An Analysis of Field-Induced Hot-Electron Emission from Metal-Insulator Microstructures on Broad-Area High-Voltage Electrodes
High-resolution electron energy distribution measurements of individual microscopic sites have been used to develop a detailed theoretical model of the field-induced hot-electron emission mechanism responsible for pre-breakdown currents at vacuum-gap fields of 10-30 MV m-1. The model, which is based...
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| Veröffentlicht in: | Proceedings of the Royal Society of London. Series A, Mathematical and physical sciences Mathematical and physical sciences, 1986-02, Vol.403 (1825), p.285-311 |
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| container_issue | 1825 |
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| container_title | Proceedings of the Royal Society of London. Series A, Mathematical and physical sciences |
| container_volume | 403 |
| creator | Bayliss, K. H. Latham, R. V. |
| description | High-resolution electron energy distribution measurements of individual microscopic sites have been used to develop a detailed theoretical model of the field-induced hot-electron emission mechanism responsible for pre-breakdown currents at vacuum-gap fields of 10-30 MV m-1. The model, which is based on the formation of conducting channels in a metal-insulator-vacuum (m. i. v.) micro-emission régime, has provided experimentally verified quantitative relations for the current-voltage characteristic, spectral shape, and the field-dependence of the spectral full width at half maximum (f. w. h. m.) and shift. |
| doi_str_mv | 10.1098/rspa.1986.0013 |
| format | Article |
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A</addtitle><date>1986-02-08</date><risdate>1986</risdate><volume>403</volume><issue>1825</issue><spage>285</spage><epage>311</epage><pages>285-311</pages><issn>1364-5021</issn><issn>0080-4630</issn><eissn>1471-2946</eissn><eissn>2053-9169</eissn><abstract>High-resolution electron energy distribution measurements of individual microscopic sites have been used to develop a detailed theoretical model of the field-induced hot-electron emission mechanism responsible for pre-breakdown currents at vacuum-gap fields of 10-30 MV m-1. The model, which is based on the formation of conducting channels in a metal-insulator-vacuum (m. i. v.) micro-emission régime, has provided experimentally verified quantitative relations for the current-voltage characteristic, spectral shape, and the field-dependence of the spectral full width at half maximum (f. w. h. m.) and shift.</abstract><cop>London</cop><pub>The Royal Society</pub><doi>10.1098/rspa.1986.0013</doi><tpages>27</tpages></addata></record> |
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| ispartof | Proceedings of the Royal Society of London. Series A, Mathematical and physical sciences, 1986-02, Vol.403 (1825), p.285-311 |
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| language | eng |
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| source | Jstor Complete Legacy; JSTOR Mathematics & Statistics |
| subjects | Cathodes Conduction bands Electric current Electric potential Electrodes Electron emission Electron tunneling Electrons Emission spectra Hot electrons |
| title | An Analysis of Field-Induced Hot-Electron Emission from Metal-Insulator Microstructures on Broad-Area High-Voltage Electrodes |
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