Electron Emission from Hypervelocity C60 Impacts

Secondary ion mass spectrometry (SIMS) performed in the event-by-event bombardment detection mode when coupled to an electron emission microscope allows one to investigate individual nano-objects. Two groups of Au and Al oxide nano-objects were compared with their bulk counterparts based on their se...

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Veröffentlicht in:	Journal of physical chemistry. C 2010-10, Vol.114 (40), p.17191-17196
Hauptverfasser:	Eller, M. J, Verkhoturov, S. V, Della-Negra, S, Schweikert, E. A
Format:	Artikel
Sprache:	eng
Schlagworte:	Nuclear Experiment Physics
Online-Zugang:	Volltext
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