracture toughness</topic><topic>Graphene</topic><topic>graphene oxide</topic><topic>Heat treating</topic><topic>Indentation</topic><topic>Lattice parameters</topic><topic>Lattice strain</topic><topic>Lattices</topic><topic>Mechanical factors</topic><topic>Modulus of elasticity</topic><topic>Plastic deformation</topic><topic>porosity and YBCO</topic><topic>Size effects</topic><topic>vickers hardness</topic><topic>X-ray scattering</topic><topic>Yttrium barium copper oxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gaffoor, M. Z.</creatorcontrib><creatorcontrib>Jarvis, A.L.L</creatorcontrib><creatorcontrib>Swanson, A.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005–Present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on applied superconductivity</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gaffoor, M. Z.</au><au>Jarvis, A.L.L</au><au>Swanson, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Mechanical and Structural Properties of Graphene Oxide and Reduced Graphene Oxide Doped YBCO</atitle><jtitle>IEEE transactions on applied superconductivity</jtitle><stitle>TASC</stitle><date>2023-08-01</date><risdate>2023</risdate><volume>33</volume><issue>5</issue><spage>1</spage><epage>10</epage><pages>1-10</pages><issn>1051-8223</issn><eissn>1558-2515</eissn><coden>ITASE9</coden><abstract>YBCO (Y 1 Ba 2 Cu 3 O 7-δ ) was doped with graphene oxide (GO) and reduced graphene oxide (rGO) in the following percentage weight concentrations: 0.1, 0.5 and 1% wt.. Lattice parameters, crystallite size, orthorhombicity and lattice strain were calculated using XRD analysis. The porosity of samples decreased by a maximum of 29% and 17% for GO and rGO doped samples respectively. Microhardness measurements were conducted using the Vickers hardness method at loads in the range of 0.245 - 2.940 N. These micro hardness measurements were used to calculate the Vickers hardness ( H V ), elastic modulus ( E ), yield strength ( Y ), fracture toughness ( K IC ) and brittleness index ( B ) of the material. H V was greater in GO doped samples than in rGO doped samples. E increased by 63.94% for rGO and 85.52% for GO doped samples. Y increased by 63.80% for rGO and 85.40% for GO doped samples. B decreased by 48.11% for rGO and 43.78% for GO doped samples. There was an increase in K IC for both GO and rGO samples. The indentation size effect (ISE) was observed during micro-hardness measurements. This ISE behaviour was analyzed using Meyers Law, PSR model, elastic/plastic deformation model and Hays Kendall model. The results showed that the Hay Kendall approach best described the ISE behaviour of the samples.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TASC.2023.3253464</doi><tpages>10</tpages><orcidid>https://orcid.org/0000-0002-9965-4746</orcidid><orcidid>https://orcid.org/0000-0002-5125-7530</orcidid><orcidid>https://orcid.org/0000-0002-1558-7508</orcidid></addata></record> |
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subjects | Crystallites Deformable models Diamond pyramid hardness Doping Elastic deformation Fracture toughness Graphene graphene oxide Heat treating Indentation Lattice parameters Lattice strain Lattices Mechanical factors Modulus of elasticity Plastic deformation porosity and YBCO Size effects vickers hardness X-ray scattering Yttrium barium copper oxide |
title | Mechanical and Structural Properties of Graphene Oxide and Reduced Graphene Oxide Doped YBCO |
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