A reverse-bias safe operating area transistor tester / David W. Berning

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Berning, David W
Format: Regierungsdokument
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Berning, David W
description
format Government Document
fullrecord <record><control><sourceid>hathitrust_1HA</sourceid><recordid>TN_cdi_hathitrust_hathifiles_uc1_31210023555608</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>mdp_39015077586306</sourcerecordid><originalsourceid>FETCH-LOGICAL-d1078-f08a576a54ecc8b0e3cb1f891a14049dc1476e4a5c031c8b0975c62c983f080d3</originalsourceid><addsrcrecordid>eNqFkLtOAzEURN2EhwL_4B9Ycr1-lyFAQIpEA6Jc3bXvEkthE9lOvp_l0aeaKc6ZYmbsyjoDILS9YJfKeylke83WS57pRLlQ0ycsvOBAfH-gjDWNnxwzIa8Zx5JK3WdeqVTKfMEf8JQi_7jj95THibxhswF3hW7_c87enx7fVs_N5nX9slpumijAumYAh9oa1IpCcD2QDL0YnBcoFCgfg1DWkEIdQIofwFsdTBu8k5MKUc7Z4m93i3Wbaj6W2v3WIe2odMcgOilaAdBKrbUBd874iodO-ukWsFY7I8HIb19pV2Q</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>government_document</recordtype></control><display><type>government_document</type><title>A reverse-bias safe operating area transistor tester / David W. Berning</title><source>HathiTrust Digital Library Full View Worldwide</source><creator>Berning, David W</creator><creatorcontrib>Berning, David W</creatorcontrib><identifier>OCLC: 4993132</identifier><identifier>LCCN: 78600157</identifier><language>eng</language><publisher>District of Columbia: U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979</publisher><creationdate>1979</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>776,27784</link.rule.ids><linktorsrc>$$Uhttps://hdl.handle.net/2027/uc1.31210023555608$$EView_record_in_HathiTrust$$FView_record_in_$$GHathiTrust$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Berning, David W</creatorcontrib><title>A reverse-bias safe operating area transistor tester / David W. Berning</title><fulltext>true</fulltext><rsrctype>government_document</rsrctype><creationdate>1979</creationdate><recordtype>government_document</recordtype><sourceid>1HA</sourceid><recordid>eNqFkLtOAzEURN2EhwL_4B9Ycr1-lyFAQIpEA6Jc3bXvEkthE9lOvp_l0aeaKc6ZYmbsyjoDILS9YJfKeylke83WS57pRLlQ0ycsvOBAfH-gjDWNnxwzIa8Zx5JK3WdeqVTKfMEf8JQi_7jj95THibxhswF3hW7_c87enx7fVs_N5nX9slpumijAumYAh9oa1IpCcD2QDL0YnBcoFCgfg1DWkEIdQIofwFsdTBu8k5MKUc7Z4m93i3Wbaj6W2v3WIe2odMcgOilaAdBKrbUBd874iodO-ukWsFY7I8HIb19pV2Q</recordid><startdate>1979</startdate><enddate>1979</enddate><creator>Berning, David W</creator><general>U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979</general><scope>1HA</scope></search><sort><creationdate>1979</creationdate><title>A reverse-bias safe operating area transistor tester / David W. Berning</title><author>Berning, David W</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-d1078-f08a576a54ecc8b0e3cb1f891a14049dc1476e4a5c031c8b0975c62c983f080d3</frbrgroupid><rsrctype>government_documents</rsrctype><prefilter>government_documents</prefilter><language>eng</language><creationdate>1979</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Berning, David W</creatorcontrib><collection>HathiTrust Digital Library Full View Worldwide</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Berning, David W</au><format>book</format><genre>document</genre><ristype>GEN</ristype><title>A reverse-bias safe operating area transistor tester / David W. Berning</title><date>1979</date><risdate>1979</risdate><cop>District of Columbia</cop><pub>U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979</pub><oclcid>4993132</oclcid><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier OCLC: 4993132
ispartof
issn
language eng
recordid cdi_hathitrust_hathifiles_uc1_31210023555608
source HathiTrust Digital Library Full View Worldwide
title A reverse-bias safe operating area transistor tester / David W. Berning
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T05%3A37%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-hathitrust_1HA&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=document&rft.au=Berning,%20David%20W&rft.date=1979&rft_id=info:doi/&rft_dat=%3Chathitrust_1HA%3Emdp_39015077586306%3C/hathitrust_1HA%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true